{"id":"https://openalex.org/W2912882342","doi":"https://doi.org/10.1109/access.2019.2898513","title":"Design Analysis of Integrated Passive Device-Based Balun Devices With High Selectivity for Mobile Application","display_name":"Design Analysis of Integrated Passive Device-Based Balun Devices With High Selectivity for Mobile Application","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2912882342","doi":"https://doi.org/10.1109/access.2019.2898513","mag":"2912882342"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2898513","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898513","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08638780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08638780.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040146852","display_name":"Alok Kumar","orcid":"https://orcid.org/0000-0001-8497-7086"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Alok Kumar","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0001-8497-7086","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100400488","display_name":"Fan\u2010Yi Meng","orcid":"https://orcid.org/0000-0001-8748-9520"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan-Yi Meng","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100390469","display_name":"Cong Wang","orcid":"https://orcid.org/0000-0002-2863-0309"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cong Wang","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034728226","display_name":"Kishor Kumar Adhikari","orcid":"https://orcid.org/0000-0003-3872-2589"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kishor Kumar Adhikari","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001240336","display_name":"Tian Qiang","orcid":"https://orcid.org/0000-0002-4811-7094"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tian Qiang","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101650280","display_name":"Qun Wu","orcid":"https://orcid.org/0000-0001-9144-048X"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qun Wu","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040846618","display_name":"Yongle Wu","orcid":"https://orcid.org/0000-0002-3269-7143"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongle Wu","raw_affiliation_strings":["School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3269-7143","affiliations":[{"raw_affiliation_string":"School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5040146852"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.2108,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.79151648,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"23169","last_page":"23176"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/balun","display_name":"Balun","score":0.9695906639099121},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.757481575012207},{"id":"https://openalex.org/keywords/return-loss","display_name":"Return loss","score":0.5850911736488342},{"id":"https://openalex.org/keywords/passband","display_name":"Passband","score":0.5276438593864441},{"id":"https://openalex.org/keywords/band-pass-filter","display_name":"Band-pass filter","score":0.5232702493667603},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.511854350566864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49351513385772705},{"id":"https://openalex.org/keywords/gallium-arsenide","display_name":"Gallium arsenide","score":0.48447489738464355},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.44320759177207947},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.43851327896118164},{"id":"https://openalex.org/keywords/center-frequency","display_name":"Center frequency","score":0.4349365830421448},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37351447343826294},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33892855048179626},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19724565744400024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13824793696403503}],"concepts":[{"id":"https://openalex.org/C114489654","wikidata":"https://www.wikidata.org/wiki/Q805838","display_name":"Balun","level":3,"score":0.9695906639099121},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.757481575012207},{"id":"https://openalex.org/C196901423","wikidata":"https://www.wikidata.org/wiki/Q3933836","display_name":"Return loss","level":3,"score":0.5850911736488342},{"id":"https://openalex.org/C46416853","wikidata":"https://www.wikidata.org/wiki/Q254758","display_name":"Passband","level":3,"score":0.5276438593864441},{"id":"https://openalex.org/C147788027","wikidata":"https://www.wikidata.org/wiki/Q2718101","display_name":"Band-pass filter","level":2,"score":0.5232702493667603},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.511854350566864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49351513385772705},{"id":"https://openalex.org/C510052550","wikidata":"https://www.wikidata.org/wiki/Q422819","display_name":"Gallium arsenide","level":2,"score":0.48447489738464355},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.44320759177207947},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43851327896118164},{"id":"https://openalex.org/C7054721","wikidata":"https://www.wikidata.org/wiki/Q1940572","display_name":"Center frequency","level":3,"score":0.4349365830421448},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37351447343826294},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33892855048179626},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19724565744400024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13824793696403503},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2898513","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898513","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08638780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c100a8f810224b5c9652b78fae588c1e","is_oa":true,"landing_page_url":"https://doaj.org/article/c100a8f810224b5c9652b78fae588c1e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 23169-23176 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2898513","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898513","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08638780.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3614008586","display_name":null,"funder_award_id":"61801146","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G723276654","display_name":null,"funder_award_id":"LBH-Z17056","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G7582387932","display_name":null,"funder_award_id":"2017M611367","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https://openalex.org/G851483139","display_name":null,"funder_award_id":"2018M641813","funder_id":"https://openalex.org/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https://ror.org/0426zh255"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2912882342.pdf","grobid_xml":"https://content.openalex.org/works/W2912882342.grobid-xml"},"referenced_works_count":39,"referenced_works":["https://openalex.org/W624924937","https://openalex.org/W1512687424","https://openalex.org/W1565175023","https://openalex.org/W1883654207","https://openalex.org/W1936117720","https://openalex.org/W1992664980","https://openalex.org/W2003216106","https://openalex.org/W2028914279","https://openalex.org/W2036091988","https://openalex.org/W2042336590","https://openalex.org/W2049816682","https://openalex.org/W2051977294","https://openalex.org/W2073694166","https://openalex.org/W2080480378","https://openalex.org/W2092452612","https://openalex.org/W2096522292","https://openalex.org/W2105694160","https://openalex.org/W2109441132","https://openalex.org/W2115509260","https://openalex.org/W2118704615","https://openalex.org/W2131102799","https://openalex.org/W2138219029","https://openalex.org/W2140144468","https://openalex.org/W2147288359","https://openalex.org/W2158921346","https://openalex.org/W2160347783","https://openalex.org/W2163721871","https://openalex.org/W2168091812","https://openalex.org/W2277744229","https://openalex.org/W2330731982","https://openalex.org/W2343021010","https://openalex.org/W2417444561","https://openalex.org/W2533716414","https://openalex.org/W2554312918","https://openalex.org/W2758589446","https://openalex.org/W2801425691","https://openalex.org/W2883441718","https://openalex.org/W4229594554","https://openalex.org/W6674580702"],"related_works":["https://openalex.org/W2781604473","https://openalex.org/W2124725464","https://openalex.org/W2087443878","https://openalex.org/W1973870453","https://openalex.org/W2086351729","https://openalex.org/W2059903353","https://openalex.org/W62741108","https://openalex.org/W4388488842","https://openalex.org/W3048852259","https://openalex.org/W2540303100"],"abstract_inverted_index":{"This":[0,83],"paper":[1],"presents":[2],"highly":[3],"selective,":[4],"low-loss,":[5],"and":[6,24,78,115,130,144],"miniaturized":[7],"balun":[8,98,103,157],"devices":[9,34],"fabricated":[10,36,154,173],"using":[11,43],"the":[12,19,25,44,50,68,92,97,102,105,152,168],"integrated":[13],"passive":[14],"device":[15,66,158],"(IPD)":[16],"technique":[17],"for":[18,151],"GSM":[20],"band":[21,27],"(900/1800":[22],"MHz)":[23,29],"WiFi":[26],"(2400":[28],"in":[30,96],"mobile":[31],"applications.":[32],"Balun":[33],"were":[35],"on":[37],"a":[38,75,79,109,134,160],"gallium":[39],"arsenide":[40],"(GaAs)":[41],"substrate":[42],"IPD":[45],"fabrication":[46],"process":[47],"to":[48,90],"reduce":[49,91],"overall":[51],"size":[52],"(0.05\u03bb":[53],"<sub":[54,59],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[55,60],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">g</sub>":[56,61],"\u00d7":[57],"0.036\u03bb":[58],"at":[62],"900":[63,164],"MHz).":[64],"Each":[65],"is":[67,140,147],"combination":[69],"of":[70,86,163],"lattice":[71],"lumped":[72,87],"structure":[73],"with":[74,159],"low-pass":[76],"filter":[77,81],"high-pass":[80],"configuration.":[82],"structural":[84],"formation":[85],"elements":[88],"helps":[89],"phase":[93,117],"mismatch":[94],"error":[95],"devices.":[99,155,174],"For":[100],"all":[101,172],"devices,":[104],"measured":[106,131],"results":[107,132,170],"indicated":[108],"minimum":[110],"amplitude":[111],"imbalance":[112,118],"(<;0.47":[113],"dB)":[114],"low":[116],"(180":[119],"\u00b1":[120],"2.6\u00b0).":[121],"Mathematically":[122],"calculated,":[123],"calculated":[124],"after":[125],"considering":[126],"parasitic":[127],"effects,":[128],"simulated":[129],"exhibited":[133],"good":[135],"correlation.":[136],"The":[137],"return":[138],"loss":[139,146],"below":[141,148],"18":[142],"dB":[143,150],"insertion":[145],"0.25":[149],"entire":[153],"A":[156],"center":[161],"frequency":[162],"MHz":[165],"has":[166],"given":[167],"best":[169],"amongst":[171]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":1}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}