{"id":"https://openalex.org/W2954880755","doi":"https://doi.org/10.1109/access.2019.2927125","title":"A New Theory for Locating Line Fault in Power System: Simulation Part","display_name":"A New Theory for Locating Line Fault in Power System: Simulation Part","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2954880755","doi":"https://doi.org/10.1109/access.2019.2927125","mag":"2954880755"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2927125","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927125","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08756009.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08756009.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091029464","display_name":"Xipeng Zhang","orcid":"https://orcid.org/0000-0002-0193-3270"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xipeng Zhang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-0193-3270","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070462150","display_name":"Nengling Tai","orcid":"https://orcid.org/0000-0003-3119-0137"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nengling Tai","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070353132","display_name":"Pan Wu","orcid":"https://orcid.org/0000-0001-5779-4751"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pan Wu","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5779-4751","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102295991","display_name":"Chunju Fan","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunju Fan","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058855232","display_name":"Xiaodong Zheng","orcid":"https://orcid.org/0000-0001-8387-6064"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Zheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100608423","display_name":"Wentao Huang","orcid":"https://orcid.org/0000-0002-6668-1019"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wentao Huang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5091029464"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3373,"has_fulltext":true,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58083706,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"7","issue":null,"first_page":"93858","last_page":"93870"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.795097291469574},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.6026362776756287},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.5885831713676453},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.5307873487472534},{"id":"https://openalex.org/keywords/transmission-line","display_name":"Transmission line","score":0.5236068367958069},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.5071051120758057},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.47973695397377014},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4666590392589569},{"id":"https://openalex.org/keywords/electric-power-transmission","display_name":"Electric power transmission","score":0.4578401744365692},{"id":"https://openalex.org/keywords/lossless-compression","display_name":"Lossless compression","score":0.41684186458587646},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40621840953826904},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2713966965675354},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23643618822097778},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21019375324249268},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.20836684107780457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18597722053527832},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.16360563039779663},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.14500927925109863},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1410822868347168},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08513292670249939}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.795097291469574},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.6026362776756287},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.5885831713676453},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.5307873487472534},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.5236068367958069},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.5071051120758057},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.47973695397377014},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4666590392589569},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.4578401744365692},{"id":"https://openalex.org/C81081738","wikidata":"https://www.wikidata.org/wiki/Q55542","display_name":"Lossless compression","level":3,"score":0.41684186458587646},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40621840953826904},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2713966965675354},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23643618822097778},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21019375324249268},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.20836684107780457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18597722053527832},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.16360563039779663},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.14500927925109863},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1410822868347168},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08513292670249939},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2927125","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927125","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08756009.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:acc64a7dbf1b49e1a8b62eef5a9d42ac","is_oa":true,"landing_page_url":"https://doaj.org/article/acc64a7dbf1b49e1a8b62eef5a9d42ac","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 93858-93870 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2927125","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2927125","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08756009.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5021742866","display_name":null,"funder_award_id":"18QA1402100","funder_id":"https://openalex.org/F4320327803","funder_display_name":"Shanghai Rising-Star Program"},{"id":"https://openalex.org/G7907889888","display_name":null,"funder_award_id":"2016YFB0900601","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G8373984233","display_name":null,"funder_award_id":"51877135","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322999","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04"},{"id":"https://openalex.org/F4320327803","display_name":"Shanghai Rising-Star Program","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2954880755.pdf","grobid_xml":"https://content.openalex.org/works/W2954880755.grobid-xml"},"referenced_works_count":9,"referenced_works":["https://openalex.org/W1965289014","https://openalex.org/W2001684632","https://openalex.org/W2092315808","https://openalex.org/W2098027777","https://openalex.org/W2156859338","https://openalex.org/W2528841625","https://openalex.org/W2563915039","https://openalex.org/W2595916700","https://openalex.org/W2791446099"],"related_works":["https://openalex.org/W2003499589","https://openalex.org/W3115307632","https://openalex.org/W4255886484","https://openalex.org/W787855002","https://openalex.org/W2949628984","https://openalex.org/W2055147355","https://openalex.org/W2096055231","https://openalex.org/W2363871675","https://openalex.org/W2543668496","https://openalex.org/W2160467627"],"abstract_inverted_index":{"Three":[0],"time-reversal-based":[1],"fault":[2,46,50,67,87,91,108,119,123,130,141,153],"location":[3,57,98,131,142],"methods":[4],"are":[5,175],"derived":[6],"from":[7,134],"the":[8,31,36,41,45,59,65,73,77,82,86,100,106,115,129,135,139,147,178],"theoretical":[9],"part":[10],"of":[11,44,48,85,89,118,121,185],"this":[12],"paper,":[13],"which":[14],"is":[15,62,64,103,105,132,144,160],"named":[16],"currents-in-time-domain":[17],"method,":[18,20,23],"forward-currents-in-frequency-domain":[19],"and":[21,128,172],"forward-currents-in-frequency-domain-with-compensation":[22],"respectively.":[24],"The":[25,56,69,97,110,167],"first":[26,113],"proposed":[27],"method":[28,71,112],"utilizes":[29],"only":[30],"decomposed":[32],"transient":[33],"currents":[34,47,88,120],"in":[35,51,76,92,124],"time":[37],"domain":[38,79],"to":[39,80],"calculate":[40,81],"RMS":[42,83,116],"values":[43,84,117],"assumed":[49,90,122,152],"a":[52,93,182],"lossless":[53,125],"mirror":[54,95,126],"line.":[55,96],"where":[58,99],"peak":[60,136],"value":[61,102],"located":[63,104],"calculated":[66,107],"location.":[68,109,154],"second":[70],"uses":[72],"forward":[74],"current":[75],"frequency":[78],"loss":[94],"minimum":[101],"third":[111],"calculates":[114],"line,":[127],"selected":[133],"value.":[137],"Then":[138],"final":[140],"result":[143],"compensated":[145],"by":[146],"pre-calculated":[148],"error":[149],"for":[150,162,181],"each":[151],"A":[155],"two-terminal":[156],"AC":[157],"transmission":[158],"system":[159,180],"established":[161],"testing":[163],"these":[164],"three":[165],"methods.":[166],"frequency-dependent":[168],"lines":[169,174],"including":[170],"homogeneous":[171],"inhomogeneous":[173],"taken":[176],"into":[177],"simulated":[179],"large":[183],"number":[184],"tests.":[186]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}