{"id":"https://openalex.org/W2770564281","doi":"https://doi.org/10.1109/access.2017.2775743","title":"A GO-FLOW and Dynamic Bayesian Network Combination Approach for Reliability Evaluation With Uncertainty: A Case Study on a Nuclear Power Plant","display_name":"A GO-FLOW and Dynamic Bayesian Network Combination Approach for Reliability Evaluation With Uncertainty: A Case Study on a Nuclear Power Plant","publication_year":2017,"publication_date":"2017-11-20","ids":{"openalex":"https://openalex.org/W2770564281","doi":"https://doi.org/10.1109/access.2017.2775743","mag":"2770564281"},"language":"en","primary_location":{"id":"doi:10.1109/access.2017.2775743","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2775743","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2017.2775743","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075486968","display_name":"Yi Ren","orcid":"https://orcid.org/0000-0002-3665-700X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Ren","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-3665-700X","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085021406","display_name":"Dongming Fan","orcid":"https://orcid.org/0000-0001-5122-6614"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongming Fan","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027672348","display_name":"Xinrui Ma","orcid":"https://orcid.org/0009-0009-5238-381X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinrui Ma","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100693883","display_name":"Zili Wang","orcid":"https://orcid.org/0000-0002-6125-849X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zili Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064561580","display_name":"Qiang Feng","orcid":"https://orcid.org/0000-0003-2454-7839"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Feng","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-2454-7839","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102879856","display_name":"Dezhen Yang","orcid":"https://orcid.org/0000-0003-4287-6193"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dezhen Yang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":2.6863,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.9110823,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"6","issue":null,"first_page":"7177","last_page":"7189"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7539083957672119},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"Uncertainty analysis","score":0.7480118274688721},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7222650051116943},{"id":"https://openalex.org/keywords/dynamic-bayesian-network","display_name":"Dynamic Bayesian network","score":0.713427722454071},{"id":"https://openalex.org/keywords/nuclear-power-plant","display_name":"Nuclear power plant","score":0.6395696401596069},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5798709392547607},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5477603077888489},{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.5445061922073364},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5022861957550049},{"id":"https://openalex.org/keywords/sensitivity-analysis","display_name":"Sensitivity analysis","score":0.4733923673629761},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.43140172958374023},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4259074330329895},{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"Uncertainty quantification","score":0.42021501064300537},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.303594708442688},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.20119237899780273},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.170322984457016},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.1621038317680359},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1425546109676361},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11169373989105225},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11116838455200195}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7539083957672119},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.7480118274688721},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7222650051116943},{"id":"https://openalex.org/C82142266","wikidata":"https://www.wikidata.org/wiki/Q3456604","display_name":"Dynamic Bayesian network","level":3,"score":0.713427722454071},{"id":"https://openalex.org/C2779979336","wikidata":"https://www.wikidata.org/wiki/Q134447","display_name":"Nuclear power plant","level":2,"score":0.6395696401596069},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5798709392547607},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5477603077888489},{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.5445061922073364},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5022861957550049},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.4733923673629761},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.43140172958374023},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4259074330329895},{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.42021501064300537},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.303594708442688},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.20119237899780273},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.170322984457016},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.1621038317680359},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1425546109676361},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11169373989105225},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11116838455200195},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2017.2775743","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2775743","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:131500e1df914d83a5c2955a03936285","is_oa":true,"landing_page_url":"https://doaj.org/article/131500e1df914d83a5c2955a03936285","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 7177-7189 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2017.2775743","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2017.2775743","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Clean water and sanitation","id":"https://metadata.un.org/sdg/6"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W228254845","https://openalex.org/W928542775","https://openalex.org/W1530524366","https://openalex.org/W1817316424","https://openalex.org/W1964574874","https://openalex.org/W1972083495","https://openalex.org/W1991720013","https://openalex.org/W2002412017","https://openalex.org/W2014540231","https://openalex.org/W2015127657","https://openalex.org/W2022125434","https://openalex.org/W2023908179","https://openalex.org/W2026637777","https://openalex.org/W2026960979","https://openalex.org/W2031571299","https://openalex.org/W2037470097","https://openalex.org/W2041830596","https://openalex.org/W2054262815","https://openalex.org/W2057707767","https://openalex.org/W2062054804","https://openalex.org/W2065982214","https://openalex.org/W2088756815","https://openalex.org/W2091769413","https://openalex.org/W2092641011","https://openalex.org/W2092903177","https://openalex.org/W2096168361","https://openalex.org/W2100501251","https://openalex.org/W2114258378","https://openalex.org/W2131875370","https://openalex.org/W2136433622","https://openalex.org/W2145929378","https://openalex.org/W2165488572","https://openalex.org/W2215891809","https://openalex.org/W2341564785","https://openalex.org/W2412046167","https://openalex.org/W2461010581","https://openalex.org/W2490420788","https://openalex.org/W2516499429","https://openalex.org/W2519348275","https://openalex.org/W2527751063","https://openalex.org/W2581964379","https://openalex.org/W2592482446","https://openalex.org/W2600079138","https://openalex.org/W2620843198","https://openalex.org/W2623776850","https://openalex.org/W4234116282","https://openalex.org/W6638225116"],"related_works":["https://openalex.org/W2116089868","https://openalex.org/W4249135812","https://openalex.org/W93577605","https://openalex.org/W2033170585","https://openalex.org/W1991803138","https://openalex.org/W337241763","https://openalex.org/W1983007452","https://openalex.org/W4387046439","https://openalex.org/W3128892391","https://openalex.org/W2115703496"],"abstract_inverted_index":{"Uncertainty":[0],"analyses":[1],"have":[2],"been":[3,46],"considered":[4],"critical":[5],"analysis":[6,44,54,150,183,208],"methods":[7],"for":[8,35,55,70,148,206],"identifying":[9],"the":[10,29,49,71,83,86,93,97,104,107,123,126,129,133,141,149,153,159,164,173,185,192,195,199],"risks":[11],"in":[12,48,78,143,163],"reliability":[13,30,72,186],"evaluations.":[14],"However,":[15],"with":[16,33,74,96,191,209],"multi-phase,":[17,98],"multi-state,":[18,99],"and":[19,26,37,63,100,132,213],"repairable":[20,101],"features,":[21],"this":[22,41,79,112,178],"method":[23],"cannot":[24],"effectively":[25],"precisely":[27],"display":[28],"evaluation":[31,50,73,187],"results":[32,176,193],"uncertainty":[34,43,75,142,182,196,207],"dynamic":[36,64],"complex":[38],"systems.":[39],"In":[40],"paper,":[42],"has":[45],"conducted":[47],"of":[51,106,145,158,177],"safety-related":[52],"risk":[53],"a":[56],"nuclear":[57],"power":[58,155],"plant":[59],"(NPP).":[60],"A":[61],"GO-FLOW":[62,200],"Bayesian":[65],"network":[66],"(DBN)":[67],"combination":[68],"approach":[69,113],"is":[76,166],"proposed":[77],"paper.":[80],"Based":[81],"on":[82,117],"unified":[84],"rules,":[85],"various":[87],"operators":[88],"can":[89,114,202],"be":[90,203],"mapped":[91],"into":[92],"DBN":[94,130],"even":[95],"characteristics.":[102],"As":[103],"framework":[105],"DBN,":[108],"utilizing":[109],"sensitivity":[110],"analysis,":[111],"provide":[115],"information":[116],"those":[118],"inputs":[119],"that":[120,181],"are":[121,137],"contributing":[122],"most":[124],"to":[125,139,171],"uncertainty.":[127],"Next,":[128],"algorithm":[131],"Monte":[134],"Carlo":[135],"simulation":[136],"used":[138],"quantify":[140],"terms":[144],"appropriate":[146],"estimates":[147],"results.":[151],"Finally,":[152],"auxiliary":[154],"supply":[156],"system":[157],"pressurized":[160],"water":[161],"reactor":[162],"NPP":[165],"analyzed":[167],"as":[168],"an":[169],"example":[170],"illustrate":[172],"approach.":[174],"The":[175],"paper":[179],"show":[180],"makes":[184],"more":[188],"accurate":[189],"compared":[190],"without":[194],"analysis.":[197],"Moreover,":[198],"methodology":[201],"applied":[204],"easily":[205],"its":[210],"modified":[211],"functions":[212],"algorithms.":[214]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":13},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":3}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}