{"id":"https://openalex.org/W2902285182","doi":"https://doi.org/10.1109/access.2018.2883367","title":"A Far-Field Evaluation Method for Interfacial Defects Existed in Composite Insulators Based on Transient Thermal Wave","display_name":"A Far-Field Evaluation Method for Interfacial Defects Existed in Composite Insulators Based on Transient Thermal Wave","publication_year":2018,"publication_date":"2018-11-26","ids":{"openalex":"https://openalex.org/W2902285182","doi":"https://doi.org/10.1109/access.2018.2883367","mag":"2902285182"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2883367","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883367","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08543792.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08543792.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004683959","display_name":"Sida Zhang","orcid":"https://orcid.org/0000-0002-0692-2159"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Sida Zhang","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085615818","display_name":"Chenjun Guo","orcid":"https://orcid.org/0000-0003-4084-3611"},"institutions":[{"id":"https://openalex.org/I74872605","display_name":"China Southern Power Grid (China)","ror":"https://ror.org/03hkh9419","country_code":"CN","type":"company","lineage":["https://openalex.org/I74872605"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenjun Guo","raw_affiliation_strings":["Yunnan Electric Power Research Institute, China Southern Power Grid, Kunming, China"],"affiliations":[{"raw_affiliation_string":"Yunnan Electric Power Research Institute, China Southern Power Grid, Kunming, China","institution_ids":["https://openalex.org/I74872605"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100751573","display_name":"Li Cheng","orcid":"https://orcid.org/0000-0001-5441-0820"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Li Cheng","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063072073","display_name":"Hanqing Wang","orcid":"https://orcid.org/0000-0002-0032-6962"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hanqing Wang","raw_affiliation_strings":["State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5004683959"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2955,"has_fulltext":true,"cited_by_count":9,"citation_normalized_percentile":{"value":0.52619642,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"1920","last_page":"1926"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7090522050857544},{"id":"https://openalex.org/keywords/insulator","display_name":"Insulator (electricity)","score":0.5960954427719116},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5333096385002136},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5187999606132507},{"id":"https://openalex.org/keywords/composite-number","display_name":"Composite number","score":0.47887247800827026},{"id":"https://openalex.org/keywords/excitation","display_name":"Excitation","score":0.4456423819065094},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4410400092601776},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.4153140187263489},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.40923210978507996},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4025653004646301},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3901088833808899},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13918817043304443},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1391046643257141},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.13323402404785156}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7090522050857544},{"id":"https://openalex.org/C212702","wikidata":"https://www.wikidata.org/wiki/Q178150","display_name":"Insulator (electricity)","level":2,"score":0.5960954427719116},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5333096385002136},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5187999606132507},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.47887247800827026},{"id":"https://openalex.org/C83581075","wikidata":"https://www.wikidata.org/wiki/Q1361503","display_name":"Excitation","level":2,"score":0.4456423819065094},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4410400092601776},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.4153140187263489},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.40923210978507996},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4025653004646301},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3901088833808899},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13918817043304443},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1391046643257141},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.13323402404785156},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2883367","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883367","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08543792.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:744f61ba3baf45ba91fa6040f30f1975","is_oa":true,"landing_page_url":"https://doaj.org/article/744f61ba3baf45ba91fa6040f30f1975","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 1920-1926 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2883367","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2883367","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08543792.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1121271761","display_name":null,"funder_award_id":"Program","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G1231421488","display_name":null,"funder_award_id":"under","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2087396116","display_name":null,"funder_award_id":"China","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G3317480652","display_name":null,"funder_award_id":"Science","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G391238517","display_name":null,"funder_award_id":", and","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G448817908","display_name":null,"funder_award_id":"cstc2017jcyjAX0460","funder_id":"https://openalex.org/F4320327865","funder_display_name":"Chongqing Research Program of Basic Research and Frontier Technology"},{"id":"https://openalex.org/G5939423041","display_name":null,"funder_award_id":"Technology","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5994120800","display_name":null,"funder_award_id":"Natural","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7125317289","display_name":null,"funder_award_id":"51707020","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327865","display_name":"Chongqing Research Program of Basic Research and Frontier Technology","ror":null}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2902285182.pdf","grobid_xml":"https://content.openalex.org/works/W2902285182.grobid-xml"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W1986257700","https://openalex.org/W2000154892","https://openalex.org/W2020650091","https://openalex.org/W2021054960","https://openalex.org/W2067148018","https://openalex.org/W2097814102","https://openalex.org/W2155756201","https://openalex.org/W2293989912","https://openalex.org/W2347452860","https://openalex.org/W2509408167","https://openalex.org/W2510300816","https://openalex.org/W2572356575","https://openalex.org/W2575243978","https://openalex.org/W2593919736","https://openalex.org/W2743591661","https://openalex.org/W2768818842","https://openalex.org/W2793612255","https://openalex.org/W2795320462","https://openalex.org/W2807888105","https://openalex.org/W2873535434","https://openalex.org/W6742307915"],"related_works":["https://openalex.org/W2358137648","https://openalex.org/W3128819368","https://openalex.org/W2259231220","https://openalex.org/W2364310969","https://openalex.org/W3170092502","https://openalex.org/W2373007135","https://openalex.org/W2130857934","https://openalex.org/W2389992906","https://openalex.org/W2354679221","https://openalex.org/W2367850739"],"abstract_inverted_index":{"The":[0,71,106,145,171],"interfacial":[1,101,207],"defect":[2,161],"of":[3,15,42,66,73,128,133],"composite":[4],"insulators":[5,16],"is":[6,9,23,165],"common,":[7],"which":[8,50,164,183],"majorly":[10],"responsible":[11],"for":[12,200],"the":[13,18,27,32,39,56,63,74,86,90,94,126,131,134,141,166,188,194,206],"fracture":[14],"after":[17],"acid":[19],"resistant":[20],"core":[21],"rod":[22],"used.":[24],"Based":[25],"on":[26,205],"active":[28],"infrared":[29],"detection":[30,59],"method,":[31],"far-field":[33],"evaluation":[34,203],"method":[35],"can":[36],"effectively":[37],"keep":[38],"operation":[40],"safety":[41],"transmission":[43],"lines":[44],"by":[45,55,115],"detecting":[46,172],"subtle":[47],"internal":[48],"defects":[49,102,107,208],"are":[51],"difficult":[52],"to":[53,124,180,187,193],"find":[54],"traditional":[57],"non-destructive":[58],"methods.":[60],"Above":[61],"all,":[62],"propagation":[64],"law":[65],"heat":[67],"has":[68,82,136,153,174,209],"been":[69,83,104,137,175,210],"studied.":[70],"difference":[72,146],"surface":[75],"temperature":[76],"between":[77,147],"defective":[78,148],"and":[79,96,150,158],"reference":[80,151],"area":[81,149,152],"calculated":[84],"when":[85],"thermal":[87,201],"excitation":[88],"meet":[89],"Dirac":[91],"function.":[92],"Second,":[93],"plate":[95,109],"short":[97],"insulator":[98],"samples":[99,110],"with":[100],"have":[103],"produced.":[105],"in":[108,120,140,162],"could":[111,168],"be":[112,169],"easily":[113],"distinguished":[114],"radiation":[116],"quantity":[117],"but":[118],"not":[119],"insulators.":[121],"In":[122],"order":[123],"increase":[125],"resolution":[127],"experimental":[129],"result,":[130],"derivate":[132],"data":[135],"further":[138],"processed":[139],"Logarithmic":[142],"coordinate":[143],"system.":[144],"approximately":[154],"enlarged":[155],"7":[156],"times":[157],"1":[159],"mm":[160],"insulators,":[163],"smallest,":[167],"distinguished.":[170],"distance":[173],"expanded":[176],"from":[177],"several":[178],"millimeters":[179],"50":[181],"centimeters":[182],"offers":[184],"a":[185,197],"possibility":[186],"online":[189],"application.":[190],"Finally,":[191],"according":[192],"test":[195],"results,":[196],"preliminary":[198],"standard":[199],"wave":[202],"focused":[204],"proposed.":[211]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-18T14:38:29.013473","created_date":"2025-10-10T00:00:00"}