{"id":"https://openalex.org/W2914061736","doi":"https://doi.org/10.1109/access.2019.2898154","title":"A Biomedical Sensor System With Stochastic A/D Conversion and Error Correction by Machine Learning","display_name":"A Biomedical Sensor System With Stochastic A/D Conversion and Error Correction by Machine Learning","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2914061736","doi":"https://doi.org/10.1109/access.2019.2898154","mag":"2914061736"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2898154","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898154","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08636959.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08636959.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045031108","display_name":"Yusaku Hirai","orcid":"https://orcid.org/0000-0002-1850-6283"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yusaku Hirai","raw_affiliation_strings":["SPChange, LLC., Yokohama, Japan"],"raw_orcid":"https://orcid.org/0000-0002-1850-6283","affiliations":[{"raw_affiliation_string":"SPChange, LLC., Yokohama, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071532549","display_name":"Toshimasa Matsuoka","orcid":"https://orcid.org/0000-0003-3876-2679"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshimasa Matsuoka","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan"],"raw_orcid":"https://orcid.org/0000-0003-3876-2679","affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102244354","display_name":"Sadahiro Tani","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sadahiro Tani","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080710600","display_name":"Shodai Isami","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shodai Isami","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018818545","display_name":"Keiji Tatsumi","orcid":"https://orcid.org/0000-0001-5514-5854"},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiji Tatsumi","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan","institution_ids":["https://openalex.org/I98285908"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102290793","display_name":"Masayuki Ueda","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masayuki Ueda","raw_affiliation_strings":["SPChange, LLC., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SPChange, LLC., Yokohama, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109380539","display_name":"Takatsugu Kamata","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Takatsugu Kamata","raw_affiliation_strings":["SPChange, LLC., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SPChange, LLC., Yokohama, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.0713,"has_fulltext":true,"cited_by_count":23,"citation_normalized_percentile":{"value":0.73016013,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"21990","last_page":"22001"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7323711514472961},{"id":"https://openalex.org/keywords/flash-adc","display_name":"Flash ADC","score":0.7237918972969055},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.7060959935188293},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.672157883644104},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.49438023567199707},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.42686352133750916},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4116831421852112},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2167050540447235},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15903910994529724},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10319453477859497}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7323711514472961},{"id":"https://openalex.org/C164862427","wikidata":"https://www.wikidata.org/wiki/Q2744647","display_name":"Flash ADC","level":4,"score":0.7237918972969055},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.7060959935188293},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.672157883644104},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.49438023567199707},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.42686352133750916},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4116831421852112},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2167050540447235},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15903910994529724},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10319453477859497}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2898154","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898154","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08636959.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0760674ca5404c5f9120ae2988c88010","is_oa":true,"landing_page_url":"https://doaj.org/article/0760674ca5404c5f9120ae2988c88010","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 21990-22001 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2898154","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2898154","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08636959.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321679","display_name":"Ministry of Economy, Trade and Industry","ror":"https://ror.org/055tm7f07"},{"id":"https://openalex.org/F4320334789","display_name":"Japan Science and Technology Agency","ror":"https://ror.org/00097mb19"},{"id":"https://openalex.org/F4320338117","display_name":"Adaptable and Seamless Technology Transfer Program through Target-Driven R and D","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2914061736.pdf","grobid_xml":"https://content.openalex.org/works/W2914061736.grobid-xml"},"referenced_works_count":28,"referenced_works":["https://openalex.org/W1495411198","https://openalex.org/W1527278250","https://openalex.org/W1901918705","https://openalex.org/W1965316915","https://openalex.org/W1981625867","https://openalex.org/W1985265430","https://openalex.org/W2008329772","https://openalex.org/W2012856983","https://openalex.org/W2017444605","https://openalex.org/W2030180389","https://openalex.org/W2030300946","https://openalex.org/W2045858890","https://openalex.org/W2053183756","https://openalex.org/W2060035179","https://openalex.org/W2064465719","https://openalex.org/W2097227860","https://openalex.org/W2116967254","https://openalex.org/W2152122400","https://openalex.org/W2152776190","https://openalex.org/W2159318368","https://openalex.org/W2319791131","https://openalex.org/W2742790417","https://openalex.org/W2759986866","https://openalex.org/W2766439704","https://openalex.org/W2771001537","https://openalex.org/W2793033486","https://openalex.org/W4212863985","https://openalex.org/W6645424087"],"related_works":["https://openalex.org/W2340159482","https://openalex.org/W2297502789","https://openalex.org/W2809902876","https://openalex.org/W2147238716","https://openalex.org/W3028366910","https://openalex.org/W2759986866","https://openalex.org/W2368405386","https://openalex.org/W2999022228","https://openalex.org/W2302377473","https://openalex.org/W2786160479"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,9,38,44,60,95,150,169,192],"high-precision":[4],"biomedical":[5],"sensor":[6,96],"system":[7,75],"with":[8,139],"novel":[10],"analog-frontend":[11],"(AFE)":[12],"IC":[13,22,111],"and":[14,125,154],"error":[15,68,80],"correction":[16,69],"by":[17,115,175],"machine":[18,83],"learning.":[19],"The":[20,34,54,73,119,145,159],"AFE":[21,110],"embeds":[23],"an":[24,87,109],"analog-to-digital":[25],"converter":[26],"(ADC)":[27],"architecture":[28],"called":[29],"successive":[30,45],"stochastic":[31,39],"approximation":[32,46],"ADC.":[33],"proposed":[35,74,178],"ADC":[36,41,48,79,161],"integrates":[37],"flash":[40],"(SF-ADC)":[42],"into":[43],"register":[47],"(SAR-ADC)":[49],"to":[50,66,99,137,182],"enhance":[51],"its":[52],"resolution.":[53],"SF-ADC":[55],"is":[56,122,133,147,189],"also":[57,76],"used":[58],"as":[59],"digitally":[61],"controlled":[62],"variable":[63],"threshold":[64],"comparator":[65],"provide":[67],"of":[70,102,108,142,165,172,194],"the":[71,78,82,100,103,105,126,163,177,183,186],"SAR-ADC.":[72],"calibrates":[77],"using":[81,116,176],"learning":[84],"algorithm":[85],"on":[86],"external":[88],"PC":[89],"without":[90],"additional":[91],"power":[92],"dissipation":[93],"at":[94,156,168],"node.":[97],"Due":[98,181],"flexibility":[101],"system,":[104],"design":[106,146],"complexity":[107],"can":[112],"be":[113],"relaxed":[114],"these":[117],"techniques.":[118,180],"target":[120,127],"resolution":[121],"18":[123],"bits,":[124],"bandwidth":[128],"(without":[129],"digital":[130],"low-pass":[131],"filter)":[132],"about":[134],"5":[135],"kHz":[136,174],"deal":[138],"several":[140],"types":[141],"biopotential":[143],"signals.":[144],"fabricated":[148,160],"in":[149],"130-nm":[151],"CMOS":[152],"process":[153],"operates":[155],"1.2-V":[157],"supply.":[158],"achieves":[162],"SNDR":[164],"88":[166],"dB":[167],"sampling":[170],"frequency":[171],"250":[173],"calibration":[179],"high-resolution":[184],"ADC,":[185],"input-referred":[187],"noise":[188],"2.52":[190],"\u03bcVrmswith":[191],"gain":[193],"28.5":[195],"dB.":[196]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}