{"id":"https://openalex.org/W2917663261","doi":"https://doi.org/10.1109/access.2019.2894863","title":"Weak Micro-Scratch Detection Based on Deep Convolutional Neural Network","display_name":"Weak Micro-Scratch Detection Based on Deep Convolutional Neural Network","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2917663261","doi":"https://doi.org/10.1109/access.2019.2894863","mag":"2917663261"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2894863","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2894863","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2019.2894863","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102958023","display_name":"Limei Song","orcid":"https://orcid.org/0000-0002-6659-381X"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tiangong University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Limei Song","raw_affiliation_strings":["Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China","ORCiD"],"raw_orcid":"https://orcid.org/0000-0002-6659-381X","affiliations":[{"raw_affiliation_string":"Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]},{"raw_affiliation_string":"ORCiD","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101337552","display_name":"Wen\u2010Wei Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tiangong University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenwei Lin","raw_affiliation_strings":["Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025094489","display_name":"Yangang Yang","orcid":"https://orcid.org/0000-0002-2005-2217"},"institutions":[{"id":"https://openalex.org/I133270356","display_name":"Tianjin University of Technology and Education","ror":"https://ror.org/035gwtk09","country_code":"CN","type":"education","lineage":["https://openalex.org/I133270356"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan-Gang Yang","raw_affiliation_strings":["National-Local Joint Engineering Laboratory of Intelligent Manufacturing Oriented Automobile Die & Mould, Tianjin University of Technology and Education, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National-Local Joint Engineering Laboratory of Intelligent Manufacturing Oriented Automobile Die & Mould, Tianjin University of Technology and Education, Tianjin, China","institution_ids":["https://openalex.org/I133270356"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047432144","display_name":"Xinjun Zhu","orcid":"https://orcid.org/0000-0003-0451-0377"},"institutions":[{"id":"https://openalex.org/I198091727","display_name":"Tiangong University","ror":"https://ror.org/00xsr9m91","country_code":"CN","type":"education","lineage":["https://openalex.org/I198091727"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinjun Zhu","raw_affiliation_strings":["Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Key Laboratory of Advanced Electrical Engineering and Energy Technology, Tianjin Polytechnic University, Tianjin, China","institution_ids":["https://openalex.org/I198091727"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047844850","display_name":"Qinghua Guo","orcid":"https://orcid.org/0000-0002-5180-7854"},"institutions":[{"id":"https://openalex.org/I204824540","display_name":"University of Wollongong","ror":"https://ror.org/00jtmb277","country_code":"AU","type":"education","lineage":["https://openalex.org/I204824540"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Qinghua Guo","raw_affiliation_strings":["School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW, Australia","ORCiD"],"raw_orcid":"https://orcid.org/0000-0002-5180-7854","affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW, Australia","institution_ids":["https://openalex.org/I204824540"]},{"raw_affiliation_string":"ORCiD","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059212645","display_name":"Jiangtao Xi","orcid":"https://orcid.org/0000-0002-5550-1975"},"institutions":[{"id":"https://openalex.org/I204824540","display_name":"University of Wollongong","ror":"https://ror.org/00jtmb277","country_code":"AU","type":"education","lineage":["https://openalex.org/I204824540"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Jiangtao Xi","raw_affiliation_strings":["School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW, Australia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Computer and Telecommunications Engineering, University of Wollongong, Wollongong, NSW, Australia","institution_ids":["https://openalex.org/I204824540"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":7.8907,"has_fulltext":false,"cited_by_count":61,"citation_normalized_percentile":{"value":0.97516009,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"7","issue":null,"first_page":"27547","last_page":"27554"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scratch","display_name":"Scratch","score":0.9539064168930054},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.741705060005188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7397186756134033},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7214328050613403},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.692070722579956},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5929515957832336},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5897082686424255},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.5321383476257324},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49553120136260986},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4667147994041443},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.45210573077201843},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4381791651248932},{"id":"https://openalex.org/keywords/connected-component","display_name":"Connected component","score":0.43592873215675354},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.24862167239189148}],"concepts":[{"id":"https://openalex.org/C2781235140","wikidata":"https://www.wikidata.org/wiki/Q275131","display_name":"Scratch","level":2,"score":0.9539064168930054},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.741705060005188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7397186756134033},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7214328050613403},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.692070722579956},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5929515957832336},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5897082686424255},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.5321383476257324},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49553120136260986},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4667147994041443},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.45210573077201843},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4381791651248932},{"id":"https://openalex.org/C193435613","wikidata":"https://www.wikidata.org/wiki/Q2997928","display_name":"Connected component","level":2,"score":0.43592873215675354},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.24862167239189148},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/access.2019.2894863","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2894863","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:ro.uow.edu.au:eispapers1-3544","is_oa":false,"landing_page_url":"https://ro.uow.edu.au/eispapers1/2535","pdf_url":null,"source":{"id":"https://openalex.org/S4306400510","display_name":"Research Online (University of Wollongong)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I204824540","host_organization_name":"University of Wollongong","host_organization_lineage":["https://openalex.org/I204824540"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty of Engineering and Information Sciences - Papers: Part B","raw_type":"article"},{"id":"pmh:oai:doaj.org/article:51444b19c02145549bcddbe75b5f8645","is_oa":true,"landing_page_url":"https://doaj.org/article/51444b19c02145549bcddbe75b5f8645","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 27547-27554 (2019)","raw_type":"article"},{"id":"pmh:oai:figshare.com:article/27755184","is_oa":true,"landing_page_url":"https://figshare.com/articles/journal_contribution/Weak_Micro-Scratch_Detection_Based_on_Deep_Convolutional_Neural_Network/27755184","pdf_url":null,"source":{"id":"https://openalex.org/S4377196282","display_name":"Figshare","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210132348","host_organization_name":"Figshare (United Kingdom)","host_organization_lineage":["https://openalex.org/I4210132348"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2894863","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2894863","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2320230973","display_name":null,"funder_award_id":"51806150","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G23471141","display_name":null,"funder_award_id":"18JCQNJC04400","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G4774465143","display_name":null,"funder_award_id":"PIL1603","funder_id":"https://openalex.org/F4320326931","funder_display_name":"State Key Laboratory of Precision Measurement Technology and Instruments"},{"id":"https://openalex.org/G6040942093","display_name":null,"funder_award_id":"61078041","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6304497010","display_name":null,"funder_award_id":"16JCYBJC15400","funder_id":"https://openalex.org/F4320323993","funder_display_name":"Natural Science Foundation of Tianjin City"},{"id":"https://openalex.org/G8075146587","display_name":null,"funder_award_id":"TD13-5036","funder_id":"https://openalex.org/F4320322701","funder_display_name":"Tianjin University"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322701","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32"},{"id":"https://openalex.org/F4320323993","display_name":"Natural Science Foundation of Tianjin City","ror":null},{"id":"https://openalex.org/F4320326931","display_name":"State Key Laboratory of Precision Measurement Technology and Instruments","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W41983046","https://openalex.org/W1501555392","https://openalex.org/W1522301498","https://openalex.org/W1588614809","https://openalex.org/W1677182931","https://openalex.org/W1849277567","https://openalex.org/W1901129140","https://openalex.org/W1981759979","https://openalex.org/W2038820696","https://openalex.org/W2039367092","https://openalex.org/W2068833499","https://openalex.org/W2091806358","https://openalex.org/W2138205176","https://openalex.org/W2343086726","https://openalex.org/W2395611524","https://openalex.org/W2508741746","https://openalex.org/W2553890187","https://openalex.org/W2598457882","https://openalex.org/W2766021674","https://openalex.org/W2771862771","https://openalex.org/W2797907131","https://openalex.org/W4230338665","https://openalex.org/W6601744832","https://openalex.org/W6745366285"],"related_works":["https://openalex.org/W138221400","https://openalex.org/W4317671434","https://openalex.org/W2922872563","https://openalex.org/W2549418288","https://openalex.org/W2739092184","https://openalex.org/W2740804836","https://openalex.org/W1691631808","https://openalex.org/W1586320973","https://openalex.org/W4206639983","https://openalex.org/W2376291383"],"abstract_inverted_index":{"Metal":[0],"component":[1,17,59],"surfaces":[2,60],"are":[3,9,19,83],"random":[4],"textured":[5],"and":[6,36,80,89],"non-smooth.":[7],"There":[8],"many":[10],"stains":[11],"on":[12,57,62,101],"the":[13,22,26,78,86,92,102,108,113,120,128],"surface":[14],"of":[15,25,91,104,115],"metal":[16,58],"that":[18,127],"similar":[20],"to":[21],"gray":[23,32],"scale":[24],"scratches.":[27],"The":[28,123],"scratches":[29,56,79],"have":[30],"non-uniform":[31],"distribution,":[33],"various":[34],"shapes,":[35],"low":[37],"contrast":[38],"in":[39,44,112],"their":[40],"background,":[41],"posing":[42],"challenges":[43],"accurate":[45,139],"scratch":[46,75,109,140],"detection.":[47,141],"This":[48],"paper":[49],"presents":[50],"a":[51,69],"method":[52,130],"for":[53],"detecting":[54],"weak":[55],"based":[61,100],"deep":[63],"convolutional":[64],"neural":[65],"networks":[66],"(DCNNs).":[67],"First,":[68],"DCNN":[70],"is":[71,117],"trained":[72,87],"using":[73],"labeled":[74],"images.":[76],"Then,":[77],"some":[81],"faults":[82,93],"detected":[84],"by":[85,119],"DCNN,":[88],"most":[90],"can":[94,131],"be":[95],"removed":[96],"through":[97],"properly":[98],"thresholding":[99],"size":[103],"connected":[105],"regions.":[106],"Finally,":[107],"length":[110],"united":[111],"number":[114],"pixels":[116],"obtained":[118],"skeleton":[121],"extraction.":[122],"experimental":[124],"results":[125],"show":[126],"proposed":[129],"effectively":[132],"deal":[133],"with":[134],"background":[135],"noise,":[136],"thereby":[137],"achieving":[138]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":16},{"year":2021,"cited_by_count":10},{"year":2020,"cited_by_count":10},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}