{"id":"https://openalex.org/W2790152670","doi":"https://doi.org/10.1109/access.2018.2802319","title":"Reliability Model of Consecutive $(2, k)$ -Out-of-( $2, n$ ) :F Systems With Local Load-Sharing","display_name":"Reliability Model of Consecutive $(2, k)$ -Out-of-( $2, n$ ) :F Systems With Local Load-Sharing","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2790152670","doi":"https://doi.org/10.1109/access.2018.2802319","mag":"2790152670"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2802319","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2802319","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2802319","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014662949","display_name":"Jianbin Guo","orcid":"https://orcid.org/0000-0002-7850-4570"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianbin Guo","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100355526","display_name":"Zhuo Liu","orcid":"https://orcid.org/0000-0001-8080-4663"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuo Liu","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071838748","display_name":"Haiyang Che","orcid":"https://orcid.org/0000-0001-8390-8265"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyang Che","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059018580","display_name":"Shengkui Zeng","orcid":"https://orcid.org/0000-0002-2857-4626"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengkui Zeng","raw_affiliation_strings":["Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Science and Technology on Reliability and Environmental Engineering Laboratory, School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5014662949"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7706,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71219397,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"6","issue":null,"first_page":"8178","last_page":"8188"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11850","display_name":"Concrete Corrosion and Durability","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.8177151679992676},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.710989773273468},{"id":"https://openalex.org/keywords/load-sharing","display_name":"Load sharing","score":0.6219856142997742},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6101983189582825},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5188104510307312},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5001301765441895},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.49342623353004456},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4534653425216675},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4410799741744995},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.43876099586486816},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.41232818365097046},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.3249669671058655},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2599509358406067},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.20683428645133972},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1380392611026764},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10365334153175354}],"concepts":[{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.8177151679992676},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.710989773273468},{"id":"https://openalex.org/C3019828297","wikidata":"https://www.wikidata.org/wiki/Q575614","display_name":"Load sharing","level":2,"score":0.6219856142997742},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6101983189582825},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5188104510307312},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5001301765441895},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.49342623353004456},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4534653425216675},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4410799741744995},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.43876099586486816},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.41232818365097046},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.3249669671058655},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2599509358406067},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.20683428645133972},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1380392611026764},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10365334153175354},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2802319","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2802319","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:1cd1f1c11168445f9e0b305db3a157aa","is_oa":true,"landing_page_url":"https://doaj.org/article/1cd1f1c11168445f9e0b305db3a157aa","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 8178-8188 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2802319","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2802319","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W137482480","https://openalex.org/W332646783","https://openalex.org/W403210329","https://openalex.org/W614359681","https://openalex.org/W1911120257","https://openalex.org/W1969850680","https://openalex.org/W1978087978","https://openalex.org/W2021215671","https://openalex.org/W2024905066","https://openalex.org/W2038719001","https://openalex.org/W2046671536","https://openalex.org/W2076342906","https://openalex.org/W2092640118","https://openalex.org/W2143394407","https://openalex.org/W2208399475","https://openalex.org/W2343535568","https://openalex.org/W2345185961","https://openalex.org/W2351798926","https://openalex.org/W2375657864","https://openalex.org/W2383113271","https://openalex.org/W2474602466","https://openalex.org/W2764312179","https://openalex.org/W6613900712"],"related_works":["https://openalex.org/W2357256365","https://openalex.org/W2348502264","https://openalex.org/W2365486383","https://openalex.org/W4300939757","https://openalex.org/W1979470315","https://openalex.org/W2962655934","https://openalex.org/W2051226416","https://openalex.org/W2067279514","https://openalex.org/W3144902966","https://openalex.org/W4239087730"],"abstract_inverted_index":{"Most":[0],"previous":[1],"reliability":[2,21,105,147,207,228],"models":[3,208],"of":[4,29,87,101,118,122,130,172,190,218,226,230],"consecutive":[5,31,36,150],"k-out-of-n":[6],"system":[7,20,159,206],"assume":[8],"that":[9],"the":[10,27,60,73,85,91,98,109,115,123,134,139,179,188,199,203,214,227],"components":[11,47,132],"are":[12,17,164,209],"independent":[13],"or":[14],"their":[15],"reliabilities":[16],"equal.":[18],"The":[19,158],"can":[22,183],"be":[23,49,68,95,184],"obtained":[24],"according":[25,212],"to":[26,213],"configuration":[28,125],"k":[30],"failed":[32,46],"components.":[33,58,89,103],"However,":[34],"for":[35,149],"(2,":[37,151],"k)-out-of-(2,":[38,152],"n)":[39,153],"systems":[40,154,232],"with":[41,97,155],"local":[42,156],"load-sharing,":[43],"workloads":[44],"on":[45,72,193,198],"will":[48],"equally":[50],"shared":[51,195],"by":[52,84,114,127,186],"both":[53],"vertically":[54],"and":[55,70,78,160,167,205],"horizontally":[56],"adjacent":[57,88,102,119,131,191],"Consequently,":[59],"component":[61,92,110,161,180,204],"failure":[62,99,116,128],"probability":[63],"density":[64],"function":[65],"(FPDF)":[66],"may":[67,94],"unequal":[69],"dependent":[71],"actual":[74],"load":[75,216],"(both":[76],"original":[77],"sharing":[79],"load),":[80],"which":[81],"is":[82],"determined":[83,113,126],"states":[86,129],"Furthermore,":[90],"FPDF":[93],"time-varying":[96],"sequences":[100,117],"Therefore,":[104],"modeling":[106],"must":[107],"consider":[108],"dynamic":[111,162],"process":[112,182],"components,":[120],"instead":[121],"static":[124],"in":[133,233],"traditional":[135],"models.":[136],"To":[137],"solve":[138],"above":[140],"issues,":[141],"this":[142],"paper":[143],"develops":[144],"a":[145,170],"new":[146],"model":[148],"load-sharing.":[157],"processes":[163,217],"automatically":[165],"searched":[166],"combined":[168],"into":[169],"set":[171],"state":[173,200],"transition":[174,201],"paths.":[175],"In":[176],"each":[177,219],"path,":[178],"load-varying":[181],"confirmed,":[185],"considering":[187],"influence":[189],"failures":[192],"its":[194],"load.":[196],"Based":[197],"paths,":[202],"further":[210],"derived,":[211],"confirmed":[215],"component.":[220],"Finally,":[221],"we":[222],"present":[223],"graphical":[224],"illustrations":[225],"evaluation":[229],"cable-strut":[231],"long-span":[234],"suspension":[235],"bridges.":[236]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}