{"id":"https://openalex.org/W2952218682","doi":"https://doi.org/10.1109/access.2019.2923417","title":"Data Segmentation and Augmentation Methods Based on Raw Data Using Deep Neural Networks Approach for Rotating Machinery Fault Diagnosis","display_name":"Data Segmentation and Augmentation Methods Based on Raw Data Using Deep Neural Networks Approach for Rotating Machinery Fault Diagnosis","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2952218682","doi":"https://doi.org/10.1109/access.2019.2923417","mag":"2952218682"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2923417","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923417","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737894.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737894.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024385262","display_name":"Zong Meng","orcid":"https://orcid.org/0000-0002-8480-3235"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zong Meng","raw_affiliation_strings":["Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062273002","display_name":"Xiaolin Guo","orcid":"https://orcid.org/0000-0002-5352-4655"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaolin Guo","raw_affiliation_strings":["Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012601790","display_name":"Zuozhou Pan","orcid":"https://orcid.org/0000-0001-8178-9784"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zuozhou Pan","raw_affiliation_strings":["Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054878926","display_name":"Dengyun Sun","orcid":"https://orcid.org/0000-0003-1438-8184"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dengyun Sun","raw_affiliation_strings":["Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100319110","display_name":"Shuang Liu","orcid":"https://orcid.org/0000-0002-9027-0690"},"institutions":[{"id":"https://openalex.org/I39333907","display_name":"Yanshan University","ror":"https://ror.org/02txfnf15","country_code":"CN","type":"education","lineage":["https://openalex.org/I39333907"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuang Liu","raw_affiliation_strings":["Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Measurement Technology and Instrumentation of Hebei Province, Yanshan University, Qinhuangdao, China","institution_ids":["https://openalex.org/I39333907"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5024385262"],"corresponding_institution_ids":["https://openalex.org/I39333907"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":5.8962,"has_fulltext":true,"cited_by_count":61,"citation_normalized_percentile":{"value":0.96708655,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"7","issue":null,"first_page":"79510","last_page":"79522"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9836999773979187,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7696740627288818},{"id":"https://openalex.org/keywords/raw-data","display_name":"Raw data","score":0.6454911828041077},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6232060194015503},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6229947805404663},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5862910747528076},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5858867168426514},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5504770874977112},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5480029582977295},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5363738536834717},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4218313694000244},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.37945204973220825},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.34714969992637634}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7696740627288818},{"id":"https://openalex.org/C132964779","wikidata":"https://www.wikidata.org/wiki/Q2110223","display_name":"Raw data","level":2,"score":0.6454911828041077},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6232060194015503},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6229947805404663},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5862910747528076},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5858867168426514},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5504770874977112},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5480029582977295},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5363738536834717},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4218313694000244},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.37945204973220825},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.34714969992637634},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2923417","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923417","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737894.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:6701dd9d7289409093562dc6581c2b3b","is_oa":true,"landing_page_url":"https://doaj.org/article/6701dd9d7289409093562dc6581c2b3b","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 79510-79522 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2923417","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2923417","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08737894.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/1","score":0.5199999809265137,"display_name":"No poverty"}],"awards":[{"id":"https://openalex.org/G1023919524","display_name":null,"funder_award_id":", Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1976863879","display_name":null,"funder_award_id":"2019203448","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G278995687","display_name":null,"funder_award_id":"61873227","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2889588469","display_name":null,"funder_award_id":"2019203","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G37568934","display_name":null,"funder_award_id":"Grant","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G378116424","display_name":null,"funder_award_id":"51575472","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4133174517","display_name":null,"funder_award_id":"201920","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4765083334","display_name":null,"funder_award_id":"618732","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6800415243","display_name":null,"funder_award_id":"61873226","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7919880799","display_name":null,"funder_award_id":"20192034","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322163","display_name":"Natural Science Foundation of Hebei Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2952218682.pdf","grobid_xml":"https://content.openalex.org/works/W2952218682.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W1199827394","https://openalex.org/W1696068948","https://openalex.org/W1965555277","https://openalex.org/W1984541135","https://openalex.org/W2051812123","https://openalex.org/W2071124013","https://openalex.org/W2073318058","https://openalex.org/W2076063813","https://openalex.org/W2100495367","https://openalex.org/W2138857742","https://openalex.org/W2145889472","https://openalex.org/W2154642048","https://openalex.org/W2158698691","https://openalex.org/W2160815625","https://openalex.org/W2187089797","https://openalex.org/W2219903032","https://openalex.org/W2274246713","https://openalex.org/W2301005476","https://openalex.org/W2317595875","https://openalex.org/W2522921622","https://openalex.org/W2548257861","https://openalex.org/W2605793178","https://openalex.org/W2609688418","https://openalex.org/W2738563279","https://openalex.org/W2744790985","https://openalex.org/W2758113345","https://openalex.org/W2763583057","https://openalex.org/W2768148617","https://openalex.org/W2810292802","https://openalex.org/W2886755908","https://openalex.org/W2893747136","https://openalex.org/W2898531359","https://openalex.org/W2906256948","https://openalex.org/W2911827809","https://openalex.org/W2917329841","https://openalex.org/W2919115771","https://openalex.org/W2931331224","https://openalex.org/W6680300913","https://openalex.org/W6756063995"],"related_works":["https://openalex.org/W4375867731","https://openalex.org/W2611989081","https://openalex.org/W4230611425","https://openalex.org/W2731899572","https://openalex.org/W4294635752","https://openalex.org/W4304166257","https://openalex.org/W3012838233","https://openalex.org/W4252510819","https://openalex.org/W4383066092","https://openalex.org/W4385544042"],"abstract_inverted_index":{"Intelligent":[0],"fault":[1,9,16,244],"diagnosis":[2],"has":[3],"been":[4],"widely":[5],"used":[6,209],"for":[7,167,227],"mechanical":[8],"diagnosis.":[10,245],"Most":[11],"intelligent":[12],"diagnostic":[13],"methods":[14,223],"extract":[15,85],"features":[17,63,86,196],"from":[18,27,52,64,87,159],"the":[19,76,90,99,119,131,138,144,156,174,180,183,190,212,215,222,234,238],"frequency":[20,77],"domain":[21,66,78],"or":[22],"other":[23,36,198],"domains,":[24],"instead":[25],"of":[26,43,92,176,182,214,240],"raw":[28,33,53,69,160,168],"data.":[29,55],"Given":[30],"that":[31,98,221],"converting":[32],"data":[34,71,79,164],"to":[35,75,84,123,153,192,210],"domains":[37],"will":[38],"cause":[39],"a":[40,149,163],"partial":[41],"loss":[42],"information,":[44],"this":[45,141],"study":[46,142],"is":[47,95,134],"based":[48],"on":[49],"feature":[50,157,228],"extraction":[51,158],"vibration":[54,70,169],"However,":[56],"there":[57],"are":[58,208],"some":[59],"difficulties":[60],"in":[61,118,189,237],"extracting":[62],"time":[65],"data:":[67],"1)":[68,148],"lacks":[72],"regularity":[73],"compared":[74,232],"signal,":[80],"making":[81,107],"it":[82],"difficult":[83],"it;":[88],"2)":[89,162],"number":[91,175],"labeled":[93],"samples":[94],"so":[96],"small":[97],"deep":[100],"neural":[101,120],"networks":[102,121,191],"can":[103,172],"easily":[104],"be":[105,124],"over-fitted,":[106],"their":[108],"generalization":[109],"ability":[110],"excessively":[111],"poor;":[112],"and":[113,130,178,205,230],"3)":[114,179],"too":[115],"many":[116],"parameters":[117,199],"need":[122],"adjusted,":[125],"such":[126,200],"as":[127,201],"learning":[128,202,229],"rate,":[129],"convergence":[132],"speed":[133],"slow.":[135],"To":[136],"overcome":[137],"aforementioned":[139],"difficulties,":[140],"proposes":[143],"following":[145],"three":[146],"methods:":[147],"sample":[150,195],"segmentation":[151],"method":[152,166],"effectively":[154],"improve":[155],"data;":[161],"augmentation":[165],"data,":[170],"which":[171],"increase":[173],"samples;":[177],"use":[181],"scaled":[184],"conjugate":[185],"gradient":[186],"(SCG)":[187],"algorithm":[188],"quickly":[193],"learn":[194],"without":[197],"rate.":[203],"Bearing":[204],"rotor":[206],"datasets":[207],"validate":[211],"performance":[213,226],"proposed":[216],"methods.":[217],"The":[218],"results":[219],"indicate":[220],"obtain":[224],"superior":[225],"classification":[231],"with":[233],"existing":[235],"ones":[236],"field":[239],"induction":[241],"rotating":[242],"machinery":[243]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":17},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":14},{"year":2019,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}