{"id":"https://openalex.org/W2902438223","doi":"https://doi.org/10.1109/access.2018.2883757","title":"Multidirectional Alternating Current Potential Drop Technique for Detecting Random Cracks","display_name":"Multidirectional Alternating Current Potential Drop Technique for Detecting Random Cracks","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2902438223","doi":"https://doi.org/10.1109/access.2018.2883757","mag":"2902438223"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2883757","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883757","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2883757","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101634654","display_name":"Wenyang Li","orcid":"https://orcid.org/0000-0001-9499-7435"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenyang Li","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052623753","display_name":"Fangji Gan","orcid":"https://orcid.org/0000-0001-8902-7979"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangji Gan","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-8902-7979","affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101557697","display_name":"Shiping Zhao","orcid":"https://orcid.org/0000-0003-2623-4772"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiping Zhao","raw_affiliation_strings":["School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Manufacturing Science and Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101068169","display_name":"Yongjie Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I20616075","display_name":"Qinghai Normal University","ror":"https://ror.org/03az1t892","country_code":"CN","type":"education","lineage":["https://openalex.org/I20616075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongjie Zhou","raw_affiliation_strings":["College of Physics and Electronic Information Engineering, Qinghai Normal University, Xining, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Information Engineering, Qinghai Normal University, Xining, China","institution_ids":["https://openalex.org/I20616075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041708794","display_name":"Xiaoming He","orcid":"https://orcid.org/0000-0003-1270-4972"},"institutions":[{"id":"https://openalex.org/I20616075","display_name":"Qinghai Normal University","ror":"https://ror.org/03az1t892","country_code":"CN","type":"education","lineage":["https://openalex.org/I20616075"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoming He","raw_affiliation_strings":["College of Physics and Electronic Information Engineering, Qinghai Normal University, Xining, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Physics and Electronic Information Engineering, Qinghai Normal University, Xining, China","institution_ids":["https://openalex.org/I20616075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101634654"],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15920056,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":null,"first_page":"76640","last_page":"76645"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/alternating-current","display_name":"Alternating current","score":0.6810414791107178},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.6596056222915649},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.659165620803833},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6480940580368042},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5750131607055664},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5633087754249573},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.5268368124961853},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4251469373703003},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.25974732637405396},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20734179019927979},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2013341784477234},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11529466509819031},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10517460107803345},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07857310771942139}],"concepts":[{"id":"https://openalex.org/C2779876028","wikidata":"https://www.wikidata.org/wiki/Q124164","display_name":"Alternating current","level":3,"score":0.6810414791107178},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.6596056222915649},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.659165620803833},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6480940580368042},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5750131607055664},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5633087754249573},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.5268368124961853},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4251469373703003},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.25974732637405396},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20734179019927979},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2013341784477234},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11529466509819031},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10517460107803345},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07857310771942139},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2883757","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883757","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:0770f66cea9c43529aff24c5531a5e9e","is_oa":true,"landing_page_url":"https://doaj.org/article/0770f66cea9c43529aff24c5531a5e9e","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 76640-76645 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2883757","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883757","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/11"}],"awards":[{"id":"https://openalex.org/G4364082229","display_name":null,"funder_award_id":"2018-ZJ-719","funder_id":"https://openalex.org/F4320335921","funder_display_name":"Natural Science Foundation of Qinghai"},{"id":"https://openalex.org/G7631962256","display_name":null,"funder_award_id":"51704199","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335921","display_name":"Natural Science Foundation of Qinghai","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W95807821","https://openalex.org/W1995155450","https://openalex.org/W1995613111","https://openalex.org/W1999888988","https://openalex.org/W2026115219","https://openalex.org/W2030067919","https://openalex.org/W2051050894","https://openalex.org/W2053523918","https://openalex.org/W2056164724","https://openalex.org/W2059700575","https://openalex.org/W2063408995","https://openalex.org/W2073814469","https://openalex.org/W2077601032","https://openalex.org/W2078878178","https://openalex.org/W2087396598","https://openalex.org/W2090978039","https://openalex.org/W2107447022","https://openalex.org/W2126668598","https://openalex.org/W2130347632","https://openalex.org/W2143994665","https://openalex.org/W2150289924","https://openalex.org/W2165987654","https://openalex.org/W2201111096","https://openalex.org/W2229153327","https://openalex.org/W2336843754","https://openalex.org/W2386111625","https://openalex.org/W2516928568","https://openalex.org/W2801686159","https://openalex.org/W6603910935"],"related_works":["https://openalex.org/W1993639557","https://openalex.org/W4255837520","https://openalex.org/W2387011115","https://openalex.org/W307343826","https://openalex.org/W2363818268","https://openalex.org/W2085629680","https://openalex.org/W2018764485","https://openalex.org/W2742658476","https://openalex.org/W4241011668","https://openalex.org/W2319035808"],"abstract_inverted_index":{"The":[0],"alternating":[1,35],"current":[2,36],"potential":[3,37],"drop":[4,38],"technique":[5,22,71],"has":[6],"been":[7,29],"widely":[8],"used":[9],"to":[10,23,27,53],"measure":[11,74],"subsurface":[12],"cracks":[13,25],"in":[14],"metal":[15],"structures.":[16],"However,":[17],"the":[18,21,40,60,75],"application":[19],"of":[20,62,77],"random":[24,78],"has,":[26],"date,":[28],"limited.":[30],"By":[31],"using":[32],"a":[33],"multidirectional":[34],"technique,":[39],"angle":[41],"between":[42],"crack":[43],"and":[44,65],"exciting":[45],"electrode":[46],"wire":[47],"changes":[48],"from":[49],"0\u00b0":[50],"\u2013":[51,55],"90\u00b0":[52],"67.5\u00b0":[54],"90\u00b0,":[56],"which":[57],"considerably":[58],"expanded":[59],"ranges":[61],"detection.":[63],"Simulation":[64],"experiment":[66],"results":[67],"showed":[68],"that":[69],"this":[70],"can":[72],"accurately":[73],"depth":[76],"cracks.":[79]},"counts_by_year":[],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}