{"id":"https://openalex.org/W2909940080","doi":"https://doi.org/10.1109/access.2019.2892143","title":"A New Evaluation Method of Aging Properties for Silicon Rubber Material Based on Microscopic Images","display_name":"A New Evaluation Method of Aging Properties for Silicon Rubber Material Based on Microscopic Images","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2909940080","doi":"https://doi.org/10.1109/access.2019.2892143","mag":"2909940080"},"language":"en","primary_location":{"id":"doi:10.1109/access.2019.2892143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2892143","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08610184.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08610184.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029518724","display_name":"Xinhan Qiao","orcid":"https://orcid.org/0000-0001-7544-8721"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinhan Qiao","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University, Chongqing, China"],"raw_orcid":"https://orcid.org/0000-0001-7544-8721","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089035307","display_name":"Zhijin Zhang","orcid":"https://orcid.org/0000-0001-8893-2264"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhijin Zhang","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029797648","display_name":"Xingliang Jiang","orcid":"https://orcid.org/0000-0002-3567-6559"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingliang Jiang","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004237712","display_name":"Xun Li","orcid":"https://orcid.org/0000-0003-1926-616X"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xun Li","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013882519","display_name":"Yushen He","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yushen He","raw_affiliation_strings":["School of Electrical Engineering, Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.9757,"has_fulltext":true,"cited_by_count":19,"citation_normalized_percentile":{"value":0.71465421,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"15162","last_page":"15169"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9767000079154968,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9746000170707703,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicone-rubber","display_name":"Silicone rubber","score":0.5991693139076233},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5153364539146423},{"id":"https://openalex.org/keywords/natural-rubber","display_name":"Natural rubber","score":0.500964879989624},{"id":"https://openalex.org/keywords/composite-number","display_name":"Composite number","score":0.44845056533813477},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.44245415925979614},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37435394525527954},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36282438039779663},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3602665960788727},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34135669469833374},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.31587696075439453},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2204194962978363},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.14355334639549255}],"concepts":[{"id":"https://openalex.org/C2776290925","wikidata":"https://www.wikidata.org/wiki/Q4115245","display_name":"Silicone rubber","level":2,"score":0.5991693139076233},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5153364539146423},{"id":"https://openalex.org/C176933379","wikidata":"https://www.wikidata.org/wiki/Q131877","display_name":"Natural rubber","level":2,"score":0.500964879989624},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.44845056533813477},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.44245415925979614},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37435394525527954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36282438039779663},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3602665960788727},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34135669469833374},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.31587696075439453},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2204194962978363},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.14355334639549255}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2019.2892143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2892143","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08610184.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:d5f5a88ddb7d4c59b6abe2c85c0ff554","is_oa":true,"landing_page_url":"https://doaj.org/article/d5f5a88ddb7d4c59b6abe2c85c0ff554","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 15162-15169 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2019.2892143","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2019.2892143","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08610184.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.550000011920929,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[{"id":"https://openalex.org/G2099249106","display_name":null,"funder_award_id":"2018CDYJSY0055","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G8612179943","display_name":null,"funder_award_id":"2016YFB0900904","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2909940080.pdf","grobid_xml":"https://content.openalex.org/works/W2909940080.grobid-xml"},"referenced_works_count":20,"referenced_works":["https://openalex.org/W1976996988","https://openalex.org/W1991761370","https://openalex.org/W1991882476","https://openalex.org/W1994553052","https://openalex.org/W2048117136","https://openalex.org/W2076844448","https://openalex.org/W2078646924","https://openalex.org/W2081337631","https://openalex.org/W2095301240","https://openalex.org/W2118405473","https://openalex.org/W2123209316","https://openalex.org/W2164792861","https://openalex.org/W2165380487","https://openalex.org/W2377895907","https://openalex.org/W2507903171","https://openalex.org/W2554784837","https://openalex.org/W2758832906","https://openalex.org/W2770583198","https://openalex.org/W2801893026","https://openalex.org/W2898056919"],"related_works":["https://openalex.org/W2109252598","https://openalex.org/W886882817","https://openalex.org/W1512878983","https://openalex.org/W2326594127","https://openalex.org/W4290989699","https://openalex.org/W4255766185","https://openalex.org/W1520120059","https://openalex.org/W2354793777","https://openalex.org/W2789938994","https://openalex.org/W1990120177"],"abstract_inverted_index":{"In":[0],"recent":[1],"years,":[2],"composite":[3,49,160,189],"insulators":[4,50,161,190],"have":[5],"been":[6],"widely":[7],"applied":[8],"in":[9,34,93,140,191],"transmission":[10],"lines;":[11],"however,":[12],"deterioration":[13],"of":[14,45,103,127,143,157,188,201,210],"insulation":[15],"properties":[16,44,102],"caused":[17],"by":[18,62,73,121,135],"aging":[19,43,101,154],"may":[20],"cause":[21],"power":[22],"supply\u2019s":[23],"large-scale":[24],"outage":[25],"and":[26,66,75],"badly":[27],"impact":[28],"the":[29,77,82,86,108,138,141,170,192,197],"social":[30],"economy":[31],"development.":[32],"Therefore,":[33],"this":[35,202,211],"paper,":[36],"an":[37,168],"entirely":[38],"new":[39],"method":[40],"for":[41,48,110],"evaluating":[42],"silicon":[46,104],"rubber":[47,105,113,159],"based":[51],"on":[52],"microscopic":[53,58],"images":[54,59],"was":[55,71,162,194],"proposed.":[56],"The":[57,125],"were":[60,91,123,204,213],"collected":[61],"portable":[63],"digital":[64],"microscope-B011,":[65],"defective":[67,78],"area":[68,79,193],"proportion":[69],"(k)":[70],"extracted":[72],"calculating":[74,111],"comparing":[76],"pixel":[80],"with":[81,137],"background":[83],"pixel.":[84],"Thus,":[85],"salt":[87],"fog":[88],"flashover":[89,114],"experiments":[90],"conducted":[92],"a":[94,152,165],"multifunction":[95],"artificial":[96],"climate":[97],"chamber":[98],"to":[99],"indicate":[100],"material;":[106],"then,":[107],"equations":[109],"silicone":[112,158],"voltage":[115],"(U":[116],"<sub":[117,129],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[118,130,145,174,181],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">50</sub>":[119,131],")":[120,186],"k":[122],"established.":[124],"value":[126,142,187],"U":[128],"can":[132],"even":[133],"decrease":[134],"57.3%":[136],"increase":[139],"<inline-formula":[144,173,180],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[146,175,182],"<tex-math":[147,176,183],"notation=\"LaTeX\">${k}$":[148,177],"</tex-math></inline-formula>":[149,178,185],".":[150],"Moreover,":[151],"complete":[153],"evaluation":[155],"procedure":[156],"obtained.":[163,195],"Taking":[164],"city":[166],"as":[167],"example,":[169],"critical":[171],"failure":[172],"(":[179],"notation=\"LaTeX\">$k1=19.6$":[184],"Finally,":[196],"future":[198,207],"research":[199],"directions":[200],"paper":[203,212],"clarified;":[205],"besides,":[206],"usage":[208],"scenarios":[209],"clearly":[214],"displayed.":[215]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}