{"id":"https://openalex.org/W2861362021","doi":"https://doi.org/10.1109/access.2018.2852730","title":"A Failure Mechanism Cumulative Model for Reliability Evaluation of a k-Out-of-n System With Load Sharing Effect","display_name":"A Failure Mechanism Cumulative Model for Reliability Evaluation of a k-Out-of-n System With Load Sharing Effect","publication_year":2018,"publication_date":"2018-07-04","ids":{"openalex":"https://openalex.org/W2861362021","doi":"https://doi.org/10.1109/access.2018.2852730","mag":"2861362021"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2852730","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2852730","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08403901.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08403901.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100700519","display_name":"Ying Chen","orcid":"https://orcid.org/0000-0002-6527-4251"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Chen","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101721114","display_name":"Xiaoyong Yu","orcid":"https://orcid.org/0000-0001-8095-9497"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyong Yu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-8095-9497","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101536983","display_name":"Yingyi Li","orcid":"https://orcid.org/0000-0001-5033-9035"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yingyi Li","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-5033-9035","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.6915,"has_fulltext":true,"cited_by_count":28,"citation_normalized_percentile":{"value":0.92076167,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"7","issue":null,"first_page":"2210","last_page":"2222"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6120420098304749},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6008325815200806},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5878654718399048},{"id":"https://openalex.org/keywords/mechanism","display_name":"Mechanism (biology)","score":0.5518060326576233},{"id":"https://openalex.org/keywords/binary-decision-diagram","display_name":"Binary decision diagram","score":0.5515460968017578},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.48755282163619995},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46408602595329285},{"id":"https://openalex.org/keywords/failure-mechanism","display_name":"Failure mechanism","score":0.448002427816391},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.42409563064575195},{"id":"https://openalex.org/keywords/electric-shock","display_name":"Electric shock","score":0.4188331961631775},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4149243235588074},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.31015628576278687},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16652485728263855},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.1609921157360077},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15491798520088196},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14528462290763855},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14064085483551025},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08315715193748474},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.08183777332305908},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07666924595832825}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6120420098304749},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6008325815200806},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5878654718399048},{"id":"https://openalex.org/C89611455","wikidata":"https://www.wikidata.org/wiki/Q6804646","display_name":"Mechanism (biology)","level":2,"score":0.5518060326576233},{"id":"https://openalex.org/C3309909","wikidata":"https://www.wikidata.org/wiki/Q864155","display_name":"Binary decision diagram","level":2,"score":0.5515460968017578},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.48755282163619995},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46408602595329285},{"id":"https://openalex.org/C3018344627","wikidata":"https://www.wikidata.org/wiki/Q1925224","display_name":"Failure mechanism","level":2,"score":0.448002427816391},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.42409563064575195},{"id":"https://openalex.org/C2776099285","wikidata":"https://www.wikidata.org/wiki/Q244404","display_name":"Electric shock","level":2,"score":0.4188331961631775},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4149243235588074},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.31015628576278687},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16652485728263855},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.1609921157360077},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15491798520088196},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14528462290763855},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14064085483551025},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08315715193748474},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.08183777332305908},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07666924595832825},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2852730","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2852730","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08403901.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:51537d421aa840d385cb0630663cee9f","is_oa":true,"landing_page_url":"https://doaj.org/article/51537d421aa840d385cb0630663cee9f","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 7, Pp 2210-2222 (2019)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2852730","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2852730","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/8600701/08403901.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[{"id":"https://openalex.org/G3009418347","display_name":null,"funder_award_id":"61573043","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G648318061","display_name":null,"funder_award_id":"61503014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2861362021.pdf","grobid_xml":"https://content.openalex.org/works/W2861362021.grobid-xml"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W1593084031","https://openalex.org/W1990144930","https://openalex.org/W1999188074","https://openalex.org/W2004244526","https://openalex.org/W2013016201","https://openalex.org/W2017323480","https://openalex.org/W2048267658","https://openalex.org/W2051214861","https://openalex.org/W2051636738","https://openalex.org/W2060221764","https://openalex.org/W2074399519","https://openalex.org/W2086172890","https://openalex.org/W2094084424","https://openalex.org/W2101527905","https://openalex.org/W2104082851","https://openalex.org/W2146325483","https://openalex.org/W2147064410","https://openalex.org/W2152141945","https://openalex.org/W2164484259","https://openalex.org/W2167352409","https://openalex.org/W2167648868","https://openalex.org/W2402208654","https://openalex.org/W2549292079","https://openalex.org/W4233099464","https://openalex.org/W4233921518","https://openalex.org/W6635622209","https://openalex.org/W6647818486"],"related_works":["https://openalex.org/W4300631294","https://openalex.org/W2390183607","https://openalex.org/W2122917767","https://openalex.org/W2042729523","https://openalex.org/W2018736673","https://openalex.org/W569271116","https://openalex.org/W2146720862","https://openalex.org/W2138734817","https://openalex.org/W2103741866","https://openalex.org/W2060246408"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"propose":[4],"a":[5,21,44,65,93,102,119,123],"failure":[6,27,38,59,76,95,109],"mechanism":[7,60],"cumulative":[8],"model":[9],"that":[10,68,70,117],"considers":[11],"the":[12,16,51,58,75,79,88,98,131,135,150],"loading":[13],"history":[14],"of":[15,26,62,78,101,108,134],"load":[17],"sharing":[18],"effect":[19,53],"in":[20,149],"k-out-of-n":[22,103],"system.":[23],"Three":[24],"types":[25,107],"mechanisms":[28,77,110],"are":[29],"considered,":[30],"continuous":[31],"degradation,":[32,35],"compound":[33],"point":[34,61],"and":[36,92,142],"sudden":[37],"due":[39],"to":[40,129],"shock.":[41],"By":[42,86],"constructing":[43,94],"logic":[45],"diagram":[46,145],"with":[47,105],"functional":[48],"dependence":[49],"gate,":[50],"load-sharing":[52],"can":[54],"be":[55,84],"explained":[56],"from":[57],"view":[63],"using":[64],"mechanism-acceleration":[66],"gate":[67],"shows":[69],"when":[71],"one":[72],"component":[73],"fails,":[74],"other":[80],"surviving":[81],"components":[82],"will":[83],"accelerated.":[85],"deriving":[87],"total":[89],"damage":[90],"equation":[91],"behavior":[96],"model,":[97],"system":[99,104,116],"reliability":[100],"different":[106],"were":[111],"evaluated.":[112],"A":[113,138],"voltage":[114],"stabilizing":[115],"contains":[118],"1-out-of-2":[120],"subsystem,":[121],"or":[122],"2-out-of":[124],"3":[125],"subsystem":[126],"was":[127,147],"used":[128,148],"illustrate":[130],"practical":[132],"applicability":[133],"proposed":[136],"approach.":[137],"combined":[139],"Monte":[140],"Carlo":[141],"binary":[143],"decision":[144],"method":[146],"numerical":[151],"simulation":[152],"process.":[153]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}