{"id":"https://openalex.org/W2959274183","doi":"https://doi.org/10.1109/access.2019.2927162","title":"A Neural Network Model for Material Degradation Detection and Diagnosis Using Microscopic Images","display_name":"A Neural Network Model for Material Degradation Detection and Diagnosis Using Microscopic Images","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2959274183","doi":"https://doi.org/10.1109/access.2019.2927162","mag":"2959274183"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2927162","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927162","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08758810.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08758810.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027289427","display_name":"Woosung Choi","orcid":"https://orcid.org/0000-0002-7001-3099"},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woosung Choi","raw_affiliation_strings":["Power Generation Laboratory, KEPCO Research Institute, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Power Generation Laboratory, KEPCO Research Institute, Daejeon, South Korea","institution_ids":["https://openalex.org/I198972184"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024043619","display_name":"Hyunsuk Huh","orcid":"https://orcid.org/0000-0002-8487-5095"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunsuk Huh","raw_affiliation_strings":["Department of Mechanical Engineering, POSTECH, Pohang, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014306565","display_name":"Bayu Adhi Tama","orcid":"https://orcid.org/0000-0002-1821-6438"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bayu Adhi Tama","raw_affiliation_strings":["Department of Mechanical Engineering, POSTECH, Pohang, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1821-6438","affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, POSTECH, Pohang, South Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039827047","display_name":"Gyusang Park","orcid":null},"institutions":[{"id":"https://openalex.org/I198972184","display_name":"Korea Electric Power Corporation (South Korea)","ror":"https://ror.org/04fperw70","country_code":"KR","type":"company","lineage":["https://openalex.org/I198972184"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Gyusang Park","raw_affiliation_strings":["Power Generation Laboratory, KEPCO Research Institute, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Power Generation Laboratory, KEPCO Research Institute, Daejeon, South Korea","institution_ids":["https://openalex.org/I198972184"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100626897","display_name":"Seung\u2010Chul Lee","orcid":"https://orcid.org/0000-0002-1034-1410"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungchul Lee","raw_affiliation_strings":["Institute for Convergence Research and Education in Advanced Technology, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Convergence Research and Education in Advanced Technology, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.0943,"has_fulltext":true,"cited_by_count":16,"citation_normalized_percentile":{"value":0.92546181,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"92151","last_page":"92160"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8229123950004578},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7499948740005493},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7130534052848816},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.6047955751419067},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5916792154312134},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.540168046951294},{"id":"https://openalex.org/keywords/contextual-image-classification","display_name":"Contextual image classification","score":0.5358456373214722},{"id":"https://openalex.org/keywords/histogram-equalization","display_name":"Histogram equalization","score":0.4651177227497101},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.46396055817604065},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.41907042264938354},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.41258955001831055},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.39518797397613525},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.3884347379207611},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3728597164154053}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8229123950004578},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7499948740005493},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7130534052848816},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.6047955751419067},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5916792154312134},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.540168046951294},{"id":"https://openalex.org/C75294576","wikidata":"https://www.wikidata.org/wiki/Q5165192","display_name":"Contextual image classification","level":3,"score":0.5358456373214722},{"id":"https://openalex.org/C136943445","wikidata":"https://www.wikidata.org/wiki/Q1970240","display_name":"Histogram equalization","level":4,"score":0.4651177227497101},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.46396055817604065},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.41907042264938354},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.41258955001831055},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.39518797397613525},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.3884347379207611},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3728597164154053},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2927162","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927162","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08758810.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:40aa8f961a7a47508e84a722d1f38279","is_oa":true,"landing_page_url":"https://doaj.org/article/40aa8f961a7a47508e84a722d1f38279","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 92151-92160 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2927162","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927162","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08758810.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4956916549","display_name":null,"funder_award_id":"N0008691","funder_id":"https://openalex.org/F4320322064","funder_display_name":"Korea Institute for Advancement of Technology"},{"id":"https://openalex.org/G5989379264","display_name":null,"funder_award_id":"10080729","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G6154117638","display_name":null,"funder_award_id":"N0008691","funder_id":"https://openalex.org/F4320321681","funder_display_name":"Ministry of Trade, Industry and Energy"},{"id":"https://openalex.org/G7149071311","display_name":null,"funder_award_id":"R17GA08","funder_id":"https://openalex.org/F4320326258","funder_display_name":"Korea Electric Power Corporation"}],"funders":[{"id":"https://openalex.org/F4320321681","display_name":"Ministry of Trade, Industry and Energy","ror":"https://ror.org/008nkqk13"},{"id":"https://openalex.org/F4320322064","display_name":"Korea Institute for Advancement of Technology","ror":"https://ror.org/015w1qa96"},{"id":"https://openalex.org/F4320326258","display_name":"Korea Electric Power Corporation","ror":"https://ror.org/04fperw70"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2959274183.pdf","grobid_xml":"https://content.openalex.org/works/W2959274183.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W77068327","https://openalex.org/W77487635","https://openalex.org/W282317399","https://openalex.org/W621359261","https://openalex.org/W1752712236","https://openalex.org/W1972274821","https://openalex.org/W2001412060","https://openalex.org/W2020450032","https://openalex.org/W2024566842","https://openalex.org/W2029858800","https://openalex.org/W2032614950","https://openalex.org/W2066166382","https://openalex.org/W2118585731","https://openalex.org/W2126584714","https://openalex.org/W2153635508","https://openalex.org/W2219903032","https://openalex.org/W2254884657","https://openalex.org/W2274246713","https://openalex.org/W2317595875","https://openalex.org/W2404692435","https://openalex.org/W2418691539","https://openalex.org/W2461729787","https://openalex.org/W2548197316","https://openalex.org/W2556345765","https://openalex.org/W2595657631","https://openalex.org/W2608571722","https://openalex.org/W2620166702","https://openalex.org/W2730943916","https://openalex.org/W2775795276","https://openalex.org/W2782812883","https://openalex.org/W2788276261","https://openalex.org/W2791694051","https://openalex.org/W2809598685","https://openalex.org/W2900741650","https://openalex.org/W2919115771","https://openalex.org/W4206519171","https://openalex.org/W4234247659","https://openalex.org/W4252278784","https://openalex.org/W6677656871","https://openalex.org/W6747218270"],"related_works":["https://openalex.org/W2057981026","https://openalex.org/W2256021896","https://openalex.org/W2181573213","https://openalex.org/W2398368608","https://openalex.org/W1990492110","https://openalex.org/W1583737874","https://openalex.org/W2122866860","https://openalex.org/W2024449420","https://openalex.org/W2903465195","https://openalex.org/W2380937280"],"abstract_inverted_index":{"Detection":[0],"and":[1,10,26,30,124,133],"diagnosis":[2],"of":[3,7,41,93,119],"material":[4,42,149],"degradation":[5,75,150],"are":[6],"a":[8,19,37,46,71,83,108,120,138,143],"complex":[9],"challenging":[11],"task":[12],"since":[13],"it":[14,22],"is":[15,67,80,101,131,153],"presently":[16],"hand-operated":[17],"by":[18,44],"human.":[20],"Therefore,":[21],"leads":[23],"to":[24,69,103],"misinterpretation":[25],"avoids":[27],"correct":[28],"classification":[29,99],"diagnosis.":[31],"In":[32],"this":[33],"paper,":[34],"we":[35],"develop":[36],"computer-assisted":[38],"detection":[39],"method":[40],"failure":[43],"utilizing":[45],"deep":[47,51,121],"learning":[48,111],"approach.":[49],"A":[50],"convolutional":[52],"neural":[53,145],"network":[54,146],"(CNN)":[55],"model,":[56],"combined":[57],"with":[58,97,107,123],"an":[59,126],"image":[60,76,128],"processing":[61,129],"technique,":[62],"e.g.,":[63,113],"adaptive":[64],"histogram":[65],"equalization,":[66],"trained":[68],"classify":[70],"real-world":[72],"turbine":[73],"tube":[74],"data":[77],"set,":[78],"which":[79,152],"retrieved":[81],"from":[82],"power":[84],"generation":[85],"company.":[86],"The":[87],"experimental":[88],"result":[89],"demonstrates":[90],"the":[91,94,157],"effectiveness":[92],"proposed":[95],"approach":[96],"predictive":[98],"accuracy":[100],"up":[102],"99.99%":[104],"in":[105,141,156],"comparison":[106],"shallow":[109],"machine":[110],"algorithm,":[112],"linear":[114],"SVM.":[115],"Furthermore,":[116],"performance":[117],"evaluation":[118],"CNN":[122],"without":[125],"above-mentioned":[127],"technique":[130],"exhibited":[132],"benchmarked.":[134],"We":[135],"successfully":[136],"demonstrate":[137],"novel":[139],"application":[140],"constructing":[142],"deep-structure":[144],"model":[147],"for":[148],"diagnosis,":[151],"not":[154],"available":[155],"current":[158],"literature.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}