{"id":"https://openalex.org/W2403894018","doi":"https://doi.org/10.1109/access.2016.2571278","title":"Signature and Residue Testing of Microprogrammable Control Units","display_name":"Signature and Residue Testing of Microprogrammable Control Units","publication_year":2016,"publication_date":"2016-01-01","ids":{"openalex":"https://openalex.org/W2403894018","doi":"https://doi.org/10.1109/access.2016.2571278","mag":"2403894018"},"language":"en","primary_location":{"id":"doi:10.1109/access.2016.2571278","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2016.2571278","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/7419931/07475873.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/7419931/07475873.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061442209","display_name":"Vadim Geurkov","orcid":"https://orcid.org/0000-0002-4264-4117"},"institutions":[{"id":"https://openalex.org/I530967","display_name":"Toronto Metropolitan University","ror":"https://ror.org/05g13zd79","country_code":"CA","type":"education","lineage":["https://openalex.org/I530967"]}],"countries":["CA"],"is_corresponding":true,"raw_author_name":"Vadim Geurkov","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Ryerson University, Toronto, ON, Canada"],"raw_orcid":"https://orcid.org/0000-0002-4264-4117","affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Ryerson University, Toronto, ON, Canada","institution_ids":["https://openalex.org/I530967"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5061442209"],"corresponding_institution_ids":["https://openalex.org/I530967"],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.04411765,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"4","issue":null,"first_page":"2479","last_page":"2487"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residue-number-system","display_name":"Residue number system","score":0.8456916809082031},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6723012328147888},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.6396549344062805},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5506618618965149},{"id":"https://openalex.org/keywords/arithmetic-logic-unit","display_name":"Arithmetic logic unit","score":0.5449227094650269},{"id":"https://openalex.org/keywords/digital-signature","display_name":"Digital signature","score":0.4978327751159668},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.4857042729854584},{"id":"https://openalex.org/keywords/algebraic-number","display_name":"Algebraic number","score":0.45785248279571533},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.44798216223716736},{"id":"https://openalex.org/keywords/residue","display_name":"Residue (chemistry)","score":0.4369525909423828},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.41662535071372986},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.37996619939804077},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34369856119155884},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3431859016418457},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2917087972164154},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28005725145339966},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.11414200067520142}],"concepts":[{"id":"https://openalex.org/C71480937","wikidata":"https://www.wikidata.org/wiki/Q3086516","display_name":"Residue number system","level":2,"score":0.8456916809082031},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6723012328147888},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.6396549344062805},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5506618618965149},{"id":"https://openalex.org/C100276221","wikidata":"https://www.wikidata.org/wiki/Q192903","display_name":"Arithmetic logic unit","level":2,"score":0.5449227094650269},{"id":"https://openalex.org/C118463975","wikidata":"https://www.wikidata.org/wiki/Q220849","display_name":"Digital signature","level":3,"score":0.4978327751159668},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.4857042729854584},{"id":"https://openalex.org/C9376300","wikidata":"https://www.wikidata.org/wiki/Q168817","display_name":"Algebraic number","level":2,"score":0.45785248279571533},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.44798216223716736},{"id":"https://openalex.org/C2781338088","wikidata":"https://www.wikidata.org/wiki/Q903495","display_name":"Residue (chemistry)","level":2,"score":0.4369525909423828},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.41662535071372986},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37996619939804077},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34369856119155884},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3431859016418457},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2917087972164154},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28005725145339966},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.11414200067520142},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C99138194","wikidata":"https://www.wikidata.org/wiki/Q183427","display_name":"Hash function","level":2,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2016.2571278","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2016.2571278","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/7419931/07475873.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:7c2a8b988959412e89ba5c77993a03f3","is_oa":true,"landing_page_url":"https://doaj.org/article/7c2a8b988959412e89ba5c77993a03f3","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 4, Pp 2479-2487 (2016)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2016.2571278","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2016.2571278","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/7419931/07475873.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2403894018.pdf","grobid_xml":"https://content.openalex.org/works/W2403894018.grobid-xml"},"referenced_works_count":36,"referenced_works":["https://openalex.org/W114927261","https://openalex.org/W1019865458","https://openalex.org/W1479684738","https://openalex.org/W1489870749","https://openalex.org/W1513721953","https://openalex.org/W1532830193","https://openalex.org/W1532938278","https://openalex.org/W1533071485","https://openalex.org/W1581210787","https://openalex.org/W1587217691","https://openalex.org/W1593317987","https://openalex.org/W1603245819","https://openalex.org/W1838197491","https://openalex.org/W1975873725","https://openalex.org/W1981245009","https://openalex.org/W1988793232","https://openalex.org/W2004001391","https://openalex.org/W2029394480","https://openalex.org/W2098655835","https://openalex.org/W2112055553","https://openalex.org/W2122955150","https://openalex.org/W2135499091","https://openalex.org/W2137237783","https://openalex.org/W2141512927","https://openalex.org/W2151186267","https://openalex.org/W2157290399","https://openalex.org/W2163452130","https://openalex.org/W2182112064","https://openalex.org/W2469142762","https://openalex.org/W2488143187","https://openalex.org/W2942537621","https://openalex.org/W4235852214","https://openalex.org/W4243513274","https://openalex.org/W4255195422","https://openalex.org/W4302068331","https://openalex.org/W6682483110"],"related_works":["https://openalex.org/W1494292626","https://openalex.org/W3217430545","https://openalex.org/W2083793411","https://openalex.org/W2088006178","https://openalex.org/W1532891187","https://openalex.org/W2069145203","https://openalex.org/W63550369","https://openalex.org/W2108605716","https://openalex.org/W1560180920","https://openalex.org/W90920108"],"abstract_inverted_index":{"Arithmetic":[0],"and":[1,11,135],"algebraic":[2],"codes":[3,27],"are":[4,56],"used":[5,96,130],"in":[6,131],"testing":[7],"to":[8,45,58,70,83,105,116],"verify":[9],"arithmetic":[10,26,99],"logical":[12],"operations":[13],"performed":[14],"by":[15],"digital":[16,137],"circuits.":[17],"An":[18],"important":[19],"unit":[20],"of":[21,40,62,87,93],"the":[22,38,59,63,72,85,107],"hardware":[23,123],"that":[24,36],"implements":[25],"is":[28,33,95],"a":[29,34,41,46,111],"residue":[30,39,54,73],"generator.":[31],"This":[32],"circuit":[35,109],"generates":[37],"number":[42],"with":[43,75],"respect":[44],"check":[47,64,78],"base.":[48,65,79],"The":[49,125],"existing":[50],"design":[51],"methods":[52],"for":[53,97],"generators":[55,74],"oriented":[57],"special":[60],"values":[61],"We":[66,80,101],"propose":[67],"an":[68,76],"approach":[69],"designing":[71],"arbitrary":[77],"show":[81],"how":[82,104],"reduce":[84],"probability":[86],"error":[88],"escape,":[89],"when":[90],"this":[91],"type":[92],"generator":[94],"detecting":[98],"errors.":[100],"then":[102],"demonstrate":[103],"embed":[106],"designed":[108],"into":[110],"microprogrammable":[112],"finite":[113],"state":[114],"machine":[115],"test":[117,122],"its":[118],"operation":[119],"without":[120],"adding":[121],"overhead.":[124],"proposed":[126],"scheme":[127],"can":[128],"be":[129],"arithmetic/algebraic":[132],"error-control":[133],"coding":[134],"fault-tolerant":[136],"designs.":[138]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-10-10T00:00:00"}