{"id":"https://openalex.org/W2945285557","doi":"https://doi.org/10.1109/access.2019.2916461","title":"Intelligent Localization of Transformer Internal Degradations Combining Deep Convolutional Neural Networks and Image Segmentation","display_name":"Intelligent Localization of Transformer Internal Degradations Combining Deep Convolutional Neural Networks and Image Segmentation","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2945285557","doi":"https://doi.org/10.1109/access.2019.2916461","mag":"2945285557"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2916461","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2916461","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08713463.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08713463.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038380017","display_name":"Jiajun Duan","orcid":"https://orcid.org/0000-0001-5857-796X"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajun Duan","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":"https://orcid.org/0000-0001-5857-796X","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020019416","display_name":"Yigang He","orcid":"https://orcid.org/0000-0002-6642-0740"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yigang He","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069621697","display_name":"Bolun Du","orcid":"https://orcid.org/0000-0002-6297-6848"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bolun Du","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045858841","display_name":"Ruaa M. Rashad Ghandour","orcid":"https://orcid.org/0000-0002-0558-1604"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruaa M. Rashad Ghandour","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074840856","display_name":"W. Wu","orcid":"https://orcid.org/0000-0003-4379-9548"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenjie Wu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100323491","display_name":"Hui Zhang","orcid":"https://orcid.org/0000-0002-7740-4068"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I37461747"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.0585,"has_fulltext":true,"cited_by_count":25,"citation_normalized_percentile":{"value":0.87197192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"7","issue":null,"first_page":"62705","last_page":"62720"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14319","display_name":"Currency Recognition and Detection","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7167834639549255},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.6958541870117188},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6630059480667114},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6231146454811096},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.5424711108207703},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5136668086051941},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5094874501228333},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.4589563012123108},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4499564468860626},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.44855907559394836},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4110494554042816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14714285731315613},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07093286514282227}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7167834639549255},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.6958541870117188},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6630059480667114},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6231146454811096},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.5424711108207703},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5136668086051941},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5094874501228333},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4589563012123108},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4499564468860626},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.44855907559394836},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4110494554042816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14714285731315613},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07093286514282227},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2916461","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2916461","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08713463.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:bbf7c1f89bf54bcbbb9bedad2581aefb","is_oa":true,"landing_page_url":"https://doaj.org/article/bbf7c1f89bf54bcbbb9bedad2581aefb","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 62705-62720 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2916461","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2916461","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08713463.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1396908399","display_name":"\u57fa\u4e8e\u6807\u8bc6\u4f20\u611f\u878d\u5408\u7684\u8f93\u53d8\u7535\u8bbe\u5907\u4fe1\u606f\u611f\u77e5\u4e0e\u5904\u7406\u5173\u952e\u95ee\u9898\u7814\u7a76","funder_award_id":"51637004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5851346405","display_name":null,"funder_award_id":"2016YFF0102200","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6496176865","display_name":null,"funder_award_id":"51577046","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8144085396","display_name":null,"funder_award_id":"41402040301","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2945285557.pdf","grobid_xml":"https://content.openalex.org/works/W2945285557.grobid-xml"},"referenced_works_count":44,"referenced_works":["https://openalex.org/W1686810756","https://openalex.org/W1931803241","https://openalex.org/W1964961836","https://openalex.org/W2035531407","https://openalex.org/W2043181992","https://openalex.org/W2062900651","https://openalex.org/W2097117768","https://openalex.org/W2117242079","https://openalex.org/W2163605009","https://openalex.org/W2194775991","https://openalex.org/W2265336114","https://openalex.org/W2428325231","https://openalex.org/W2593968453","https://openalex.org/W2605738098","https://openalex.org/W2608946692","https://openalex.org/W2624034082","https://openalex.org/W2724573302","https://openalex.org/W2724730420","https://openalex.org/W2732458570","https://openalex.org/W2737897717","https://openalex.org/W2744297321","https://openalex.org/W2747054162","https://openalex.org/W2755753252","https://openalex.org/W2760536864","https://openalex.org/W2766824859","https://openalex.org/W2767016721","https://openalex.org/W2767234670","https://openalex.org/W2769980131","https://openalex.org/W2785630209","https://openalex.org/W2790977031","https://openalex.org/W2791149978","https://openalex.org/W2792745021","https://openalex.org/W2797405679","https://openalex.org/W2798854001","https://openalex.org/W2805613037","https://openalex.org/W2805772477","https://openalex.org/W2893813411","https://openalex.org/W2919115771","https://openalex.org/W2963150697","https://openalex.org/W2963446712","https://openalex.org/W4255510199","https://openalex.org/W6602612410","https://openalex.org/W6684191040","https://openalex.org/W6725739302"],"related_works":["https://openalex.org/W4293226380","https://openalex.org/W4375867731","https://openalex.org/W4226493464","https://openalex.org/W4312417841","https://openalex.org/W3193565141","https://openalex.org/W3133861977","https://openalex.org/W2951211570","https://openalex.org/W3103566983","https://openalex.org/W3167935049","https://openalex.org/W3029198973"],"abstract_inverted_index":{"Industrial":[0],"4.0":[1],"placed":[2],"higher":[3],"demands":[4],"on":[5],"the":[6,17,57,72,78,97,130,134,145,152,156,162,168,187,200,206,217,226,230,240,248,261,268,277],"field":[7],"of":[8,16,61,147,182,225,264,270],"intelligent":[9,22],"equipment":[10],"monitoring.":[11],"The":[12],"transformer":[13,39,58,89,177],"is":[14],"one":[15],"critical":[18],"power":[19],"devices,":[20],"its":[21],"monitoring":[23,59,169,184,188],"and":[24,53,63,77,123,150,252,267],"fault":[25,35,67,98,116,135,148,163,202],"positioning":[26],"require":[27],"in-depth":[28],"studies.":[29],"In":[30,87],"this":[31,107,273],"study,":[32],"an":[33],"efficient":[34],"localization":[36,136,164,203],"method":[37,75,112],"for":[38,100],"internal":[40],"thermal":[41],"faults":[42],"was":[43,113,141,191,220,243,275],"proposed":[44],"by":[45,209,237,245],"introducing":[46],"different":[47,124,265],"deep":[48,101],"convolutional":[49],"neural":[50],"networks":[51],"(CNNs)":[52],"image":[54,139,198],"segmentation.":[55],"First,":[56],"images":[60,79],"temperature":[62],"velocity":[64],"fields":[65],"in":[66,175,178,272],"conditions":[68],"were":[69,80,118,126,158,171,257],"simulated":[70],"using":[71,205],"lattice":[73],"Boltzmann":[74],"(LBM),":[76],"also":[81],"used":[82,127],"to":[83,128,132,143,160,214,222,259],"highlight":[84],"features":[85,146],"information.":[86],"practice,":[88],"degradation":[90],"does":[91],"not":[92,172],"frequently":[93],"occur,":[94],"so":[95],"that":[96],"samples":[99],"learning":[102,111],"are":[103],"insufficient.":[104],"To":[105],"solve":[106],"problem,":[108],"a":[109,176,194],"transfer":[110],"employed.":[114],"Subsequently,":[115],"locations":[117],"defined":[119],"as":[120],"classification":[121],"labels,":[122],"CNN's":[125,157],"classify":[129],"labels":[131],"achieve":[133],"results.":[137],"Next,":[138],"segmentation":[140],"performed":[142,258],"extract":[144],"areas":[149,185],"simplify":[151],"data":[153,218],"volumes.":[154],"Likewise,":[155],"employed":[159],"perform":[161],"again.":[165],"Afterward,":[166],"since":[167],"sensors":[170,189,210],"located":[173,190],"everywhere":[174],"practical":[179],"applications,":[180],"information":[181,207],"partial":[183],"where":[186],"trained":[192],"following":[193],"similar":[195],"procedure.":[196],"After":[197],"segmentation,":[199],"average":[201,231],"accuracy":[204],"obtained":[208],"decreased":[211,236],"from":[212],"97.95%":[213],"94.42%,":[215],"while":[216,239],"volume":[219],"reduced":[221,244],"nearly":[223],"1%":[224],"original":[227],"one.":[228],"Besides,":[229],"calculation":[232],"time":[233],"per":[234],"iteration":[235],"8.816%,":[238],"loss":[241],"value":[242],"37.68%.":[246],"Finally,":[247],"Friedman":[249],"hypothesis":[250],"test":[251,256],"Nemenyi":[253],"post":[254],"hoc":[255],"compare":[260],"evaluation":[262],"indicators":[263],"networks,":[266],"performance":[269],"GoogLeNet":[271],"case":[274],"considered":[276],"best.":[278]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":5}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}