{"id":"https://openalex.org/W2781951091","doi":"https://doi.org/10.1109/access.2017.2788918","title":"Analyzing Technological Spillover Effects Between Technology Classes: the Case of Korea Technology Finance Corporation","display_name":"Analyzing Technological Spillover Effects Between Technology Classes: the Case of Korea Technology Finance Corporation","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2781951091","doi":"https://doi.org/10.1109/access.2017.2788918","mag":"2781951091"},"language":"en","primary_location":{"id":"doi:10.1109/access.2017.2788918","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2788918","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2017.2788918","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084523518","display_name":"Sungchul Choi","orcid":"https://orcid.org/0000-0002-5836-3838"},"institutions":[{"id":"https://openalex.org/I12832649","display_name":"Gachon University","ror":"https://ror.org/03ryywt80","country_code":"KR","type":"education","lineage":["https://openalex.org/I12832649"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Sungchul Choi","raw_affiliation_strings":["Department of Industrial and Management Engineering, Gachon University, Seongnam, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Industrial and Management Engineering, Gachon University, Seongnam, South Korea","institution_ids":["https://openalex.org/I12832649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109046467","display_name":"Maeng Seok Noh","orcid":null},"institutions":[{"id":"https://openalex.org/I8991828","display_name":"Pukyong National University","ror":"https://ror.org/0433kqc49","country_code":"KR","type":"education","lineage":["https://openalex.org/I8991828"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Maeng Seok Noh","raw_affiliation_strings":["Department of Statistics, Pukyong National University, Busan, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Statistics, Pukyong National University, Busan, South Korea","institution_ids":["https://openalex.org/I8991828"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030647016","display_name":"Janghyeok Yoon","orcid":"https://orcid.org/0000-0002-8701-0695"},"institutions":[{"id":"https://openalex.org/I24062138","display_name":"Konkuk University","ror":"https://ror.org/025h1m602","country_code":"KR","type":"education","lineage":["https://openalex.org/I24062138"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Janghyeok Yoon","raw_affiliation_strings":["Department of Industrial Engineering, Konkuk University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, Konkuk University, Seoul, South Korea","institution_ids":["https://openalex.org/I24062138"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101931123","display_name":"Hyunseok Park","orcid":"https://orcid.org/0000-0001-6426-1531"},"institutions":[{"id":"https://openalex.org/I4575257","display_name":"Hanyang University","ror":"https://ror.org/046865y68","country_code":"KR","type":"education","lineage":["https://openalex.org/I4575257"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunseok Park","raw_affiliation_strings":["Department of Information System, Hanyang University, Seoul, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Information System, Hanyang University, Seoul, South Korea","institution_ids":["https://openalex.org/I4575257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083660980","display_name":"Wonchul Seo","orcid":"https://orcid.org/0000-0003-2247-0399"},"institutions":[{"id":"https://openalex.org/I8991828","display_name":"Pukyong National University","ror":"https://ror.org/0433kqc49","country_code":"KR","type":"education","lineage":["https://openalex.org/I8991828"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wonchul Seo","raw_affiliation_strings":["Graduate School of Management of Technology, Pukyong National University, Busan, South Korea"],"affiliations":[{"raw_affiliation_string":"Graduate School of Management of Technology, Pukyong National University, Busan, South Korea","institution_ids":["https://openalex.org/I8991828"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5084523518"],"corresponding_institution_ids":["https://openalex.org/I12832649"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":3.2391,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.9176327,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"6","issue":null,"first_page":"3573","last_page":"3584"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10856","display_name":"Intellectual Property and Patents","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10856","display_name":"Intellectual Property and Patents","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.676103413105011},{"id":"https://openalex.org/keywords/spillover-effect","display_name":"Spillover effect","score":0.6488510370254517},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5792335271835327},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.5044986009597778},{"id":"https://openalex.org/keywords/variance","display_name":"Variance (accounting)","score":0.5019834041595459},{"id":"https://openalex.org/keywords/service","display_name":"Service (business)","score":0.4168124198913574},{"id":"https://openalex.org/keywords/risk-analysis","display_name":"Risk analysis (engineering)","score":0.40304839611053467},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.28949761390686035},{"id":"https://openalex.org/keywords/marketing","display_name":"Marketing","score":0.18329903483390808},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.15761613845825195},{"id":"https://openalex.org/keywords/accounting","display_name":"Accounting","score":0.1483534276485443},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13101273775100708}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.676103413105011},{"id":"https://openalex.org/C55527203","wikidata":"https://www.wikidata.org/wiki/Q334194","display_name":"Spillover effect","level":2,"score":0.6488510370254517},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5792335271835327},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.5044986009597778},{"id":"https://openalex.org/C196083921","wikidata":"https://www.wikidata.org/wiki/Q7915758","display_name":"Variance (accounting)","level":2,"score":0.5019834041595459},{"id":"https://openalex.org/C2780378061","wikidata":"https://www.wikidata.org/wiki/Q25351891","display_name":"Service (business)","level":2,"score":0.4168124198913574},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.40304839611053467},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.28949761390686035},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.18329903483390808},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.15761613845825195},{"id":"https://openalex.org/C121955636","wikidata":"https://www.wikidata.org/wiki/Q4116214","display_name":"Accounting","level":1,"score":0.1483534276485443},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13101273775100708},{"id":"https://openalex.org/C175444787","wikidata":"https://www.wikidata.org/wiki/Q39072","display_name":"Microeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2017.2788918","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2788918","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7b42c42ade00460992261c12333d9772","is_oa":true,"landing_page_url":"https://doaj.org/article/7b42c42ade00460992261c12333d9772","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 3573-3584 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2017.2788918","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2788918","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.46000000834465027,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G6959182181","display_name":null,"funder_award_id":"NRF-2014R1A1A1005317","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"},{"id":"https://openalex.org/G7642841970","display_name":null,"funder_award_id":"NRF-2015R1C1A1A01056185","funder_id":"https://openalex.org/F4320322030","funder_display_name":"Ministry of Science, ICT and Future Planning"}],"funders":[{"id":"https://openalex.org/F4320322030","display_name":"Ministry of Science, ICT and Future Planning","ror":"https://ror.org/032e49973"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":68,"referenced_works":["https://openalex.org/W1766594731","https://openalex.org/W1965525934","https://openalex.org/W1965574250","https://openalex.org/W1967629308","https://openalex.org/W1975810514","https://openalex.org/W1982791960","https://openalex.org/W1987262809","https://openalex.org/W1987513450","https://openalex.org/W1989270575","https://openalex.org/W1996040557","https://openalex.org/W2004900642","https://openalex.org/W2014325341","https://openalex.org/W2016826408","https://openalex.org/W2020986551","https://openalex.org/W2028165476","https://openalex.org/W2034628766","https://openalex.org/W2035097005","https://openalex.org/W2038562477","https://openalex.org/W2039104963","https://openalex.org/W2040841553","https://openalex.org/W2045345984","https://openalex.org/W2054928183","https://openalex.org/W2057490059","https://openalex.org/W2063657538","https://openalex.org/W2084397975","https://openalex.org/W2093487564","https://openalex.org/W2095184674","https://openalex.org/W2095576022","https://openalex.org/W2104695015","https://openalex.org/W2106585217","https://openalex.org/W2111718621","https://openalex.org/W2114225110","https://openalex.org/W2116998814","https://openalex.org/W2118067958","https://openalex.org/W2119914337","https://openalex.org/W2134481428","https://openalex.org/W2136078606","https://openalex.org/W2138460610","https://openalex.org/W2144836313","https://openalex.org/W2144836956","https://openalex.org/W2148143831","https://openalex.org/W2165135129","https://openalex.org/W2166559705","https://openalex.org/W2167915553","https://openalex.org/W2173968501","https://openalex.org/W2181949996","https://openalex.org/W2207601248","https://openalex.org/W2211021946","https://openalex.org/W2215595606","https://openalex.org/W2278180027","https://openalex.org/W2286659793","https://openalex.org/W2290865709","https://openalex.org/W2339688832","https://openalex.org/W2341522766","https://openalex.org/W2488138880","https://openalex.org/W2563603788","https://openalex.org/W2608504760","https://openalex.org/W2611871750","https://openalex.org/W2612512105","https://openalex.org/W2614363614","https://openalex.org/W2622692433","https://openalex.org/W2624191516","https://openalex.org/W3023428462","https://openalex.org/W3192603459","https://openalex.org/W4285719527","https://openalex.org/W6678147472","https://openalex.org/W6696598418","https://openalex.org/W6738814177"],"related_works":["https://openalex.org/W3174705069","https://openalex.org/W2364548092","https://openalex.org/W2014368031","https://openalex.org/W2144168794","https://openalex.org/W3122379543","https://openalex.org/W2361421218","https://openalex.org/W2351205649","https://openalex.org/W2349149235","https://openalex.org/W3124536071","https://openalex.org/W2160263597"],"abstract_inverted_index":{"A":[0,69],"technology":[1,98,132,222],"evaluation":[2,15,203,231,249],"system":[3],"is":[4,45],"mandatory":[5],"to":[6,31,65,108,164,175,199,205,234],"successfully":[7],"implement":[8],"a":[9,55,89,201],"technology-based":[10,211],"financial":[11],"support":[12],"system.":[13,214],"Technology":[14],"has":[16,76,82],"generally":[17],"been":[18,29,78],"relied":[19],"on":[20,104],"the":[21,33,42,50,73,112,138,144,151,155,162,166,177,180,187,218,221,226,229,235,239,246],"experts'":[22],"manual":[23,37],"work.":[24,38,250],"Various":[25],"quantitative":[26,202],"indicators":[27],"have":[28],"presented":[30,181],"improve":[32,217],"efficiency":[34,247],"of":[35,52,54,111,116,179,220,228,238,248],"this":[36,86,195],"Among":[39],"these":[40],"indicators,":[41],"spillover":[43,74,95,168],"effect":[44],"perceived":[46],"as":[47],"useful":[48],"for":[49,71,92,209],"disposal":[51],"patents":[53,184],"firm,":[56],"which":[57],"received":[58],"credit":[59,212],"guarantee":[60,213],"but":[61,80],"lost":[62],"its":[63,67,109],"ability":[64],"service":[66],"debt.":[68],"model":[70,204],"measuring":[72,93],"effects":[75,96,153,163],"already":[77],"proposed,":[79],"it":[81,242],"low":[83],"reliability.":[84],"Therefore,":[85,147],"paper":[87,196],"presents":[88],"systematic":[90],"approach":[91,101,182],"technological":[94,117,167],"between":[97,131],"classes.":[99,133],"The":[100,134],"mainly":[102],"relies":[103],"patent":[105,125],"data":[106,126],"due":[107,233],"features":[110],"latest":[113],"reliable":[114],"sources":[115],"intelligence.":[118],"We":[119,170,192],"first":[120,149],"extract":[121],"co-classification":[122],"information":[123],"from":[124,154],"and":[127,158],"generate":[128],"association":[129],"rules":[130],"relationships":[135],"represented":[136],"by":[137,224],"rules,":[139],"however,":[140],"can":[141,197],"only":[142],"depict":[143],"direct":[145,156],"effects.":[146,169],"we":[148],"derive":[150],"indirect":[152],"ones":[157],"then":[159],"integrate":[160],"both":[161],"measure":[165],"conduct":[171],"an":[172],"empirical":[173],"study":[174],"show":[176],"applicability":[178],"using":[183],"granted":[185],"in":[186],"Korean":[188],"Intellectual":[189],"Property":[190],"Office.":[191],"expect":[193],"that":[194],"contribute":[198],"establish":[200],"help":[206],"assess":[207],"technologies":[208],"successful":[210],"It":[215],"will":[216,243],"reliability":[219],"assessment":[223],"reducing":[225],"variance":[227],"qualitative":[230],"results":[232],"individual":[236],"differences":[237],"evaluator.":[240],"Furthermore,":[241],"also":[244],"enhance":[245]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}