{"id":"https://openalex.org/W2947133609","doi":"https://doi.org/10.1109/access.2019.2920297","title":"Validation of Data-Driven Labeling Approaches Using a Novel Deep Network Structure for Remaining Useful Life Predictions","display_name":"Validation of Data-Driven Labeling Approaches Using a Novel Deep Network Structure for Remaining Useful Life Predictions","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2947133609","doi":"https://doi.org/10.1109/access.2019.2920297","mag":"2947133609"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2920297","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2920297","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08727535.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08727535.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064796707","display_name":"Andr\u00e9 Listou Ellefsen","orcid":"https://orcid.org/0000-0002-1702-7045"},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Andre Listou Ellefsen","raw_affiliation_strings":["Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway"],"raw_orcid":"https://orcid.org/0000-0002-1702-7045","affiliations":[{"raw_affiliation_string":"Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway","institution_ids":["https://openalex.org/I204778367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052575123","display_name":"Sergey Ushakov","orcid":"https://orcid.org/0000-0003-4760-2810"},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Sergey Ushakov","raw_affiliation_strings":["Department of Marine Technology, Norwegian University of Science and Technology, Trondheim, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Marine Technology, Norwegian University of Science and Technology, Trondheim, Norway","institution_ids":["https://openalex.org/I204778367"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040938785","display_name":"Vilmar \u00c6s\u00f8y","orcid":null},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Vilmar Aesoy","raw_affiliation_strings":["Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway","institution_ids":["https://openalex.org/I204778367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5042518197","display_name":"Houxiang Zhang","orcid":"https://orcid.org/0000-0003-0122-0964"},"institutions":[{"id":"https://openalex.org/I204778367","display_name":"Norwegian University of Science and Technology","ror":"https://ror.org/05xg72x27","country_code":"NO","type":"education","lineage":["https://openalex.org/I204778367"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Houxiang Zhang","raw_affiliation_strings":["Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mechatronics Laboratory, Norwegian University of Science and Technology \u00c5lesund, \u00c5lesund, Norway","institution_ids":["https://openalex.org/I204778367"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204778367"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.6065,"has_fulltext":true,"cited_by_count":40,"citation_normalized_percentile":{"value":0.92446573,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"71563","last_page":"71575"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prognostics","display_name":"Prognostics","score":0.945848286151886},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7016955018043518},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5699812173843384},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4879557490348816},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4490360915660858},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4356829822063446},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3370901644229889}],"concepts":[{"id":"https://openalex.org/C129364497","wikidata":"https://www.wikidata.org/wiki/Q3042561","display_name":"Prognostics","level":2,"score":0.945848286151886},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7016955018043518},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5699812173843384},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4879557490348816},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4490360915660858},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4356829822063446},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3370901644229889},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2019.2920297","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2920297","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08727535.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:4c792c2eb1464de19d559e268fd8390e","is_oa":true,"landing_page_url":"https://doaj.org/article/4c792c2eb1464de19d559e268fd8390e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 71563-71575 (2019)","raw_type":"article"},{"id":"pmh:oai:ntnuopen.ntnu.no:11250/2600971","is_oa":true,"landing_page_url":"http://hdl.handle.net/11250/2600971","pdf_url":null,"source":{"id":"https://openalex.org/S4306401716","display_name":"Duo Research Archive (University of Oslo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184942183","host_organization_name":"University of Oslo","host_organization_lineage":["https://openalex.org/I184942183"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"71563-71575","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2920297","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2920297","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08727535.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Responsible consumption and production","score":0.5,"id":"https://metadata.un.org/sdg/12"}],"awards":[{"id":"https://openalex.org/G781954640","display_name":null,"funder_award_id":"280703","funder_id":"https://openalex.org/F4320323299","funder_display_name":"Norges Forskningsr\u00e5d"}],"funders":[{"id":"https://openalex.org/F4320311040","display_name":"Norges Teknisk-Naturvitenskapelige Universitet","ror":"https://ror.org/05xg72x27"},{"id":"https://openalex.org/F4320323299","display_name":"Norges Forskningsr\u00e5d","ror":"https://ror.org/00epmv149"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2947133609.pdf","grobid_xml":"https://content.openalex.org/works/W2947133609.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W1533861849","https://openalex.org/W1689711448","https://openalex.org/W1972411326","https://openalex.org/W2064675550","https://openalex.org/W2077831477","https://openalex.org/W2079735306","https://openalex.org/W2095705004","https://openalex.org/W2100649405","https://openalex.org/W2110787940","https://openalex.org/W2116261113","https://openalex.org/W2120841219","https://openalex.org/W2136922672","https://openalex.org/W2145287260","https://openalex.org/W2149956719","https://openalex.org/W2156387975","https://openalex.org/W2163605009","https://openalex.org/W2471161958","https://openalex.org/W2513477101","https://openalex.org/W2744067593","https://openalex.org/W2751810081","https://openalex.org/W2772084711","https://openalex.org/W2902700103","https://openalex.org/W2914189599","https://openalex.org/W2919115771","https://openalex.org/W2943251694","https://openalex.org/W4255949318","https://openalex.org/W4294339608","https://openalex.org/W4300986092","https://openalex.org/W4302296459","https://openalex.org/W6631190155","https://openalex.org/W6631943919","https://openalex.org/W6637151318","https://openalex.org/W6674330103","https://openalex.org/W6682889407","https://openalex.org/W6684191040","https://openalex.org/W6725733176","https://openalex.org/W6743620953","https://openalex.org/W6766395000"],"related_works":["https://openalex.org/W2310476526","https://openalex.org/W3213192587","https://openalex.org/W2144291498","https://openalex.org/W2535730979","https://openalex.org/W2030958945","https://openalex.org/W2370073012","https://openalex.org/W4386567722","https://openalex.org/W2168646784","https://openalex.org/W2466930957","https://openalex.org/W3182014137"],"abstract_inverted_index":{"Today,":[0],"most":[1,227,237],"research":[2],"studies":[3],"that":[4,90,207],"aim":[5],"to":[6,28,50,122,143,182,196],"predict":[7,183],"the":[8,30,58,81,92,158,175,184,187,208,216,222,226,236,241],"remaining":[9],"useful":[10],"life":[11],"(RUL)":[12],"of":[13,202],"industrial":[14],"components":[15],"based":[16,134],"on":[17,135,174,211],"deep":[18,167],"learning":[19],"techniques":[20],"are":[21,132,141],"using":[22],"piecewise":[23],"linear":[24],"(PwL)":[25],"run-to-failure":[26,152,178,213],"targets":[27,153,179,214],"model":[29,37,51,95],"degradation":[31,36,94],"process.":[32],"However,":[33],"this":[34,136],"PwL":[35,93,212],"assumes":[38],"a":[39,70,190,198],"constant":[40],"initial":[41,129,218],"RUL":[42,67,111,130,219,229],"value":[43],"in":[44,157,180,240],"which":[45],"only":[46],"time":[47],"is":[48,120,170,194],"needed":[49],"normal":[52],"operating":[53],"conditions.":[54],"Thus,":[55],"it":[56],"ignores":[57],"entire":[59],"diagnostics":[60,75,125],"aspect.":[61],"To":[62],"provide":[63,80,123],"high":[64],"and":[65,83,148,160,172,224],"reliable":[66,228],"prediction":[68,230],"accuracy,":[69],"prognostics":[71],"algorithm":[72,119,192],"must":[73],"incorporate":[74],"information.":[76,126,137],"This":[77,232],"paper":[78],"will":[79],"Prognostics":[82],"Health":[84],"Management":[85],"Community":[86],"an":[87,114],"empirical":[88],"study":[89],"validates":[91],"against":[96],"other,":[97],"more":[98],"recent":[99],"data-driven":[100,107],"labeling":[101,108],"approaches.":[102],"We":[103],"compare":[104],"three":[105,176],"different":[106,177],"approaches":[109],"for":[110,154],"predictions.":[112],"First,":[113],"unsupervised":[115],"reconstruction-based":[116],"fault":[117],"detection":[118],"used":[121,142,195],"valuable":[124],"Then,":[127],"optimized":[128,217],"values":[131,140,220],"calculated":[133],"Finally,":[138],"these":[139],"construct":[144],"PwL,":[145],"descriptive":[146],"statistics,":[147],"anomaly":[149],"score":[150],"function":[151],"subset":[155],"FD001":[156],"popular":[159],"publicly":[161],"available":[162],"C-MAPSS":[163],"data":[164],"set.":[165],"A":[166],"network":[168,209,233],"structure":[169],"proposed":[171],"trained":[173,210],"order":[181],"RUL.":[185],"During":[186],"training":[188],"process,":[189],"genetic":[191],"approach":[193],"tune":[197],"selected":[199],"search":[200],"space":[201],"hyper-parameters.":[203],"The":[204],"results":[205,239],"suggest":[206],"with":[215],"performs":[221],"best":[223],"provides":[225],"accuracy.":[231],"also":[234],"outperforms":[235],"robust":[238],"literature.":[242]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":7},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}