{"id":"https://openalex.org/W2800359013","doi":"https://doi.org/10.1109/access.2018.2819640","title":"Availability of Parallel Triplicated Redundancy Models With Imperfect Switchovers and Interrupted Repairs","display_name":"Availability of Parallel Triplicated Redundancy Models With Imperfect Switchovers and Interrupted Repairs","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2800359013","doi":"https://doi.org/10.1109/access.2018.2819640","mag":"2800359013"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2819640","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2819640","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2819640","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005846857","display_name":"Yutae Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I204974687","display_name":"Dong-Eui University","ror":"https://ror.org/059g69b28","country_code":"KR","type":"education","lineage":["https://openalex.org/I204974687"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yutae Lee","raw_affiliation_strings":["Dong Eui University, Busan, Busan, KR"],"raw_orcid":"https://orcid.org/0000-0002-5866-637X","affiliations":[{"raw_affiliation_string":"Dong Eui University, Busan, Busan, KR","institution_ids":["https://openalex.org/I204974687"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5005846857"],"corresponding_institution_ids":["https://openalex.org/I204974687"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.2577,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56054764,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"6","issue":null,"first_page":"27259","last_page":"27267"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switchover","display_name":"Switchover","score":0.7057081460952759},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6438641548156738},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6280823945999146},{"id":"https://openalex.org/keywords/exponential-distribution","display_name":"Exponential distribution","score":0.5691434741020203},{"id":"https://openalex.org/keywords/interrupt","display_name":"Interrupt","score":0.5691275596618652},{"id":"https://openalex.org/keywords/exponential-growth","display_name":"Exponential growth","score":0.4672429859638214},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.4154372215270996},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4008208215236664},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3211769461631775},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20821037888526917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1746959388256073},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14710110425949097},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10145312547683716}],"concepts":[{"id":"https://openalex.org/C124200919","wikidata":"https://www.wikidata.org/wiki/Q2373346","display_name":"Switchover","level":2,"score":0.7057081460952759},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6438641548156738},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6280823945999146},{"id":"https://openalex.org/C55350006","wikidata":"https://www.wikidata.org/wiki/Q237193","display_name":"Exponential distribution","level":2,"score":0.5691434741020203},{"id":"https://openalex.org/C41661131","wikidata":"https://www.wikidata.org/wiki/Q220764","display_name":"Interrupt","level":3,"score":0.5691275596618652},{"id":"https://openalex.org/C75235859","wikidata":"https://www.wikidata.org/wiki/Q582659","display_name":"Exponential growth","level":2,"score":0.4672429859638214},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.4154372215270996},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4008208215236664},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3211769461631775},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20821037888526917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1746959388256073},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14710110425949097},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10145312547683716},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2819640","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2819640","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1c519b23ab1643d9b878934ae9d6c0b6","is_oa":true,"landing_page_url":"https://doaj.org/article/1c519b23ab1643d9b878934ae9d6c0b6","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 27259-27267 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2819640","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2819640","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W645644672","https://openalex.org/W1514989946","https://openalex.org/W1520129600","https://openalex.org/W1648851162","https://openalex.org/W1972915559","https://openalex.org/W1977456296","https://openalex.org/W1993300806","https://openalex.org/W2008210727","https://openalex.org/W2009089969","https://openalex.org/W2009102716","https://openalex.org/W2031337372","https://openalex.org/W2043496345","https://openalex.org/W2096004114","https://openalex.org/W2099097660","https://openalex.org/W2126432586","https://openalex.org/W2151737545","https://openalex.org/W2177061142","https://openalex.org/W2288443673","https://openalex.org/W2295510516","https://openalex.org/W2316993527","https://openalex.org/W2464710561","https://openalex.org/W2513598765","https://openalex.org/W2554145291","https://openalex.org/W2576625991","https://openalex.org/W2584632936","https://openalex.org/W2605921527","https://openalex.org/W2768355819","https://openalex.org/W4237191431"],"related_works":["https://openalex.org/W2385368614","https://openalex.org/W2391729463","https://openalex.org/W2369951470","https://openalex.org/W2368126447","https://openalex.org/W2379248043","https://openalex.org/W2370187656","https://openalex.org/W2031986669","https://openalex.org/W2766105656","https://openalex.org/W2220701296","https://openalex.org/W1537624148"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"the":[3,6,37,40,69,76,85,89,92,104,120,139,148],"analysis":[4],"of":[5,39,52,88,106,109],"three":[7,31],"parallel":[8],"triplicated":[9,124,141],"redundancy":[10,93,125],"models:":[11],"model":[12,20,29,126],"with":[13,21,30,95,127,143],"one":[14,22,128],"active":[15,26,32,110,129,145],"and":[16,24,28,36,45,68,80,98,115,131],"two":[17,25,132],"standby":[18,23,133],"components,":[19,27,111],"components.":[33],"The":[34,50,58,123],"time-to-failure":[35],"time-to-repair":[38],"components":[41,54,134,146],"follow":[42],"an":[43,63],"exponential":[44],"a":[46],"general":[47],"distribution,":[48],"respectively.":[49],"repairs":[51],"failed":[53],"are":[55,72],"randomly":[56],"interrupted.":[57],"time-to-interrupt":[59],"is":[60,152],"taken":[61],"from":[62],"exponentially":[64],"distributed":[65],"random":[66],"variable":[67,78],"interrupt":[70],"times":[71],"generally":[73],"distributed.":[74],"Using":[75],"supplementary":[77],"method":[79],"integro-differential":[81],"equations,":[82],"we":[83],"obtain":[84],"analytical":[86],"expression":[87],"availability":[90,137],"for":[91],"models":[94,142],"imperfect":[96],"switchovers":[97],"interrupted":[99],"repairs.":[100],"Numerical":[101],"examples":[102],"show":[103],"effect":[105],"failure":[107,117,150],"rate":[108],"repair":[112],"interruption":[113],"rate,":[114],"switchover":[116,149],"probability":[118,151],"on":[119],"steady-state":[121],"availability.":[122],"component":[130],"has":[135],"higher":[136],"than":[138],"other":[140],"more":[144],"when":[147],"small.":[153]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}