{"id":"https://openalex.org/W2076785907","doi":"https://doi.org/10.1109/access.2013.2259535","title":"Heuristics for Design for Reliability for Electrical and Electronic Products","display_name":"Heuristics for Design for Reliability for Electrical and Electronic Products","publication_year":2013,"publication_date":"2013-01-01","ids":{"openalex":"https://openalex.org/W2076785907","doi":"https://doi.org/10.1109/access.2013.2259535","mag":"2076785907"},"language":"en","primary_location":{"id":"doi:10.1109/access.2013.2259535","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2013.2259535","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6336544/06514817.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6336544/06514817.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5068852241","display_name":"Dev Raheja","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Dev Raheja","raw_affiliation_strings":["Raheja Consulting, Inc., Laurel, MD, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Raheja Consulting, Inc., Laurel, MD, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5068852241"],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.6814,"has_fulltext":true,"cited_by_count":7,"citation_normalized_percentile":{"value":0.76739164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"1","issue":null,"first_page":"63","last_page":"66"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9569000005722046,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9569000005722046,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9230999946594238,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heuristics","display_name":"Heuristics","score":0.9443536400794983},{"id":"https://openalex.org/keywords/warranty","display_name":"Warranty","score":0.8381478786468506},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7567873001098633},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7376866340637207},{"id":"https://openalex.org/keywords/scope","display_name":"Scope (computer science)","score":0.735193133354187},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5342250466346741},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.111596018075943},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.079770028591156}],"concepts":[{"id":"https://openalex.org/C127705205","wikidata":"https://www.wikidata.org/wiki/Q5748245","display_name":"Heuristics","level":2,"score":0.9443536400794983},{"id":"https://openalex.org/C2779056723","wikidata":"https://www.wikidata.org/wiki/Q329717","display_name":"Warranty","level":2,"score":0.8381478786468506},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7567873001098633},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7376866340637207},{"id":"https://openalex.org/C2778012447","wikidata":"https://www.wikidata.org/wiki/Q1034415","display_name":"Scope (computer science)","level":2,"score":0.735193133354187},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5342250466346741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.111596018075943},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.079770028591156},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2013.2259535","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2013.2259535","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6336544/06514817.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c9f3a32a611648a5b7a7e58e8e1345d4","is_oa":true,"landing_page_url":"https://doaj.org/article/c9f3a32a611648a5b7a7e58e8e1345d4","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 1, Pp 63-66 (2013)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2013.2259535","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2013.2259535","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6336544/06514817.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2076785907.pdf","grobid_xml":"https://content.openalex.org/works/W2076785907.grobid-xml"},"referenced_works_count":2,"referenced_works":["https://openalex.org/W232294081","https://openalex.org/W1984506939"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Incomplete":[0],"specifications":[1],"on":[2,56],"new":[3],"products":[4,11],"are":[5,52],"very":[6,28],"common":[7],"resulting":[8],"in":[9,27],"unreliable":[10],"and":[12,16,31],"costly":[13],"scope":[14],"creeps":[15],"design":[17],"changes.":[18],"Designing":[19],"out":[20],"failures":[21],"using":[22],"lessons":[23,44,59],"learned":[24,45,60],"can":[25],"result":[26],"high":[29],"reliability":[30],"significantly":[32],"lower":[33],"warranty":[34],"costs.":[35],"The":[36,64],"quickest":[37],"way":[38],"to":[39,47,68,75],"make":[40],"use":[41],"of":[42],"the":[43,71],"is":[46],"learn":[48],"from":[49,58],"heuristics":[50,72],"which":[51],"short":[53],"statements":[54],"based":[55],"wisdom":[57],"over":[61],"many":[62],"products.":[63,77],"article":[65],"covers":[66],"examples":[67],"show":[69],"how":[70],"were":[73],"applied":[74],"successful":[76]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}