{"id":"https://openalex.org/W2800147369","doi":"https://doi.org/10.1109/access.2018.2827020","title":"Fast Algorithm for Rough-Surface Scene Simulation in Passive Millimeter Wave Imaging","display_name":"Fast Algorithm for Rough-Surface Scene Simulation in Passive Millimeter Wave Imaging","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2800147369","doi":"https://doi.org/10.1109/access.2018.2827020","mag":"2800147369"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2827020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2827020","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2827020","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101459109","display_name":"Chuan Yin","orcid":"https://orcid.org/0000-0002-1662-0541"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuan Yin","raw_affiliation_strings":["College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","ORCiD"],"raw_orcid":"https://orcid.org/0000-0002-1662-0541","affiliations":[{"raw_affiliation_string":"College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"ORCiD","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101773025","display_name":"Youlin Geng","orcid":"https://orcid.org/0000-0002-3100-9943"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youlin Geng","raw_affiliation_strings":["College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075450074","display_name":"Yujian Pan","orcid":"https://orcid.org/0000-0002-6700-3500"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujian Pan","raw_affiliation_strings":["College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009157438","display_name":"Huayan Jin","orcid":"https://orcid.org/0000-0002-5161-6273"},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huayan Jin","raw_affiliation_strings":["College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics and Information, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I50760025"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2619,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56051457,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"6","issue":null,"first_page":"25051","last_page":"25059"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11234","display_name":"Precipitation Measurement and Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1902","display_name":"Atmospheric Science"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10936","display_name":"Millimeter-Wave Propagation and Modeling","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.74554044008255},{"id":"https://openalex.org/keywords/ray-tracing","display_name":"Ray tracing (physics)","score":0.7228966355323792},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6936050653457642},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.6694502830505371},{"id":"https://openalex.org/keywords/brightness","display_name":"Brightness","score":0.6282144784927368},{"id":"https://openalex.org/keywords/rough-surface","display_name":"Rough surface","score":0.5510943531990051},{"id":"https://openalex.org/keywords/brightness-temperature","display_name":"Brightness temperature","score":0.5400548577308655},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.5095822811126709},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4554540514945984},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.42681264877319336},{"id":"https://openalex.org/keywords/surface-wave","display_name":"Surface wave","score":0.41373321413993835},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.31321603059768677},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.16839179396629333},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1230877935886383},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11478811502456665},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11338302493095398},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07649993896484375}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.74554044008255},{"id":"https://openalex.org/C121483023","wikidata":"https://www.wikidata.org/wiki/Q7298343","display_name":"Ray tracing (physics)","level":2,"score":0.7228966355323792},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6936050653457642},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.6694502830505371},{"id":"https://openalex.org/C125245961","wikidata":"https://www.wikidata.org/wiki/Q221656","display_name":"Brightness","level":2,"score":0.6282144784927368},{"id":"https://openalex.org/C3018343705","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Rough surface","level":2,"score":0.5510943531990051},{"id":"https://openalex.org/C53802167","wikidata":"https://www.wikidata.org/wiki/Q4538627","display_name":"Brightness temperature","level":3,"score":0.5400548577308655},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.5095822811126709},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4554540514945984},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.42681264877319336},{"id":"https://openalex.org/C84174578","wikidata":"https://www.wikidata.org/wiki/Q889796","display_name":"Surface wave","level":2,"score":0.41373321413993835},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.31321603059768677},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.16839179396629333},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1230877935886383},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11478811502456665},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11338302493095398},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07649993896484375},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2827020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2827020","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:b808bee0001e46f88743c708a668d8ea","is_oa":true,"landing_page_url":"https://doaj.org/article/b808bee0001e46f88743c708a668d8ea","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 25051-25059 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2827020","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2827020","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4257086697","display_name":null,"funder_award_id":"61501153","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1120811598","https://openalex.org/W1901422369","https://openalex.org/W1977660339","https://openalex.org/W1986778675","https://openalex.org/W1989782689","https://openalex.org/W1993913495","https://openalex.org/W2003470633","https://openalex.org/W2011903748","https://openalex.org/W2026369531","https://openalex.org/W2037060718","https://openalex.org/W2041538396","https://openalex.org/W2089768721","https://openalex.org/W2100801595","https://openalex.org/W2103133249","https://openalex.org/W2117878554","https://openalex.org/W2121813745","https://openalex.org/W2151847907","https://openalex.org/W2163102789","https://openalex.org/W2180373576","https://openalex.org/W2186784691","https://openalex.org/W2323648539","https://openalex.org/W2328556638","https://openalex.org/W2350244187","https://openalex.org/W2540909290","https://openalex.org/W2547440559","https://openalex.org/W2549420026","https://openalex.org/W3023278234","https://openalex.org/W4252271112","https://openalex.org/W6837519454","https://openalex.org/W7052307852"],"related_works":["https://openalex.org/W2054109135","https://openalex.org/W2012819262","https://openalex.org/W2120224698","https://openalex.org/W4323358701","https://openalex.org/W2527954625","https://openalex.org/W2078859084","https://openalex.org/W2886037301","https://openalex.org/W2726563707","https://openalex.org/W2402374714","https://openalex.org/W2540909290"],"abstract_inverted_index":{"Simulation":[0],"in":[1,14,17,43,53,67,105],"the":[2,15,33,56,71,74,86,89,92,95,111,117,121,124],"passive":[3,18],"millimeter-wave":[4],"(MMW)":[5],"imaging":[6],"of":[7,35,55,88,94,120,123],"rough":[8,37],"surfaces":[9],"is":[10,65],"an":[11],"indispensable":[12],"step":[13],"simulation":[16,96,122],"radiation":[19],"imaging.":[20],"The":[21],"multi-layer":[22,79],"brightness":[23],"temperature":[24],"tracing":[25],"method":[26,77,81],"(MBTTM)":[27],"can":[28,114],"be":[29],"used":[30],"to":[31],"simulate":[32],"image":[34],"a":[36,50,62],"surface,":[38],"which":[39,108],"has":[40],"been":[41],"proven":[42],"our":[44],"previous":[45],"work.":[46],"However,":[47],"it":[48],"causes":[49],"significant":[51],"decrease":[52],"efficiency":[54],"simulation.":[57],"To":[58,84],"solve":[59],"this":[60,68],"problem,":[61],"fast":[63,112],"MBTTM":[64,113],"proposed":[66],"paper.":[69],"In":[70],"new":[72,90],"method,":[73],"uniformly":[75],"emission":[76],"and":[78,97],"densification":[80],"are":[82,100,104],"presented.":[83],"validate":[85],"correctness":[87],"algorithm,":[91],"comparison":[93],"measurement":[98],"results":[99,103],"proposed.":[101],"These":[102],"good":[106],"agreement,":[107],"indicates":[109],"that":[110],"notably":[115],"shorten":[116],"computing":[118],"time":[119],"roughsurface":[125],"scene.":[126]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}