{"id":"https://openalex.org/W2790935587","doi":"https://doi.org/10.1109/access.2018.2810826","title":"Probabilistic Fatigue Crack Growth Analysis Under Stationary Random Loading With Spike Loads","display_name":"Probabilistic Fatigue Crack Growth Analysis Under Stationary Random Loading With Spike Loads","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2790935587","doi":"https://doi.org/10.1109/access.2018.2810826","mag":"2790935587"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2810826","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2810826","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2810826","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063552482","display_name":"Shan Jiang","orcid":"https://orcid.org/0000-0002-1493-9954"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shan Jiang","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101657644","display_name":"Wei Zhang","orcid":"https://orcid.org/0000-0002-7754-6058"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Zhang","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-7754-6058","affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100693880","display_name":"Zili Wang","orcid":"https://orcid.org/0000-0002-5003-3092"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zili Wang","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.3843,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.54283025,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"6","issue":null,"first_page":"16878","last_page":"16886"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spike","display_name":"Spike (software development)","score":0.6683462858200073},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.6547772288322449},{"id":"https://openalex.org/keywords/vibration-fatigue","display_name":"Vibration fatigue","score":0.594517707824707},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5892977118492126},{"id":"https://openalex.org/keywords/paris-law","display_name":"Paris' law","score":0.563544511795044},{"id":"https://openalex.org/keywords/random-vibration","display_name":"Random vibration","score":0.5345669388771057},{"id":"https://openalex.org/keywords/vibration","display_name":"Vibration","score":0.4567365348339081},{"id":"https://openalex.org/keywords/amplitude","display_name":"Amplitude","score":0.44684427976608276},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.4158886671066284},{"id":"https://openalex.org/keywords/fracture-mechanics","display_name":"Fracture mechanics","score":0.4146069288253784},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.39201492071151733},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37643975019454956},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3205716013908386},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.23630031943321228},{"id":"https://openalex.org/keywords/crack-closure","display_name":"Crack closure","score":0.22509706020355225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20360654592514038},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.18376362323760986},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.15446168184280396},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13913047313690186},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.1327853500843048}],"concepts":[{"id":"https://openalex.org/C2781390188","wikidata":"https://www.wikidata.org/wiki/Q25203449","display_name":"Spike (software development)","level":2,"score":0.6683462858200073},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.6547772288322449},{"id":"https://openalex.org/C57341113","wikidata":"https://www.wikidata.org/wiki/Q17152571","display_name":"Vibration fatigue","level":3,"score":0.594517707824707},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5892977118492126},{"id":"https://openalex.org/C69809600","wikidata":"https://www.wikidata.org/wiki/Q7137166","display_name":"Paris' law","level":4,"score":0.563544511795044},{"id":"https://openalex.org/C130076159","wikidata":"https://www.wikidata.org/wiki/Q7291997","display_name":"Random vibration","level":3,"score":0.5345669388771057},{"id":"https://openalex.org/C198394728","wikidata":"https://www.wikidata.org/wiki/Q3695508","display_name":"Vibration","level":2,"score":0.4567365348339081},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.44684427976608276},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.4158886671066284},{"id":"https://openalex.org/C59085676","wikidata":"https://www.wikidata.org/wiki/Q957852","display_name":"Fracture mechanics","level":2,"score":0.4146069288253784},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.39201492071151733},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37643975019454956},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3205716013908386},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.23630031943321228},{"id":"https://openalex.org/C75512024","wikidata":"https://www.wikidata.org/wiki/Q17009280","display_name":"Crack closure","level":3,"score":0.22509706020355225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20360654592514038},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.18376362323760986},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.15446168184280396},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13913047313690186},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.1327853500843048},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2810826","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2810826","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:fc587c9ac1484f4497c22822fbe3b524","is_oa":true,"landing_page_url":"https://doaj.org/article/fc587c9ac1484f4497c22822fbe3b524","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 16878-16886 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2810826","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2810826","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W208419466","https://openalex.org/W239393364","https://openalex.org/W896996848","https://openalex.org/W1578023485","https://openalex.org/W1971462753","https://openalex.org/W1973569609","https://openalex.org/W1989671548","https://openalex.org/W1994155755","https://openalex.org/W2012283660","https://openalex.org/W2025954669","https://openalex.org/W2027997417","https://openalex.org/W2036279005","https://openalex.org/W2046302047","https://openalex.org/W2049602501","https://openalex.org/W2063199217","https://openalex.org/W2074840797","https://openalex.org/W2074875773","https://openalex.org/W2091431215","https://openalex.org/W2147376992","https://openalex.org/W2165368436","https://openalex.org/W2167728830","https://openalex.org/W2331008407","https://openalex.org/W2771243081","https://openalex.org/W6653348285","https://openalex.org/W6702150124"],"related_works":["https://openalex.org/W2596953373","https://openalex.org/W2762433127","https://openalex.org/W2057375452","https://openalex.org/W1972766610","https://openalex.org/W3200008745","https://openalex.org/W1803627106","https://openalex.org/W2146824365","https://openalex.org/W2349341334","https://openalex.org/W2359428930","https://openalex.org/W4320058976"],"abstract_inverted_index":{"The":[0,272],"in-service":[1],"loading":[2,15,57,71,78,169,230,291],"condition":[3],"of":[4,11,49,68,114,124,142,176,190,222,238,285],"many":[5],"engineering":[6],"structures":[7],"is":[8,43,100,158,199,234],"generally":[9],"composed":[10],"a":[12,40,217,255],"stationary":[13,54,69,228,289],"random":[14,55,70,77,229,290],"caused":[16],"by":[17,59,150],"the":[18,22,31,47,53,65,75,94,103,111,115,120,128,134,139,151,154,162,167,172,183,188,203,209,246,249,261,264,276,282,286],"mechanical":[19],"vibration,":[20],"and":[21,34,127,193],"spike":[23,61,135,168,194,232,240,250,265,293],"loads":[24,136,195,233,251,266],"due":[25],"to":[26,45,52,82,138,160,181],"occasional":[27,60],"events,":[28],"such":[29],"as":[30],"sudden":[32],"shock":[33],"accidental":[35],"turbulence.":[36],"In":[37,215,245],"this":[38],"paper,":[39],"physical-based":[41],"method":[42,91],"proposed":[44,184,277],"evaluate":[46,281],"reliability":[48,225,284],"structure":[50,287],"subjected":[51],"fatigue":[56,105,116,163,223,283],"superimposed":[58],"loads.":[62,294],"First,":[63],"since":[64],"interaction":[66,143],"effects":[67],"are":[72,119,179,196,206,243,252],"approximately":[73],"stable,":[74],"realistic":[76],"can":[79,92,146,279],"be":[80,147],"transferred":[81],"an":[83],"equivalent":[84,89],"constant":[85],"amplitude":[86],"loading.":[87],"This":[88,98],"transformation":[90],"avoid":[93],"complicated":[95],"cycle-by-cycle":[96],"calculation.":[97],"approach":[99,278],"derived":[101],"from":[102],"two-parameter":[104],"crack":[106,117,164],"growth":[107,118],"model,":[108],"in":[109,186,260],"which":[110,145,187],"driving":[112],"parameters":[113],"stress":[121,129],"intensity":[122,130],"factor":[123,131],"peak":[125],"load":[126,241],"range.":[132],"Second,":[133],"lead":[137],"high":[140],"nonlinearity":[141],"effect,":[144],"accounted":[148],"for":[149],"plasticity.":[152],"Therefore,":[153],"generalized":[155],"Willenborg":[156],"model":[157],"employed":[159],"calculate":[161],"propagation":[165],"under":[166,227,288],"effects.":[170],"Then,":[171],"extensive":[173],"experimental":[174],"data":[175,205],"aluminum":[177],"alloys":[178],"used":[180],"validate":[182],"method,":[185],"indeterminacies":[189],"material":[191],"parameter":[192],"considered.":[197],"It":[198],"observed":[200],"that":[201,275],"all":[202],"testing":[204],"contained":[207],"within":[208],"prediction":[210],"90%":[211],"confidence":[212],"interval":[213],"bounds.":[214],"addition,":[216],"Monte":[218],"Carlo":[219],"simulation":[220],"example":[221],"life":[224],"assessment":[226],"with":[231,268,292],"performed.":[235],"Two":[236],"scenarios":[237],"different":[239],"distributions":[242],"discussed.":[244],"first":[247],"scenario,":[248,263],"applied":[253],"at":[254],"fixed":[256],"time":[257,270],"interval,":[258],"while":[259],"other":[262],"occur":[267],"varying":[269],"period.":[271],"results":[273],"indicate":[274],"appropriately":[280]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
