{"id":"https://openalex.org/W2958672639","doi":"https://doi.org/10.1109/access.2019.2928587","title":"A Dynamic Prescriptive Maintenance Model Considering System Aging and Degradation","display_name":"A Dynamic Prescriptive Maintenance Model Considering System Aging and Degradation","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2958672639","doi":"https://doi.org/10.1109/access.2019.2928587","mag":"2958672639"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2928587","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928587","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08762155.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08762155.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100395492","display_name":"Bin Liu","orcid":"https://orcid.org/0000-0002-3946-8124"},"institutions":[{"id":"https://openalex.org/I181647926","display_name":"University of Strathclyde","ror":"https://ror.org/00n3w3b69","country_code":"GB","type":"education","lineage":["https://openalex.org/I181647926"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Bin Liu","raw_affiliation_strings":["University of Strathclyde, Glasgow, Glasgow, GB"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Strathclyde, Glasgow, Glasgow, GB","institution_ids":["https://openalex.org/I181647926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061991728","display_name":"Jing Lin","orcid":"https://orcid.org/0000-0002-7458-6820"},"institutions":[{"id":"https://openalex.org/I190632392","display_name":"Lule\u00e5 University of Technology","ror":"https://ror.org/016st3p78","country_code":"SE","type":"education","lineage":["https://openalex.org/I190632392"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Jing Lin","raw_affiliation_strings":["Lulea Tekniska Universitet, Lulea, SE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lulea Tekniska Universitet, Lulea, SE","institution_ids":["https://openalex.org/I190632392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081928439","display_name":"Liangwei Zhang","orcid":"https://orcid.org/0000-0001-7310-5717"},"institutions":[{"id":"https://openalex.org/I190632392","display_name":"Lule\u00e5 University of Technology","ror":"https://ror.org/016st3p78","country_code":"SE","type":"education","lineage":["https://openalex.org/I190632392"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Liangwei Zhang","raw_affiliation_strings":["Lulea Tekniska Universitet, Lulea, SE"],"raw_orcid":"https://orcid.org/0000-0001-7310-5717","affiliations":[{"raw_affiliation_string":"Lulea Tekniska Universitet, Lulea, SE","institution_ids":["https://openalex.org/I190632392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103229739","display_name":"Uday Kumar","orcid":"https://orcid.org/0000-0003-0778-2060"},"institutions":[{"id":"https://openalex.org/I190632392","display_name":"Lule\u00e5 University of Technology","ror":"https://ror.org/016st3p78","country_code":"SE","type":"education","lineage":["https://openalex.org/I190632392"]}],"countries":["SE"],"is_corresponding":false,"raw_author_name":"Uday Kumar","raw_affiliation_strings":["Lulea Tekniska Universitet, Lulea, SE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lulea Tekniska Universitet, Lulea, SE","institution_ids":["https://openalex.org/I190632392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1585,"currency":"EUR","value_usd":1709},"fwci":4.6905,"has_fulltext":true,"cited_by_count":41,"citation_normalized_percentile":{"value":0.94694264,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"94931","last_page":"94943"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7824908494949341},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.768914520740509},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7289884090423584},{"id":"https://openalex.org/keywords/preventive-maintenance","display_name":"Preventive maintenance","score":0.6700940728187561},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6586759090423584},{"id":"https://openalex.org/keywords/condition-based-maintenance","display_name":"Condition-based maintenance","score":0.6440145969390869},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.5872664451599121},{"id":"https://openalex.org/keywords/optimal-maintenance","display_name":"Optimal maintenance","score":0.5529051423072815},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.524357795715332},{"id":"https://openalex.org/keywords/inspection-time","display_name":"Inspection time","score":0.4342733919620514},{"id":"https://openalex.org/keywords/system-lifecycle","display_name":"System lifecycle","score":0.4192127585411072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22685053944587708}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7824908494949341},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.768914520740509},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7289884090423584},{"id":"https://openalex.org/C24090081","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Preventive maintenance","level":2,"score":0.6700940728187561},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6586759090423584},{"id":"https://openalex.org/C2776907094","wikidata":"https://www.wikidata.org/wiki/Q1043452","display_name":"Condition-based maintenance","level":2,"score":0.6440145969390869},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.5872664451599121},{"id":"https://openalex.org/C2776671899","wikidata":"https://www.wikidata.org/wiki/Q7098945","display_name":"Optimal maintenance","level":2,"score":0.5529051423072815},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.524357795715332},{"id":"https://openalex.org/C2780407802","wikidata":"https://www.wikidata.org/wiki/Q6146499","display_name":"Inspection time","level":2,"score":0.4342733919620514},{"id":"https://openalex.org/C35280785","wikidata":"https://www.wikidata.org/wiki/Q559486","display_name":"System lifecycle","level":4,"score":0.4192127585411072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22685053944587708},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C30452754","wikidata":"https://www.wikidata.org/wiki/Q621590","display_name":"Application lifecycle management","level":3,"score":0.0},{"id":"https://openalex.org/C138496976","wikidata":"https://www.wikidata.org/wiki/Q175002","display_name":"Developmental psychology","level":1,"score":0.0},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2019.2928587","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928587","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08762155.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:strathprints.strath.ac.uk:69726","is_oa":false,"landing_page_url":"https://strathprints.strath.ac.uk/view/author/1214809.html>","pdf_url":null,"source":{"id":"https://openalex.org/S4306402226","display_name":"Strathprints: The University of Strathclyde institutional repository (University of Strathclyde)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I181647926","host_organization_name":"University of Strathclyde","host_organization_lineage":["https://openalex.org/I181647926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"pmh:oai:doaj.org/article:03c868c842d94b0588413ab8cf3607c3","is_oa":true,"landing_page_url":"https://doaj.org/article/03c868c842d94b0588413ab8cf3607c3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 94931-94943 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2928587","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2928587","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08762155.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4352837936","display_name":null,"funder_award_id":"2017KQNCX191","funder_id":"https://openalex.org/F4320326279","funder_display_name":"Department of Education of Guangdong Province"},{"id":"https://openalex.org/G8255577989","display_name":"\u9488\u5bf9\u975e\u7ebf\u6027\u7cfb\u7edf\u7684\u81ea\u9002\u5e94\u6838\u5bbd\u5ea6\u5f02\u5e38\u68c0\u6d4b\u65b9\u6cd5\u7814\u7a76","funder_award_id":"71801045","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8730587831","display_name":null,"funder_award_id":"2017KQNCX191","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326279","display_name":"Department of Education of Guangdong Province","ror":null},{"id":"https://openalex.org/F4320327853","display_name":"Trafikverket","ror":"https://ror.org/000nes056"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2958672639.pdf","grobid_xml":"https://content.openalex.org/works/W2958672639.grobid-xml"},"referenced_works_count":38,"referenced_works":["https://openalex.org/W1932372884","https://openalex.org/W1973870240","https://openalex.org/W1994337132","https://openalex.org/W1997725974","https://openalex.org/W2062562261","https://openalex.org/W2080324467","https://openalex.org/W2088555868","https://openalex.org/W2096657153","https://openalex.org/W2101039147","https://openalex.org/W2107605812","https://openalex.org/W2112935810","https://openalex.org/W2146713412","https://openalex.org/W2146720487","https://openalex.org/W2147664181","https://openalex.org/W2153230137","https://openalex.org/W2321494377","https://openalex.org/W2339515839","https://openalex.org/W2344683769","https://openalex.org/W2516153342","https://openalex.org/W2529869754","https://openalex.org/W2537002023","https://openalex.org/W2549792024","https://openalex.org/W2554556296","https://openalex.org/W2566244742","https://openalex.org/W2606497048","https://openalex.org/W2609929761","https://openalex.org/W2613456440","https://openalex.org/W2752122705","https://openalex.org/W2752760815","https://openalex.org/W2763838080","https://openalex.org/W2765637254","https://openalex.org/W2789374419","https://openalex.org/W2789514784","https://openalex.org/W2791285123","https://openalex.org/W2803164023","https://openalex.org/W2810889034","https://openalex.org/W2883961236","https://openalex.org/W2889062169"],"related_works":["https://openalex.org/W3049049469","https://openalex.org/W2888808644","https://openalex.org/W1987745029","https://openalex.org/W2585580176","https://openalex.org/W2154660294","https://openalex.org/W2165300301","https://openalex.org/W2160198307","https://openalex.org/W3187804119","https://openalex.org/W2889062169","https://openalex.org/W2958672639"],"abstract_inverted_index":{"This":[0],"paper":[1],"develops":[2],"a":[3,8,101,111,149,153,166],"dynamic":[4],"maintenance":[5,91,116,120,173,199],"strategy":[6,121],"for":[7,113],"system":[9,23,75,98,107,183],"subject":[10],"to":[11,58],"aging":[12,21,181],"and":[13,20,180,185,201],"degradation.":[14],"The":[15,104,118,157,172],"influence":[16,89,177],"of":[17,65,90,106,132,141,159,169,178],"degradation":[18,36,84,143,179],"level":[19,37],"on":[22,33,78,97,182],"failure":[24,184],"rate":[25,129],"is":[26,44,122,163,193],"modeled":[27],"in":[28,61,69,130,206],"an":[29,59],"additive":[30],"way.":[31],"Based":[32],"the":[34,39,48,62,66,74,79,83,87,115,126,133,139,142,160,176,188,207],"observed":[35],"at":[38],"inspection,":[40,138],"repair":[41,54,72,134],"or":[42],"replacement":[43],"carried":[45],"out":[46],"upon":[47],"system.":[49,67],"Previous":[50],"researches":[51],"assume":[52],"that":[53],"will":[55],"always":[56],"lead":[57],"improvement":[60],"health":[63],"condition":[64],"However,":[68],"our":[70],"study,":[71],"reduces":[73],"age":[76],"but":[77],"other":[80],"hand,":[81],"increases":[82],"level.":[85],"Considering":[86],"two-fold":[88],"actions,":[92],"we":[93],"perform":[94],"reliability":[95,99,108],"analysis":[96],"as":[100,110],"first":[102],"step.":[103],"evolution":[105],"serves":[109],"foundation":[112],"establishing":[114],"model.":[117],"optimal":[119,189],"achieved":[123],"by":[124],"minimizing":[125],"long-run":[127],"cost":[128],"terms":[131],"cycle.":[135],"At":[136],"each":[137],"parameters":[140],"processes":[144],"are":[145],"updated":[146],"with":[147],"maximum":[148],"posteriori":[150],"estimation":[151],"when":[152],"new":[154],"observation":[155],"arrives.":[156],"effectiveness":[158],"proposed":[161],"model":[162,174],"illustrated":[164],"through":[165],"case":[167],"study":[168],"locomotive":[170],"wheel-sets.":[171],"considers":[175],"dynamically":[186],"determines":[187],"inspection":[190],"time,":[191],"which":[192],"more":[194],"flexible":[195],"than":[196],"traditional":[197],"stationary":[198],"strategies":[200],"can":[202],"provide":[203],"better":[204],"performance":[205],"field.":[208]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":8},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":7},{"year":2019,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}