{"id":"https://openalex.org/W2926150930","doi":"https://doi.org/10.1109/access.2019.2906325","title":"Degradation Data Analysis Using a Wiener Degradation Model With Three-Source Uncertainties","display_name":"Degradation Data Analysis Using a Wiener Degradation Model With Three-Source Uncertainties","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2926150930","doi":"https://doi.org/10.1109/access.2019.2906325","mag":"2926150930"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2906325","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2906325","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08672774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08672774.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030306107","display_name":"Donghui Pan","orcid":"https://orcid.org/0000-0003-0376-3217"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Donghui Pan","raw_affiliation_strings":["School of Mathematical Sciences, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematical Sciences, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057517079","display_name":"Siliang Lu","orcid":"https://orcid.org/0000-0002-7101-7948"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siliang Lu","raw_affiliation_strings":["College of Electrical Engineering and Automation, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101666118","display_name":"Yongbin Liu","orcid":"https://orcid.org/0000-0002-3420-3784"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongbin Liu","raw_affiliation_strings":["College of Electrical Engineering and Automation, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101765835","display_name":"Wenzhi Yang","orcid":"https://orcid.org/0000-0002-7845-6142"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenzhi Yang","raw_affiliation_strings":["School of Mathematical Sciences, Anhui University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mathematical Sciences, Anhui University, Hefei, China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076981458","display_name":"Jia\u2010Bao Liu","orcid":"https://orcid.org/0000-0002-9620-7692"},"institutions":[{"id":"https://openalex.org/I118987531","display_name":"Anhui Jianzhu University","ror":"https://ror.org/0108wjw08","country_code":"CN","type":"education","lineage":["https://openalex.org/I118987531"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jia-Bao Liu","raw_affiliation_strings":["School of Mathematics and Physics, Anhui Jianzhu University, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-9620-7692","affiliations":[{"raw_affiliation_string":"School of Mathematics and Physics, Anhui Jianzhu University, Hefei, China","institution_ids":["https://openalex.org/I118987531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5030306107"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.9011,"has_fulltext":true,"cited_by_count":21,"citation_normalized_percentile":{"value":0.89407645,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"37896","last_page":"37907"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14138","display_name":"Life Cycle Costing Analysis","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1402","display_name":"Accounting"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.8006172180175781},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6029991507530212},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5862325429916382},{"id":"https://openalex.org/keywords/maximization","display_name":"Maximization","score":0.4870045781135559},{"id":"https://openalex.org/keywords/expectation\u2013maximization-algorithm","display_name":"Expectation\u2013maximization algorithm","score":0.46361809968948364},{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.43435025215148926},{"id":"https://openalex.org/keywords/wiener-process","display_name":"Wiener process","score":0.4342572093009949},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4130784869194031},{"id":"https://openalex.org/keywords/population","display_name":"Population","score":0.412533164024353},{"id":"https://openalex.org/keywords/maximum-likelihood","display_name":"Maximum likelihood","score":0.4013802707195282},{"id":"https://openalex.org/keywords/mathematical-optimization","display_name":"Mathematical optimization","score":0.29611629247665405},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2617912292480469}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.8006172180175781},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6029991507530212},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5862325429916382},{"id":"https://openalex.org/C2776330181","wikidata":"https://www.wikidata.org/wiki/Q18358244","display_name":"Maximization","level":2,"score":0.4870045781135559},{"id":"https://openalex.org/C182081679","wikidata":"https://www.wikidata.org/wiki/Q1275153","display_name":"Expectation\u2013maximization algorithm","level":3,"score":0.46361809968948364},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.43435025215148926},{"id":"https://openalex.org/C60391097","wikidata":"https://www.wikidata.org/wiki/Q1056809","display_name":"Wiener process","level":2,"score":0.4342572093009949},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4130784869194031},{"id":"https://openalex.org/C2908647359","wikidata":"https://www.wikidata.org/wiki/Q2625603","display_name":"Population","level":2,"score":0.412533164024353},{"id":"https://openalex.org/C49781872","wikidata":"https://www.wikidata.org/wiki/Q1045555","display_name":"Maximum likelihood","level":2,"score":0.4013802707195282},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.29611629247665405},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2617912292480469},{"id":"https://openalex.org/C144024400","wikidata":"https://www.wikidata.org/wiki/Q21201","display_name":"Sociology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C149923435","wikidata":"https://www.wikidata.org/wiki/Q37732","display_name":"Demography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2906325","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2906325","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08672774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:e11246ef63c5445ba85e3031e7f1ffe3","is_oa":true,"landing_page_url":"https://doaj.org/article/e11246ef63c5445ba85e3031e7f1ffe3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 37896-37907 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2906325","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2906325","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08672774.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.5600000023841858}],"awards":[{"id":"https://openalex.org/G2855616271","display_name":null,"funder_award_id":"51675001","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G3065972664","display_name":null,"funder_award_id":"11601006","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3591149844","display_name":null,"funder_award_id":"51675001","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3743568539","display_name":null,"funder_award_id":"1808085QF212","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G381739775","display_name":null,"funder_award_id":"51605002","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G5630876453","display_name":null,"funder_award_id":"51605002","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7822690633","display_name":null,"funder_award_id":"2017M621579","funder_id":"https://openalex.org/F4320334897","funder_display_name":"Natural Science Foundation of Anhui Province"},{"id":"https://openalex.org/G8007819821","display_name":null,"funder_award_id":"11501005","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G828030330","display_name":null,"funder_award_id":"2017M621579","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321435","display_name":"Anhui University","ror":"https://ror.org/05th6yx34"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320334897","display_name":"Natural Science Foundation of Anhui Province","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2926150930.pdf","grobid_xml":"https://content.openalex.org/works/W2926150930.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W22795681","https://openalex.org/W1585926113","https://openalex.org/W1818354251","https://openalex.org/W1967513204","https://openalex.org/W1971248991","https://openalex.org/W1974635664","https://openalex.org/W1975174792","https://openalex.org/W1985827874","https://openalex.org/W1987464286","https://openalex.org/W1988286714","https://openalex.org/W1996593110","https://openalex.org/W1998453757","https://openalex.org/W2003216150","https://openalex.org/W2006287597","https://openalex.org/W2008606444","https://openalex.org/W2012346040","https://openalex.org/W2013641085","https://openalex.org/W2019718827","https://openalex.org/W2023083702","https://openalex.org/W2033756468","https://openalex.org/W2043129860","https://openalex.org/W2049633694","https://openalex.org/W2067266460","https://openalex.org/W2069719474","https://openalex.org/W2103221250","https://openalex.org/W2103590861","https://openalex.org/W2110007571","https://openalex.org/W2112935810","https://openalex.org/W2126432428","https://openalex.org/W2136847059","https://openalex.org/W2137297477","https://openalex.org/W2147664181","https://openalex.org/W2203091266","https://openalex.org/W2486038092","https://openalex.org/W2593521312","https://openalex.org/W2624231555","https://openalex.org/W2763830668","https://openalex.org/W3098718910","https://openalex.org/W4299419703","https://openalex.org/W6600953710"],"related_works":["https://openalex.org/W1978153144","https://openalex.org/W102848802","https://openalex.org/W1976188970","https://openalex.org/W2982058819","https://openalex.org/W2130734797","https://openalex.org/W2172249169","https://openalex.org/W3176361882","https://openalex.org/W2990541822","https://openalex.org/W2122958477","https://openalex.org/W2025556230"],"abstract_inverted_index":{"The":[0,57,87,112,144],"degradation":[1,15,35,44,77,162],"data":[2,16],"have":[3],"been":[4],"widely":[5],"applied":[6],"in":[7,68,98],"reliability":[8],"analysis":[9],"for":[10],"deteriorating":[11],"systems.":[12],"However,":[13],"the":[14,27,65,73,76,93,99,102,120,124,133,138,147,161,165],"are":[17,96],"usually":[18],"contaminated":[19],"by":[20,46,106],"measurement":[21,50],"errors":[22],"that":[23,75],"can":[24],"severely":[25],"affect":[26],"life":[28,38,94],"estimation":[29,39,134,142],"performance.":[30],"This":[31],"paper":[32],"presents":[33],"a":[34,42,69,153,157],"modeling":[36],"and":[37,52,89,156],"method":[40],"using":[41],"Wiener":[43],"model":[45,121],"taking":[47],"temporal":[48],"uncertainty,":[49,51],"unit-to-unit":[53,66],"heterogeneity":[54,67],"into":[55],"account.":[56],"truncated":[58],"normal":[59],"distribution":[60,95],"is":[61,116,150],"employed":[62],"to":[63,72,118],"characterize":[64],"population":[70],"due":[71],"fact":[74],"rates":[78],"of":[79,92,101,110,146,164],"many":[80],"systems":[81],"often":[82],"manifest":[83],"as":[84],"positive":[85],"values.":[86],"exact":[88],"explicit":[90],"expressions":[91],"derived":[97],"sense":[100],"first":[103],"hitting":[104],"time":[105],"considering":[107],"three":[108],"kinds":[109],"uncertainties.":[111],"expectation":[113],"maximization":[114],"algorithm":[115],"used":[117],"estimate":[119],"parameters":[122],"because":[123],"resulting":[125],"likelihood":[126,141],"function":[127],"includes":[128],"hidden":[129],"variables,":[130],"which":[131],"improves":[132],"efficiency":[135],"compared":[136],"with":[137],"existing":[139],"maximum":[140],"procedure.":[143],"effectiveness":[145],"proposed":[148],"approach":[149],"validated":[151],"through":[152],"simulation":[154],"example":[155],"case":[158],"study":[159],"involving":[160],"dataset":[163],"LED.":[166]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":4}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}