{"id":"https://openalex.org/W2905003108","doi":"https://doi.org/10.1109/access.2018.2885566","title":"Coupling Scattering Characteristic Analysis of Dihedral Corner Reflectors in SAR Images","display_name":"Coupling Scattering Characteristic Analysis of Dihedral Corner Reflectors in SAR Images","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2905003108","doi":"https://doi.org/10.1109/access.2018.2885566","mag":"2905003108"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2885566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2885566","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2885566","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057628847","display_name":"Zhiming Xu","orcid":"https://orcid.org/0000-0002-3306-8023"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiming Xu","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-3306-8023","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052846731","display_name":"Xiaofeng Ai","orcid":"https://orcid.org/0000-0002-5080-8126"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofeng Ai","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040851193","display_name":"Qihua Wu","orcid":"https://orcid.org/0000-0002-9998-2301"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qihua Wu","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-9998-2301","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039451244","display_name":"Feng Zhao","orcid":"https://orcid.org/0000-0003-1275-3352"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Zhao","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113575088","display_name":"Shunping Xiao","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shunping Xiao","raw_affiliation_strings":["State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Complex Electromagnetic Environmental Effects on Electronics and Information System, National University of Defense Technology, Changsha, China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":10.2995,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.97758697,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"6","issue":null,"first_page":"78918","last_page":"78930"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.8131954073905945},{"id":"https://openalex.org/keywords/dihedral-angle","display_name":"Dihedral angle","score":0.7405895590782166},{"id":"https://openalex.org/keywords/polygon","display_name":"Polygon (computer graphics)","score":0.5996431112289429},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.500342845916748},{"id":"https://openalex.org/keywords/radar-cross-section","display_name":"Radar cross-section","score":0.4989013671875},{"id":"https://openalex.org/keywords/bistatic-radar","display_name":"Bistatic radar","score":0.48954638838768005},{"id":"https://openalex.org/keywords/ray-tracing","display_name":"Ray tracing (physics)","score":0.4868592619895935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4772058427333832},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4412086009979248},{"id":"https://openalex.org/keywords/coupling","display_name":"Coupling (piping)","score":0.4150416851043701},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.41253986954689026},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.3741265833377838},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2562501132488251},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.24042090773582458},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11946341395378113},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.08768215775489807}],"concepts":[{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.8131954073905945},{"id":"https://openalex.org/C89025888","wikidata":"https://www.wikidata.org/wiki/Q911907","display_name":"Dihedral angle","level":4,"score":0.7405895590782166},{"id":"https://openalex.org/C190694206","wikidata":"https://www.wikidata.org/wiki/Q3276654","display_name":"Polygon (computer graphics)","level":3,"score":0.5996431112289429},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.500342845916748},{"id":"https://openalex.org/C101457746","wikidata":"https://www.wikidata.org/wiki/Q560430","display_name":"Radar cross-section","level":3,"score":0.4989013671875},{"id":"https://openalex.org/C100102862","wikidata":"https://www.wikidata.org/wiki/Q2625855","display_name":"Bistatic radar","level":4,"score":0.48954638838768005},{"id":"https://openalex.org/C121483023","wikidata":"https://www.wikidata.org/wiki/Q7298343","display_name":"Ray tracing (physics)","level":2,"score":0.4868592619895935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4772058427333832},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4412086009979248},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.4150416851043701},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.41253986954689026},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.3741265833377838},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2562501132488251},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.24042090773582458},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11946341395378113},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.08768215775489807},{"id":"https://openalex.org/C32909587","wikidata":"https://www.wikidata.org/wiki/Q11369","display_name":"Molecule","level":2,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C112887158","wikidata":"https://www.wikidata.org/wiki/Q169324","display_name":"Hydrogen bond","level":3,"score":0.0},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2885566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2885566","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:a4af8cb632c14be586eef6787cf31fee","is_oa":true,"landing_page_url":"https://doaj.org/article/a4af8cb632c14be586eef6787cf31fee","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 78918-78930 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2885566","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2885566","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5172308061","display_name":null,"funder_award_id":"61401491","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320324150","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1993841292","https://openalex.org/W1999549883","https://openalex.org/W2001237481","https://openalex.org/W2010061123","https://openalex.org/W2013203016","https://openalex.org/W2025979838","https://openalex.org/W2036742718","https://openalex.org/W2039156452","https://openalex.org/W2044938591","https://openalex.org/W2051894141","https://openalex.org/W2059761475","https://openalex.org/W2074418104","https://openalex.org/W2075612852","https://openalex.org/W2078861403","https://openalex.org/W2106777535","https://openalex.org/W2110222410","https://openalex.org/W2118198126","https://openalex.org/W2125689878","https://openalex.org/W2125856058","https://openalex.org/W2126458555","https://openalex.org/W2129035491","https://openalex.org/W2130168723","https://openalex.org/W2131038988","https://openalex.org/W2140325252","https://openalex.org/W2142179688","https://openalex.org/W2148105205","https://openalex.org/W2158672843","https://openalex.org/W2283642922","https://openalex.org/W2328473904","https://openalex.org/W2399062725","https://openalex.org/W2407940913","https://openalex.org/W2596473454","https://openalex.org/W2604973793","https://openalex.org/W2771429811","https://openalex.org/W2775614051","https://openalex.org/W2780161630"],"related_works":["https://openalex.org/W2358496650","https://openalex.org/W2054498806","https://openalex.org/W1577762516","https://openalex.org/W2359212910","https://openalex.org/W2373103466","https://openalex.org/W2749793405","https://openalex.org/W2364199393","https://openalex.org/W2131863848","https://openalex.org/W2292592769","https://openalex.org/W2909443172"],"abstract_inverted_index":{"The":[0],"scattering":[1,17,31,43,54,66],"mechanisms":[2],"of":[3,19,33,45,63,68,74,94,102],"dihedral":[4,20,34,69],"corner":[5],"reflectors":[6],"have":[7],"attracted":[8],"great":[9],"attention":[10],"in":[11,38,76],"the":[12,16,29,42,52,64,72,77,85,100,107,114],"past":[13],"decades.":[14],"However,":[15],"centers":[18],"corners":[21,35,70],"are":[22,81],"not":[23],"discussed":[24],"systematically.":[25],"In":[26],"this":[27],"paper,":[28],"multi-bouncing":[30,65],"mechanism":[32,67],"is":[36,57],"analyzed":[37],"detail":[39],"based":[40,83],"on":[41,84],"characteristics":[44],"polygon":[46],"plates":[47],"and":[48,71,97],"ray-tracing":[49],"technique.":[50],"Furthermore,":[51],"coupling":[53],"center":[55],"(CSC)":[56],"proposed":[58],"as":[59],"a":[60,91],"detailed":[61],"explanation":[62],"locations":[73],"CSCs":[75,89],"high-resolution":[78],"range":[79],"profile":[80],"deduced":[82],"monostatic-and-bistatic":[86],"equivalence":[87],"theorem.":[88],"give":[90],"precise":[92],"description":[93],"target":[95,104],"structures":[96],"can":[98],"improve":[99],"ability":[101],"radar":[103],"recognition.":[105],"Finally,":[106],"simulation":[108],"results":[109],"via":[110],"electromagnetic":[111],"computation":[112],"validate":[113],"theoretical":[115],"analysis.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}