{"id":"https://openalex.org/W2901227701","doi":"https://doi.org/10.1109/access.2018.2881962","title":"Steel Surface Defect Classification Based on Discriminant Manifold Regularized Local Descriptor","display_name":"Steel Surface Defect Classification Based on Discriminant Manifold Regularized Local Descriptor","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2901227701","doi":"https://doi.org/10.1109/access.2018.2881962","mag":"2901227701"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2881962","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2881962","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2881962","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009910595","display_name":"Jiuliang Zhao","orcid":null},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiuliang Zhao","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031368188","display_name":"Yishu Peng","orcid":"https://orcid.org/0000-0003-3942-978X"},"institutions":[{"id":"https://openalex.org/I100286613","display_name":"Hunan Institute of Science and Technology","ror":"https://ror.org/044ysd349","country_code":"CN","type":"education","lineage":["https://openalex.org/I100286613"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yishu Peng","raw_affiliation_strings":["School of Mechanical Engineering, Hunan Institute of Science and Technology, Yueyang, China"],"raw_orcid":"https://orcid.org/0000-0003-3942-978X","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hunan Institute of Science and Technology, Yueyang, China","institution_ids":["https://openalex.org/I100286613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043667109","display_name":"Yunhui Yan","orcid":"https://orcid.org/0000-0001-7121-2367"},"institutions":[{"id":"https://openalex.org/I9224756","display_name":"Northeastern University","ror":"https://ror.org/03awzbc87","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunhui Yan","raw_affiliation_strings":["School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China","institution_ids":["https://openalex.org/I9224756"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5009910595"],"corresponding_institution_ids":["https://openalex.org/I9224756"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.5237,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.91123627,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"6","issue":null,"first_page":"71719","last_page":"71731"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9879999756813049,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9758999943733215,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7864184379577637},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.7438641786575317},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5546497106552124},{"id":"https://openalex.org/keywords/local-binary-patterns","display_name":"Local binary patterns","score":0.5500990152359009},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5321236252784729},{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.5283963084220886},{"id":"https://openalex.org/keywords/subspace-topology","display_name":"Subspace topology","score":0.5100610852241516},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.48548367619514465},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4760710597038269},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.47462594509124756},{"id":"https://openalex.org/keywords/discriminant","display_name":"Discriminant","score":0.4689464271068573},{"id":"https://openalex.org/keywords/image-texture","display_name":"Image texture","score":0.4501950740814209},{"id":"https://openalex.org/keywords/grayscale","display_name":"Grayscale","score":0.4460255205631256},{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.4406406283378601},{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.43310248851776123},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4320722818374634},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.41706767678260803},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.3743833899497986},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.3628208339214325},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.33083510398864746},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.10673126578330994}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7864184379577637},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.7438641786575317},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5546497106552124},{"id":"https://openalex.org/C87335442","wikidata":"https://www.wikidata.org/wiki/Q2494345","display_name":"Local binary patterns","level":4,"score":0.5500990152359009},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5321236252784729},{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.5283963084220886},{"id":"https://openalex.org/C32834561","wikidata":"https://www.wikidata.org/wiki/Q660730","display_name":"Subspace topology","level":2,"score":0.5100610852241516},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.48548367619514465},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4760710597038269},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.47462594509124756},{"id":"https://openalex.org/C78397625","wikidata":"https://www.wikidata.org/wiki/Q192487","display_name":"Discriminant","level":2,"score":0.4689464271068573},{"id":"https://openalex.org/C63099799","wikidata":"https://www.wikidata.org/wiki/Q17147001","display_name":"Image texture","level":4,"score":0.4501950740814209},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.4460255205631256},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.4406406283378601},{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.43310248851776123},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4320722818374634},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.41706767678260803},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.3743833899497986},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.3628208339214325},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.33083510398864746},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.10673126578330994},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2881962","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2881962","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:857ac63b655343af84d15fe07c043739","is_oa":true,"landing_page_url":"https://doaj.org/article/857ac63b655343af84d15fe07c043739","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 71719-71731 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2881962","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2881962","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Reduced inequalities","id":"https://metadata.un.org/sdg/10","score":0.699999988079071}],"awards":[{"id":"https://openalex.org/G5379158986","display_name":null,"funder_award_id":"51374063","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8229811508","display_name":null,"funder_award_id":"2017YFB0304200","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G8899400589","display_name":null,"funder_award_id":"N150308001","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W150914396","https://openalex.org/W874439398","https://openalex.org/W1573965745","https://openalex.org/W1992913703","https://openalex.org/W2001141328","https://openalex.org/W2012444155","https://openalex.org/W2030889925","https://openalex.org/W2053186076","https://openalex.org/W2053593539","https://openalex.org/W2078087367","https://openalex.org/W2087399108","https://openalex.org/W2092072518","https://openalex.org/W2097777575","https://openalex.org/W2143675408","https://openalex.org/W2147141800","https://openalex.org/W2151103935","https://openalex.org/W2156718197","https://openalex.org/W2161969291","https://openalex.org/W2163352848","https://openalex.org/W2165321742","https://openalex.org/W2196029350","https://openalex.org/W2521266314","https://openalex.org/W2523922765","https://openalex.org/W2552946668","https://openalex.org/W2581023882","https://openalex.org/W2584615217","https://openalex.org/W2603243926","https://openalex.org/W2737457785","https://openalex.org/W2761406536","https://openalex.org/W2766108561","https://openalex.org/W2767118735","https://openalex.org/W2783697016","https://openalex.org/W2860738792","https://openalex.org/W4250878893","https://openalex.org/W6606191868","https://openalex.org/W6663851081","https://openalex.org/W6682755970"],"related_works":["https://openalex.org/W138221400","https://openalex.org/W4317671434","https://openalex.org/W2922872563","https://openalex.org/W2549418288","https://openalex.org/W2739092184","https://openalex.org/W2740804836","https://openalex.org/W4321317645","https://openalex.org/W3204374377","https://openalex.org/W1823469724","https://openalex.org/W2373150368"],"abstract_inverted_index":{"Steel":[0],"surface":[1,243],"demonstrates":[2],"various":[3],"sorts":[4],"of":[5,16,26,49,96,111,150,156,167,181,213,252],"defects":[6],"due":[7],"to":[8,35,40,61,100,126,145,170,176,209,228,248],"the":[9,27,37,42,56,68,77,80,85,105,109,128,136,139,147,154,172,178,182,187,197,202,206,211,214,224,230,237,240,250],"production":[10],"technique":[11],"and":[12,54,94,235],"environment.":[13],"The":[14,44,217],"appearance":[15],"defect":[17,45,78,129,151,215,244],"is":[18,33,47,59,124,189,220],"in":[19,52,84,132,201],"much":[20],"more":[21],"random":[22],"pattern":[23],"than":[24],"that":[25],"normal":[28],"texture":[29,226,231],"image.":[30,216],"Therefore,":[31],"it":[32],"challenging":[34],"capture":[36],"discriminant":[38,118,179],"information":[39,149],"categorize":[41],"defects.":[43],"image":[46,50],"out":[48],"registration":[51],"grayscale,":[53],"thus,":[55],"local":[57,73,91,112,121,148,257],"descriptor":[58,74,122],"inclined":[60],"be":[62,160],"utilized":[63],"for":[64,75,164,191],"feature":[65,87,232],"extraction.":[66],"In":[67,174],"previous":[69],"works,":[70],"involving":[71],"a":[72,114,165,184,193],"categorizing":[76],"images,":[79],"thresholding":[81],"operator":[82],"participates":[83],"hand-crafted":[86],"extraction,":[88],"such":[89],"as":[90],"binary":[92],"patterns":[93],"histogram":[95],"oriented":[97],"gradient,":[98],"leading":[99],"sub-optimal":[101],"features.":[102],"By":[103],"introducing":[104],"learning":[106],"mechanism":[107],"into":[108],"construction":[110],"descriptor,":[113],"novel":[115],"algorithm":[116,219],"named":[117],"manifold":[119,155,188,198],"regularized":[120],"(DMRLD)":[123],"proposed":[125,218],"conduct":[127],"classification":[130],"task":[131,208],"this":[133],"paper.":[134],"First,":[135],"DMRLD":[137,253],"computes":[138],"dense":[140],"pixel":[141],"difference":[142],"vector":[143],"(DPDV)":[144],"draw":[146],"images.":[152],"Then,":[153],"these":[157],"DPDVs":[158],"can":[159,204],"constructed":[161],"by":[162],"searching":[163],"number":[166],"linear":[168],"models":[169],"represent":[171],"feature.":[173],"order":[175],"enhance":[177],"ability":[180],"feature,":[183],"projection":[185],"on":[186,223,239],"learned":[190],"achieving":[192],"low-dimensional":[194],"subspace.":[195],"Finally,":[196],"distance":[199],"defined":[200],"subspace":[203],"accomplish":[205],"matching":[207],"get":[210],"category":[212],"first":[221],"applied":[222],"Kylberg":[225],"dataset":[227,245],"evaluate":[229],"extraction":[233],"performance,":[234],"then":[236],"experiments":[238],"real":[241],"steel":[242],"are":[246],"conducted":[247],"illustrate":[249],"effectiveness":[251],"compared":[254],"with":[255],"other":[256],"descriptors.":[258]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":5}],"updated_date":"2026-05-06T08:25:59.206177","created_date":"2025-10-10T00:00:00"}