{"id":"https://openalex.org/W2907960408","doi":"https://doi.org/10.1109/access.2018.2887252","title":"A Reliability Prediction Methodology for LED Arrays","display_name":"A Reliability Prediction Methodology for LED Arrays","publication_year":2019,"publication_date":"2019-01-01","ids":{"openalex":"https://openalex.org/W2907960408","doi":"https://doi.org/10.1109/access.2018.2887252","mag":"2907960408"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2887252","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2887252","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08600302.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08600302.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046510278","display_name":"Bo Sun","orcid":"https://orcid.org/0000-0002-8993-2300"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Bo Sun","raw_affiliation_strings":["Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066887582","display_name":"Jiajie Fan","orcid":"https://orcid.org/0000-0001-5400-737X"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiajie Fan","raw_affiliation_strings":["College of Mechanical and Electrical Engineering, Hohai University, Changzhou, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electrical Engineering, Hohai University, Changzhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090264841","display_name":"Xuejun Fan","orcid":"https://orcid.org/0000-0003-0525-4424"},"institutions":[{"id":"https://openalex.org/I177898655","display_name":"Lamar University","ror":"https://ror.org/008ms5s18","country_code":"US","type":"education","lineage":["https://openalex.org/I177898655"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xuejun Fan","raw_affiliation_strings":["Department of Mechanical Engineering, Lamar University, Beaumont, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Lamar University, Beaumont, TX, USA","institution_ids":["https://openalex.org/I177898655"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000424567","display_name":"Guoqi Zhang","orcid":"https://orcid.org/0000-0002-8023-5170"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["CN","NL"],"is_corresponding":false,"raw_author_name":"Guoqi Zhang","raw_affiliation_strings":["Department of Microelectronics, Delft University of Technology, Delft, CD, The Netherlands","Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025421688","display_name":"Guohao Zhang","orcid":"https://orcid.org/0000-0003-2088-458X"},"institutions":[{"id":"https://openalex.org/I139024713","display_name":"Guangdong University of Technology","ror":"https://ror.org/04azbjn80","country_code":"CN","type":"education","lineage":["https://openalex.org/I139024713"]},{"id":"https://openalex.org/I98358874","display_name":"Delft University of Technology","ror":"https://ror.org/02e2c7k09","country_code":"NL","type":"education","lineage":["https://openalex.org/I98358874"]}],"countries":["CN","NL"],"is_corresponding":false,"raw_author_name":"Guohao Zhang","raw_affiliation_strings":["Department of Microelectronics, Delft University of Technology, Delft, CD, The Netherlands","Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China"],"affiliations":[{"raw_affiliation_string":"Department of Microelectronics, Delft University of Technology, Delft, CD, The Netherlands","institution_ids":["https://openalex.org/I98358874"]},{"raw_affiliation_string":"Faculty of Information Engineering, Guangdong University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I139024713"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5046510278"],"corresponding_institution_ids":["https://openalex.org/I139024713"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.5313,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.63380042,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"7","issue":null,"first_page":"8127","last_page":"8134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13869","display_name":"Ocular and Laser Science Research","score":0.9861000180244446,"subfield":{"id":"https://openalex.org/subfields/2731","display_name":"Ophthalmology"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7629737854003906},{"id":"https://openalex.org/keywords/current-crowding","display_name":"Current crowding","score":0.7464847564697266},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.7257344126701355},{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.6972327828407288},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.5003578662872314},{"id":"https://openalex.org/keywords/radiative-transfer","display_name":"Radiative transfer","score":0.4746024012565613},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47293782234191895},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46532389521598816},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4424779415130615},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36452925205230713},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33452683687210083},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19945675134658813},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19386237859725952},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.17672500014305115},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.14651140570640564},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.13244810700416565},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11630776524543762},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.09007635712623596}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7629737854003906},{"id":"https://openalex.org/C115900370","wikidata":"https://www.wikidata.org/wiki/Q5195096","display_name":"Current crowding","level":3,"score":0.7464847564697266},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.7257344126701355},{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.6972327828407288},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.5003578662872314},{"id":"https://openalex.org/C74902906","wikidata":"https://www.wikidata.org/wiki/Q1190858","display_name":"Radiative transfer","level":2,"score":0.4746024012565613},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47293782234191895},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46532389521598816},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4424779415130615},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36452925205230713},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33452683687210083},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19945675134658813},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19386237859725952},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17672500014305115},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.14651140570640564},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.13244810700416565},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11630776524543762},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.09007635712623596},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2018.2887252","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2887252","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08600302.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:322f7b7218b946bba38d2ea306bc1ff9","is_oa":true,"landing_page_url":"https://doaj.org/article/322f7b7218b946bba38d2ea306bc1ff9","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 8127-8134 (2019)","raw_type":"article"},{"id":"pmh:oai:tudelft.nl:uuid:76847a92-d407-4a8e-b26d-4660282134a5","is_oa":false,"landing_page_url":"http://resolver.tudelft.nl/uuid:76847a92-d407-4a8e-b26d-4660282134a5","pdf_url":null,"source":{"id":"https://openalex.org/S4306400906","display_name":"Research Repository (Delft University of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98358874","host_organization_name":"Delft University of Technology","host_organization_lineage":["https://openalex.org/I98358874"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"journal article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2887252","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2887252","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08600302.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2907960408.pdf","grobid_xml":"https://content.openalex.org/works/W2907960408.grobid-xml"},"referenced_works_count":38,"referenced_works":["https://openalex.org/W1615636903","https://openalex.org/W1625767807","https://openalex.org/W1671790935","https://openalex.org/W1947742708","https://openalex.org/W1972322692","https://openalex.org/W2007393355","https://openalex.org/W2046469510","https://openalex.org/W2076823813","https://openalex.org/W2109430593","https://openalex.org/W2139778164","https://openalex.org/W2156908687","https://openalex.org/W2168480664","https://openalex.org/W2185971143","https://openalex.org/W2218913661","https://openalex.org/W2284156354","https://openalex.org/W2290998982","https://openalex.org/W2328151902","https://openalex.org/W2407238535","https://openalex.org/W2532876924","https://openalex.org/W2537417286","https://openalex.org/W2554721383","https://openalex.org/W2571127745","https://openalex.org/W2586991091","https://openalex.org/W2599037095","https://openalex.org/W2609875503","https://openalex.org/W2613561642","https://openalex.org/W2626964509","https://openalex.org/W2640845112","https://openalex.org/W2709178763","https://openalex.org/W2734564978","https://openalex.org/W2735803435","https://openalex.org/W2739029595","https://openalex.org/W2743793832","https://openalex.org/W2761070841","https://openalex.org/W2767073904","https://openalex.org/W2807693452","https://openalex.org/W6684335175","https://openalex.org/W6739914487"],"related_works":["https://openalex.org/W2746508069","https://openalex.org/W3145334830","https://openalex.org/W3022703765","https://openalex.org/W2248542681","https://openalex.org/W4324394781","https://openalex.org/W2114319425","https://openalex.org/W2101599727","https://openalex.org/W3136966974","https://openalex.org/W2093204556","https://openalex.org/W2410524058"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,80,102],"physics":[4],"of":[5,18,28,33,45,62,75,99,109,121,128],"failure-based":[6],"prediction":[7,85,91],"method":[8,86],"is":[9,55,94],"combined":[10],"with":[11],"statistical":[12],"models":[13,32],"to":[14,37,57,125],"consider":[15],"the":[16,26,39,43,59,67,88,97,126],"impact":[17,104],"current":[19,22,46,49],"crowding":[20,47],"and":[21,48,70,118],"droop":[23],"effects":[24],"on":[25,105],"reliability":[27,90,127],"LED":[29,110,130],"arrays.":[30,111],"Electronic-thermal":[31],"LEDs":[34,76,100,122],"are":[35,123],"utilized":[36],"obtain":[38],"operation":[40],"conditions":[41],"under":[42],"influences":[44],"droop.":[50],"A":[51],"Markov":[52],"chain-based":[53],"model":[54],"used":[56],"calculate":[58],"probability":[60],"distribution":[61],"each":[63],"failure":[64],"mode,":[65],"including":[66],"lumen":[68],"decay":[69],"catastrophic":[71],"failure.":[72],"Two":[73],"types":[74],"were":[77],"selected":[78],"for":[79],"numerical":[81],"study.":[82],"The":[83,112],"proposed":[84],"provides":[87],"realistic":[89],"results.":[92],"It":[93],"found":[95],"that":[96],"properties":[98],"have":[101],"great":[103],"their":[106],"hazard":[107],"rates":[108],"equivalent":[113],"resistance,":[114],"third-order":[115],"non-radiative":[116],"coefficient,":[117],"radiative":[119],"coefficient":[120],"critical":[124],"an":[129],"array.":[131]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}