{"id":"https://openalex.org/W2892282024","doi":"https://doi.org/10.1109/access.2018.2870568","title":"Fidelity Measurement on Signal Detection Algorithms With Application to AFM Imaging","display_name":"Fidelity Measurement on Signal Detection Algorithms With Application to AFM Imaging","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2892282024","doi":"https://doi.org/10.1109/access.2018.2870568","mag":"2892282024"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2870568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2870568","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2870568","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069613225","display_name":"S. Ghosal","orcid":"https://orcid.org/0000-0001-6878-7522"},"institutions":[{"id":"https://openalex.org/I131787340","display_name":"Seagate (United States)","ror":"https://ror.org/04p1xtv71","country_code":"US","type":"company","lineage":["https://openalex.org/I131787340"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sayan Ghosal","raw_affiliation_strings":["Seagate Technology, Shakopee, MN, USA"],"raw_orcid":"https://orcid.org/0000-0001-6878-7522","affiliations":[{"raw_affiliation_string":"Seagate Technology, Shakopee, MN, USA","institution_ids":["https://openalex.org/I131787340"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069864205","display_name":"Murti V. Salapaka","orcid":"https://orcid.org/0000-0002-4595-9683"},"institutions":[{"id":"https://openalex.org/I130238516","display_name":"University of Minnesota","ror":"https://ror.org/017zqws13","country_code":"US","type":"education","lineage":["https://openalex.org/I130238516"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Murti Salapaka","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Minnesota, 55455, MN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Minnesota, 55455, MN, USA","institution_ids":["https://openalex.org/I130238516"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11841282,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":null,"first_page":"52831","last_page":"52842"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fidelity","display_name":"Fidelity","score":0.8323789834976196},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7490172982215881},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6149153113365173},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.5854132175445557},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5746476650238037},{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.4870298504829407},{"id":"https://openalex.org/keywords/high-fidelity","display_name":"High fidelity","score":0.45239463448524475},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.44511187076568604},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.43434977531433105},{"id":"https://openalex.org/keywords/detection-theory","display_name":"Detection theory","score":0.4168126583099365},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3634454607963562},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3365946412086487},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3357461094856262},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.19073238968849182},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.13720762729644775},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.1214221715927124},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.11240917444229126},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08456498384475708},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08283427357673645},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07059493660926819}],"concepts":[{"id":"https://openalex.org/C2776459999","wikidata":"https://www.wikidata.org/wiki/Q2119376","display_name":"Fidelity","level":2,"score":0.8323789834976196},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7490172982215881},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6149153113365173},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.5854132175445557},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5746476650238037},{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.4870298504829407},{"id":"https://openalex.org/C113364801","wikidata":"https://www.wikidata.org/wiki/Q26674","display_name":"High fidelity","level":2,"score":0.45239463448524475},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.44511187076568604},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.43434977531433105},{"id":"https://openalex.org/C137270730","wikidata":"https://www.wikidata.org/wiki/Q120811","display_name":"Detection theory","level":3,"score":0.4168126583099365},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3634454607963562},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3365946412086487},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3357461094856262},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19073238968849182},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.13720762729644775},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.1214221715927124},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.11240917444229126},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08456498384475708},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08283427357673645},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07059493660926819},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2870568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2870568","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:ce14bab243654c6d88e41e2c3100333c","is_oa":true,"landing_page_url":"https://doaj.org/article/ce14bab243654c6d88e41e2c3100333c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 52831-52842 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2870568","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2870568","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.800000011920929,"display_name":"Peace, Justice and strong institutions"}],"awards":[{"id":"https://openalex.org/G1890980375","display_name":null,"funder_award_id":"NSF-CCF 1116971","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G7857561304","display_name":null,"funder_award_id":"NSF-ECCS 1202411","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W247104752","https://openalex.org/W363086602","https://openalex.org/W640518560","https://openalex.org/W1513016807","https://openalex.org/W1536045672","https://openalex.org/W1550917038","https://openalex.org/W1608735834","https://openalex.org/W1964498537","https://openalex.org/W1967445304","https://openalex.org/W1971513336","https://openalex.org/W1972578813","https://openalex.org/W1978868362","https://openalex.org/W1984307398","https://openalex.org/W1997070615","https://openalex.org/W1997299291","https://openalex.org/W2014593645","https://openalex.org/W2020215240","https://openalex.org/W2023582935","https://openalex.org/W2026819440","https://openalex.org/W2028573862","https://openalex.org/W2028895900","https://openalex.org/W2040879679","https://openalex.org/W2041018206","https://openalex.org/W2042205161","https://openalex.org/W2053307451","https://openalex.org/W2059658582","https://openalex.org/W2060895888","https://openalex.org/W2061241533","https://openalex.org/W2061356889","https://openalex.org/W2063802789","https://openalex.org/W2066986259","https://openalex.org/W2067782748","https://openalex.org/W2081338783","https://openalex.org/W2084553975","https://openalex.org/W2088844185","https://openalex.org/W2099932638","https://openalex.org/W2102781401","https://openalex.org/W2111352232","https://openalex.org/W2116044718","https://openalex.org/W2116510705","https://openalex.org/W2123072862","https://openalex.org/W2135262708","https://openalex.org/W2142483906","https://openalex.org/W2147584524","https://openalex.org/W2157446706","https://openalex.org/W2167344194","https://openalex.org/W2195693430","https://openalex.org/W2298692413","https://openalex.org/W2514303232","https://openalex.org/W2528077479","https://openalex.org/W2588670181","https://openalex.org/W2611278162","https://openalex.org/W2800009851","https://openalex.org/W2800024979","https://openalex.org/W2801114931","https://openalex.org/W2801698264","https://openalex.org/W2907162034","https://openalex.org/W2977305403","https://openalex.org/W3150248096","https://openalex.org/W4213055941","https://openalex.org/W4214492055","https://openalex.org/W4238744523","https://openalex.org/W4299681030","https://openalex.org/W4300917833"],"related_works":["https://openalex.org/W4313443006","https://openalex.org/W2945374968","https://openalex.org/W4293777179","https://openalex.org/W4385452045","https://openalex.org/W2164070813","https://openalex.org/W2135608140","https://openalex.org/W2895525995","https://openalex.org/W2332512904","https://openalex.org/W4224231624","https://openalex.org/W2319626700"],"abstract_inverted_index":{"Many":[0],"signal":[1,58,162],"processing":[2],"and":[3,165,175],"decision":[4,19,132],"making":[5],"algorithms":[6,69,164],"reported":[7],"in":[8],"contemporary":[9],"literature":[10],"characterize":[11,159],"the":[12,15,34,40,67,93,109,114,160,179],"performance":[13],"of":[14,33,36,97,111,113,127,139,181],"proposed":[16,161,182],"methods":[17,65],"utilizing":[18,47,75],"error":[20],"rates.":[21],"However":[22],"there":[23],"is":[24,84,108,156],"significant":[25],"need":[26],"for":[27,72,89,124,149],"strategies":[28],"that":[29,104],"provide":[30],"quantitative":[31],"assessment":[32,110],"fidelity":[35,49,63,112,143,166],"decisions":[37],"made":[38],"by":[39],"algorithms.":[41,60],"This":[42],"paper":[43],"develops":[44],"novel":[45],"techniques":[46,168],"which":[48],"measures":[50,144],"can":[51],"be":[52],"assigned":[53],"quantitatively":[54],"on":[55,135],"some":[56],"prevalent":[57],"detection":[59,68,126,138,163],"The":[61,82,117,142],"developed":[62,118],"measurement":[64,115,167],"with":[66,130],"are":[70,147],"employed":[71],"topography":[73],"imaging":[74],"dynamic":[76],"mode":[77],"atomic":[78],"force":[79],"microscope":[80],"(AFM).":[81],"AFM":[83,171],"a":[85,101],"versatile":[86],"metrology":[87],"tool":[88],"interrogating":[90],"material":[91],"at":[92],"nano-scale.":[94],"In":[95],"spite":[96],"its":[98],"remarkable":[99],"achievements,":[100],"key":[102],"issue":[103],"remains":[105],"largely":[106],"unaddressed":[107],"data.":[116],"paradigm":[119],"facilitates":[120],"user":[121],"specific":[122],"priority":[123],"either":[125],"sample":[128],"features":[129],"high":[131],"confidence":[133],"or":[134],"not":[136],"missing":[137],"true":[140],"features.":[141],"presented":[145,157],"here":[146],"suitable":[148],"real-time":[150],"implementation.":[151],"A":[152],"detailed":[153],"comparative":[154],"study":[155],"to":[158],"under":[169],"practical":[170],"applications.":[172],"Comprehensive":[173],"simulation":[174],"experimental":[176],"data":[177],"corroborate":[178],"effectiveness":[180],"methods.":[183]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}