{"id":"https://openalex.org/W2901104792","doi":"https://doi.org/10.1109/access.2018.2882801","title":"Gearbox Fault Diagnosis Based on a Novel Hybrid Feature Reduction Method","display_name":"Gearbox Fault Diagnosis Based on a Novel Hybrid Feature Reduction Method","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2901104792","doi":"https://doi.org/10.1109/access.2018.2882801","mag":"2901104792"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2882801","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2882801","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2882801","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100643681","display_name":"Yu Wang","orcid":"https://orcid.org/0000-0003-0854-6975"},"institutions":[{"id":"https://openalex.org/I145581781","display_name":"Chongqing Technology and Business University","ror":"https://ror.org/05hqf1284","country_code":"CN","type":"education","lineage":["https://openalex.org/I145581781"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yu Wang","raw_affiliation_strings":["National Research Base of Intelligent Manufacturing, Chongqing Technology and Business University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"National Research Base of Intelligent Manufacturing, Chongqing Technology and Business University, Chongqing, China","institution_ids":["https://openalex.org/I145581781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004009456","display_name":"Shuai Yang","orcid":"https://orcid.org/0000-0001-8015-1578"},"institutions":[{"id":"https://openalex.org/I145581781","display_name":"Chongqing Technology and Business University","ror":"https://ror.org/05hqf1284","country_code":"CN","type":"education","lineage":["https://openalex.org/I145581781"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Yang","raw_affiliation_strings":["National Research Base of Intelligent Manufacturing, Chongqing Technology and Business University, Chongqing, China"],"affiliations":[{"raw_affiliation_string":"National Research Base of Intelligent Manufacturing, Chongqing Technology and Business University, Chongqing, China","institution_ids":["https://openalex.org/I145581781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076471821","display_name":"Ren\u00e9\u2013Vinicio S\u00e1nchez","orcid":"https://orcid.org/0000-0003-0395-9228"},"institutions":[{"id":"https://openalex.org/I3132940433","display_name":"Politecnica Salesiana University","ror":"https://ror.org/00f11af73","country_code":"EC","type":"education","lineage":["https://openalex.org/I3132940433"]}],"countries":["EC"],"is_corresponding":false,"raw_author_name":"Rene Vinicio Sanchez","raw_affiliation_strings":["GIDTEC, Universidad Polit\u00e9cnica Salesiana, Cuenca, Ecuador"],"affiliations":[{"raw_affiliation_string":"GIDTEC, Universidad Polit\u00e9cnica Salesiana, Cuenca, Ecuador","institution_ids":["https://openalex.org/I3132940433"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100643681"],"corresponding_institution_ids":["https://openalex.org/I145581781"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":1.1036,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.79489185,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"6","issue":null,"first_page":"75813","last_page":"75823"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9860000014305115,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.9832000136375427,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9818999767303467,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.8600491285324097},{"id":"https://openalex.org/keywords/dimensionality-reduction","display_name":"Dimensionality reduction","score":0.8318861722946167},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.742484986782074},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6630579233169556},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6250323057174683},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.6157444715499878},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5921972990036011},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5693216919898987},{"id":"https://openalex.org/keywords/embedding","display_name":"Embedding","score":0.5283316373825073},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4935349225997925},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4533117115497589},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.4339803159236908}],"concepts":[{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.8600491285324097},{"id":"https://openalex.org/C70518039","wikidata":"https://www.wikidata.org/wiki/Q16000077","display_name":"Dimensionality reduction","level":2,"score":0.8318861722946167},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.742484986782074},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6630579233169556},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6250323057174683},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.6157444715499878},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5921972990036011},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5693216919898987},{"id":"https://openalex.org/C41608201","wikidata":"https://www.wikidata.org/wiki/Q980509","display_name":"Embedding","level":2,"score":0.5283316373825073},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4935349225997925},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4533117115497589},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.4339803159236908},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2882801","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2882801","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:fc4ce401529149bcab374a291dab8a9e","is_oa":true,"landing_page_url":"https://doaj.org/article/fc4ce401529149bcab374a291dab8a9e","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 75813-75823 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2882801","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2882801","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4362658372","display_name":null,"funder_award_id":"KJZH17123","funder_id":"https://openalex.org/F4320324805","funder_display_name":"Chongqing Municipal Education Commission"},{"id":"https://openalex.org/G8883608633","display_name":null,"funder_award_id":"KFJJ2017076","funder_id":"https://openalex.org/F4320322685","funder_display_name":"Chongqing Technology and Business University"}],"funders":[{"id":"https://openalex.org/F4320322685","display_name":"Chongqing Technology and Business University","ror":"https://ror.org/05hqf1284"},{"id":"https://openalex.org/F4320324805","display_name":"Chongqing Municipal Education Commission","ror":"https://ror.org/031nm5713"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1889820893","https://openalex.org/W1967904638","https://openalex.org/W1985706701","https://openalex.org/W1991519797","https://openalex.org/W1991723619","https://openalex.org/W2000086911","https://openalex.org/W2001141328","https://openalex.org/W2001903231","https://openalex.org/W2004023666","https://openalex.org/W2006392326","https://openalex.org/W2009700261","https://openalex.org/W2037210563","https://openalex.org/W2037220204","https://openalex.org/W2037300843","https://openalex.org/W2048716124","https://openalex.org/W2053186076","https://openalex.org/W2064736393","https://openalex.org/W2072177337","https://openalex.org/W2083612784","https://openalex.org/W2093598546","https://openalex.org/W2097308346","https://openalex.org/W2109531142","https://openalex.org/W2115954437","https://openalex.org/W2119821739","https://openalex.org/W2137570937","https://openalex.org/W2140915110","https://openalex.org/W2148760425","https://openalex.org/W2156761667","https://openalex.org/W2164071167","https://openalex.org/W2169304077","https://openalex.org/W2285897999","https://openalex.org/W2287029277","https://openalex.org/W2295315269","https://openalex.org/W2296077894","https://openalex.org/W2301005476","https://openalex.org/W2531456495","https://openalex.org/W2791036512","https://openalex.org/W2800599679","https://openalex.org/W2808691476","https://openalex.org/W2811038430","https://openalex.org/W2813864053","https://openalex.org/W3014771378","https://openalex.org/W4239510810","https://openalex.org/W6676189307"],"related_works":["https://openalex.org/W2081900870","https://openalex.org/W3176621072","https://openalex.org/W2037549926","https://openalex.org/W2345479200","https://openalex.org/W2183306018","https://openalex.org/W2397288865","https://openalex.org/W2849310602","https://openalex.org/W3006008237","https://openalex.org/W2994280181","https://openalex.org/W6057950"],"abstract_inverted_index":{"The":[0],"dimensionality":[1],"reduction":[2],"of":[3,20,51,73,117],"the":[4,18,41,48,52,70,78,85,90,92,102,115,118,122,136,143,148],"high-dimensional":[5,43],"feature":[6,95,104],"space":[7],"is":[8,37,82,96,105],"a":[9,26,66],"critical":[10],"part":[11],"for":[12,110,130],"data":[13],"preprocessing,":[14],"which":[15,62],"directly":[16],"affects":[17],"accuracy":[19],"fault":[21,87,111],"diagnosis.":[22,88],"In":[23,89],"this":[24],"paper,":[25],"novel":[27],"hybrid":[28],"algorithm":[29,138],"named":[30],"principal":[31,53],"component":[32,54],"locally":[33,58],"linear":[34,59],"embedding":[35,60],"(PCLLE)":[36],"introduced":[38,129],"to":[39,64],"compress":[40],"original":[42],"feature.":[44],"This":[45],"approach":[46],"combines":[47],"optimization":[49,71],"objectives":[50],"analysis":[55],"(PCA)":[56],"and":[57,75,125,151],"(LLE),":[61],"attempts":[63],"find":[65],"mapping":[67],"that":[68,135],"meets":[69],"goals":[72],"PCA":[74,124,150],"LLE":[76,126,152],"at":[77],"same":[79],"time.":[80],"It":[81],"applied":[83],"on":[84],"gearbox":[86],"experiment,":[91],"extracted":[93],"fault-sensitive":[94],"compressed":[97,103],"by":[98],"PCLLE":[99,137],"method.":[100,153],"Then,":[101],"embedded":[106],"with":[107,147],"five":[108],"classifiers":[109],"detection.":[112],"To":[113],"evaluate":[114],"performance":[116,141],"proposed":[119],"new":[120],"method,":[121],"traditional":[123,149],"methods":[127],"are":[128],"comparison.":[131],"Experimental":[132],"results":[133],"show":[134],"has":[139],"good":[140],"during":[142],"classification":[144],"process":[145],"compared":[146]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}