{"id":"https://openalex.org/W2925471352","doi":"https://doi.org/10.1109/access.2019.2908885","title":"Detection of a Conductive Object Embedded in an Optically Opaque Dielectric Medium by the Thermo-Elastic Optical Indicator Microscopy","display_name":"Detection of a Conductive Object Embedded in an Optically Opaque Dielectric Medium by the Thermo-Elastic Optical Indicator Microscopy","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2925471352","doi":"https://doi.org/10.1109/access.2019.2908885","mag":"2925471352"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2908885","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2908885","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08680619.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08680619.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040384049","display_name":"Hanju Lee","orcid":"https://orcid.org/0000-0001-5267-9586"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hanju Lee","raw_affiliation_strings":["Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5267-9586","affiliations":[{"raw_affiliation_string":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054327409","display_name":"Zhirayr Baghdasaryan","orcid":"https://orcid.org/0000-0003-0776-9157"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Zhirayr Baghdasaryan","raw_affiliation_strings":["Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048791373","display_name":"Barry Friedman","orcid":"https://orcid.org/0000-0003-2455-7121"},"institutions":[{"id":"https://openalex.org/I191429286","display_name":"Sam Houston State University","ror":"https://ror.org/00yh3cz06","country_code":"US","type":"education","lineage":["https://openalex.org/I191429286"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Barry Friedman","raw_affiliation_strings":["Department of Physics, Sam Houston State University, Huntsville, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Sam Houston State University, Huntsville, TX, USA","institution_ids":["https://openalex.org/I191429286"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021399304","display_name":"Kiejin Lee","orcid":"https://orcid.org/0000-0001-5209-7375"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kiejin Lee","raw_affiliation_strings":["Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5209-7375","affiliations":[{"raw_affiliation_string":"Department of Physics and Basic Science Institute for Cell Damage Control, Sogang University, Seoul, South Korea","institution_ids":["https://openalex.org/I148751991"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5040384049"],"corresponding_institution_ids":["https://openalex.org/I148751991"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.1993,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.49538401,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"7","issue":null,"first_page":"46084","last_page":"46091"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.8154882192611694},{"id":"https://openalex.org/keywords/opacity","display_name":"Opacity","score":0.8074967861175537},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.7855782508850098},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7836264371871948},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.74901282787323},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6370927095413208},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.5881376266479492},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.5149627327919006},{"id":"https://openalex.org/keywords/optical-microscope","display_name":"Optical microscope","score":0.5073162913322449},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5040249228477478},{"id":"https://openalex.org/keywords/conductive-atomic-force-microscopy","display_name":"Conductive atomic force microscopy","score":0.44946131110191345},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.4437101185321808},{"id":"https://openalex.org/keywords/near-and-far-field","display_name":"Near and far field","score":0.4168645739555359},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.179620623588562},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12344413995742798},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.11733955144882202},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.11266261339187622},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.06953287124633789},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.06795722246170044}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.8154882192611694},{"id":"https://openalex.org/C60056205","wikidata":"https://www.wikidata.org/wiki/Q691914","display_name":"Opacity","level":2,"score":0.8074967861175537},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.7855782508850098},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7836264371871948},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.74901282787323},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6370927095413208},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.5881376266479492},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5149627327919006},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.5073162913322449},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5040249228477478},{"id":"https://openalex.org/C206008964","wikidata":"https://www.wikidata.org/wiki/Q5159384","display_name":"Conductive atomic force microscopy","level":3,"score":0.44946131110191345},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.4437101185321808},{"id":"https://openalex.org/C25227671","wikidata":"https://www.wikidata.org/wiki/Q13405516","display_name":"Near and far field","level":2,"score":0.4168645739555359},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.179620623588562},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12344413995742798},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.11733955144882202},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.11266261339187622},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.06953287124633789},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.06795722246170044},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2908885","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2908885","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08680619.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:865a239ec40d4060a0e0408c33897523","is_oa":true,"landing_page_url":"https://doaj.org/article/865a239ec40d4060a0e0408c33897523","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 46084-46091 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2908885","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2908885","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08680619.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G14988735","display_name":null,"funder_award_id":"2009-0093822","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G2122684467","display_name":null,"funder_award_id":"NRF-2018R1D1A1B07047984","funder_id":"https://openalex.org/F4320311687","funder_display_name":"Ministry of Education"},{"id":"https://openalex.org/G2714937118","display_name":null,"funder_award_id":"NRF-2018K2A9A1A01090496","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G7583836724","display_name":null,"funder_award_id":"2015R1D1A1A02061824","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320311687","display_name":"Ministry of Education","ror":"https://ror.org/03m01yf64"},{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2925471352.pdf","grobid_xml":"https://content.openalex.org/works/W2925471352.grobid-xml"},"referenced_works_count":17,"referenced_works":["https://openalex.org/W1969832791","https://openalex.org/W1980533283","https://openalex.org/W1990634755","https://openalex.org/W2036325237","https://openalex.org/W2061357096","https://openalex.org/W2075158547","https://openalex.org/W2078940259","https://openalex.org/W2110116412","https://openalex.org/W2152337238","https://openalex.org/W2283132972","https://openalex.org/W2410332788","https://openalex.org/W2527245210","https://openalex.org/W2566351165","https://openalex.org/W2570099014","https://openalex.org/W2727237391","https://openalex.org/W2744841156","https://openalex.org/W2758995791"],"related_works":["https://openalex.org/W2161791806","https://openalex.org/W4366824690","https://openalex.org/W2073474947","https://openalex.org/W2613656770","https://openalex.org/W2482431380","https://openalex.org/W2053059436","https://openalex.org/W4313201885","https://openalex.org/W2082077321","https://openalex.org/W2091556102","https://openalex.org/W2214573136"],"abstract_inverted_index":{"We":[0,124],"present":[1,28,100,133,188],"a":[2,10,15,43,48,110,113,117,173,192],"new":[3],"method":[4,29,189],"for":[5,198],"the":[6,33,36,52,55,62,68,74,80,83,87,92,95,99,104,135,140,143,152,158,187,199],"subsurface":[7],"imaging":[8,21,34],"of":[9,35,54,82,94,112,142,157,169,175,181,201],"conductive":[11,44,69,118,136,164,202],"object":[12,45,70,84,119,137],"embedded":[13,46,206],"in":[14,47,207],"dielectric":[16,49,56,75,114,144,211],"medium":[17,57,115],"based":[18,31],"on":[19,32,91,109,139,151],"microwave":[20,37,63,88,105,128],"by":[22,42,67,85],"thermo-elastic":[23],"optical":[24],"indicator":[25],"microscopy.":[26],"The":[27],"is":[30,58],"near":[38,64,129],"field":[39,65,106],"distribution":[40,89,107],"generated":[41,66],"medium.":[50,96,212],"When":[51],"thickness":[53],"small":[59],"so":[60],"that":[61,126,131,186],"can":[71,78,190],"emerge":[72],"from":[73],"medium,":[76,145],"one":[77],"find":[79],"presence":[81],"visualizing":[86,162],"appearing":[90,108],"surface":[93,111,141],"By":[97,161],"using":[98],"method,":[101],"we":[102,184],"visualized":[103],"containing":[116],"with":[120,172],"an":[121,208],"irradiating":[122],"microwave.":[123,160],"observed":[125],"strong":[127],"fields":[130],"were":[132,149],"around":[134],"appeared":[138],"and":[146,154,178,195,204],"their":[147],"intensities":[148],"dependent":[150],"frequency":[153],"polarization":[155],"direction":[156],"irradiated":[159],"various":[163],"lines":[165,203],"having":[166],"different":[167],"lengths":[168],"4~10":[170],"mm":[171],"width":[174],"1":[176],"mm,":[177,183],"buried":[179],"depths":[180],"1~5":[182],"showed":[185],"be":[191],"practical":[193],"nondestructive":[194],"noncontact":[196],"way":[197],"detection":[200],"structures":[205],"optically":[209],"opaque":[210]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}