{"id":"https://openalex.org/W2947645305","doi":"https://doi.org/10.1109/access.2019.2919384","title":"Fast S-Parameter TAN Model of n-Port Lumped Structures","display_name":"Fast S-Parameter TAN Model of n-Port Lumped Structures","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2947645305","doi":"https://doi.org/10.1109/access.2019.2919384","mag":"2947645305"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2919384","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2919384","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08723344.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08723344.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082037033","display_name":"Christel Cholachue","orcid":"https://orcid.org/0000-0002-2307-1333"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"C. Cholachue","raw_affiliation_strings":["Normandy University UNIROUEN, ESIGELEC, IRSEEM EA 4353, Saint-\u00c9tienne-du-Rouvray, France"],"raw_orcid":"https://orcid.org/0000-0002-2307-1333","affiliations":[{"raw_affiliation_string":"Normandy University UNIROUEN, ESIGELEC, IRSEEM EA 4353, Saint-\u00c9tienne-du-Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064057065","display_name":"Blaise Ravelo","orcid":"https://orcid.org/0000-0001-7334-5016"},"institutions":[{"id":"https://openalex.org/I2802505300","display_name":"\u00c9cole Sup\u00e9rieure d'Ing\u00e9nieurs en G\u00e9nie \u00c9lectrique","ror":"https://ror.org/01apwkd48","country_code":"FR","type":"education","lineage":["https://openalex.org/I2802505300"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"B. Ravelo","raw_affiliation_strings":["Normandy University UNIROUEN, ESIGELEC, IRSEEM EA 4353, Saint-\u00c9tienne-du-Rouvray, France"],"raw_orcid":"https://orcid.org/0000-0001-7334-5016","affiliations":[{"raw_affiliation_string":"Normandy University UNIROUEN, ESIGELEC, IRSEEM EA 4353, Saint-\u00c9tienne-du-Rouvray, France","institution_ids":["https://openalex.org/I2802505300"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039176737","display_name":"A. Simoens","orcid":null},"institutions":[{"id":"https://openalex.org/I4210117188","display_name":"Federal Mogul (France)","ror":"https://ror.org/023kawg24","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210117188","https://openalex.org/I77134640"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Simoens","raw_affiliation_strings":["Federal-Mogul Systems Protection SAS, Cr\u00e9py-en-Valois, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal-Mogul Systems Protection SAS, Cr\u00e9py-en-Valois, France","institution_ids":["https://openalex.org/I4210117188"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084323800","display_name":"A. Fathallah","orcid":null},"institutions":[{"id":"https://openalex.org/I4210117188","display_name":"Federal Mogul (France)","ror":"https://ror.org/023kawg24","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210117188","https://openalex.org/I77134640"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"A. Fathallah","raw_affiliation_strings":["Federal-Mogul Systems Protection SAS, Cr\u00e9py-en-Valois, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal-Mogul Systems Protection SAS, Cr\u00e9py-en-Valois, France","institution_ids":["https://openalex.org/I4210117188"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0898,"has_fulltext":true,"cited_by_count":11,"citation_normalized_percentile":{"value":0.77998237,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"72505","last_page":"72517"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.6316617727279663},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.6093841195106506},{"id":"https://openalex.org/keywords/ohm","display_name":"Ohm","score":0.5077963471412659},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.4809533655643463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4771539568901062},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.46686601638793945},{"id":"https://openalex.org/keywords/electromagnetic-compatibility","display_name":"Electromagnetic compatibility","score":0.4381035566329956},{"id":"https://openalex.org/keywords/impedance-parameters","display_name":"Impedance parameters","score":0.4260557293891907},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29299694299697876},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2293725311756134},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1460527777671814},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13996350765228271},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11611083149909973}],"concepts":[{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.6316617727279663},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.6093841195106506},{"id":"https://openalex.org/C32211213","wikidata":"https://www.wikidata.org/wiki/Q47083","display_name":"Ohm","level":2,"score":0.5077963471412659},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.4809533655643463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4771539568901062},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.46686601638793945},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.4381035566329956},{"id":"https://openalex.org/C113805353","wikidata":"https://www.wikidata.org/wiki/Q13424600","display_name":"Impedance parameters","level":3,"score":0.4260557293891907},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29299694299697876},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2293725311756134},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1460527777671814},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13996350765228271},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11611083149909973}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2919384","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2919384","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08723344.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9fa221d961cc4e0aa3fceb1790e57197","is_oa":true,"landing_page_url":"https://doaj.org/article/9fa221d961cc4e0aa3fceb1790e57197","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 72505-72517 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2919384","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2919384","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08723344.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2947645305.pdf","grobid_xml":"https://content.openalex.org/works/W2947645305.grobid-xml"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W242551503","https://openalex.org/W1824618951","https://openalex.org/W1966644166","https://openalex.org/W1985513859","https://openalex.org/W2089785706","https://openalex.org/W2102758942","https://openalex.org/W2106826702","https://openalex.org/W2113346827","https://openalex.org/W2119685352","https://openalex.org/W2125551127","https://openalex.org/W2135489053","https://openalex.org/W2146214773","https://openalex.org/W2147285506","https://openalex.org/W2152858671","https://openalex.org/W2161012399","https://openalex.org/W2172159121","https://openalex.org/W2187368394","https://openalex.org/W2267595247","https://openalex.org/W2323441490","https://openalex.org/W2346888713","https://openalex.org/W2529670944","https://openalex.org/W2541795306","https://openalex.org/W2561071355","https://openalex.org/W2743944882","https://openalex.org/W2744501754","https://openalex.org/W2802340155","https://openalex.org/W2883367735","https://openalex.org/W2894993009","https://openalex.org/W3203317383","https://openalex.org/W4298039353","https://openalex.org/W6638534946","https://openalex.org/W6742284153","https://openalex.org/W6742595804","https://openalex.org/W6753214897","https://openalex.org/W6802390127"],"related_works":["https://openalex.org/W2916704218","https://openalex.org/W2169147958","https://openalex.org/W1529386106","https://openalex.org/W2059128520","https://openalex.org/W1986501204","https://openalex.org/W2913275612","https://openalex.org/W2198190852","https://openalex.org/W4250844012","https://openalex.org/W2358334619","https://openalex.org/W4385220972"],"abstract_inverted_index":{"This":[0],"paper":[1],"deals":[2],"with":[3,32,78,141],"the":[4,21,33,47,52,60,66,79,87,93,98,105,117,126,133,151,160,171,175,181,193,195,208],"fast":[5,135,202],"S-parameter":[6,121,136],"modeling":[7,28,138],"of":[8,24,51,86,104,116,132,144,146],"multi-port":[9,107],"lumped":[10],"structures.":[11],"The":[12,27,41,72,101,120,130],"developed":[13,196],"model":[14,122,177,197],"is":[15,30,57,109,123,139,190,198],"based":[16],"on":[17],"unfamiliar":[18],"formalism":[19],"using":[20],"tensorial":[22,80],"analysis":[23],"networks":[25],"(TAN).":[26],"methodology":[29,42],"described":[31],"general":[34],"abstract":[35],"topology":[36,50],"and":[37,68,92,155,178,203],"different":[38],"application":[39],"cases.":[40],"consists,":[43],"first,":[44],"in":[45,84,97],"elaborating":[46],"equivalent":[48,102],"graph":[49],"considered":[53,106],"problem.":[54],"Then,":[55],"it":[56],"followed":[58],"by":[59,149],"TAN":[61,137,176],"mathematical":[62],"abstraction,":[63],"including,":[64],"successively,":[65],"branch":[67],"mesh":[69,99,118],"space":[70],"analyses.":[71],"problem":[73],"metric":[74],"can":[75],"be":[76],"written":[77],"Ohm's":[81],"law":[82],"expressed":[83],"function":[85],"covariant":[88,95],"voltage,":[89],"contravariant":[90],"current,":[91],"twice":[94],"impedance":[96],"spaces.":[100],"Z-matrix":[103],"structure":[108,157],"established":[110,134],"from":[111,125,159,174,180,184],"an":[112,167],"innovative":[113],"reduction":[114],"method":[115],"impedance.":[119],"extracted":[124],"Z-to-S":[127],"matrix":[128],"transform.":[129],"effectiveness":[131],"validated":[140],"three":[142],"cases":[143],"proof":[145],"concept":[147],"constituted":[148],"TT-cell,":[150],"TTT-cell":[152],"two-port":[153],"circuit,":[154],"four-port":[156],"inspired":[158],"3D":[161],"coaxial":[162],"shielded":[163,210],"cable.":[164],"As":[165],"expected,":[166],"excellent":[168],"agreement":[169],"between":[170],"S-parameters":[172],"calculated":[173],"simulated":[179],"commercial":[182],"tools":[183],"DC":[185],"to":[186],"some":[187],"hundred's":[188],"megahertz":[189],"obtained.":[191],"In":[192],"future,":[194],"outstandingly":[199],"beneficial":[200],"for":[201,207],"accurate":[204],"applications":[205],"notably":[206],"conduced":[209],"cable":[211],"electromagnetic":[212],"compatibility":[213],"analysis.":[214]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}