{"id":"https://openalex.org/W2488047487","doi":"https://doi.org/10.1109/acc.2016.7526861","title":"Fault-tolerant observer design with a tolerance measure for systems with sensor failures","display_name":"Fault-tolerant observer design with a tolerance measure for systems with sensor failures","publication_year":2016,"publication_date":"2016-07-01","ids":{"openalex":"https://openalex.org/W2488047487","doi":"https://doi.org/10.1109/acc.2016.7526861","mag":"2488047487"},"language":"en","primary_location":{"id":"doi:10.1109/acc.2016.7526861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acc.2016.7526861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 American Control Conference (ACC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://digitalcollection.zhaw.ch/handle/11475/13424","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100438387","display_name":"Cong Zhang","orcid":"https://orcid.org/0000-0002-6719-7026"},"institutions":[{"id":"https://openalex.org/I47508984","display_name":"Imperial College London","ror":"https://ror.org/041kmwe10","country_code":"GB","type":"education","lineage":["https://openalex.org/I47508984"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Cong Zhang","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Imperial College London, London, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Imperial College London, London, UK","institution_ids":["https://openalex.org/I47508984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083334628","display_name":"Imad M. Jaimoukha","orcid":"https://orcid.org/0000-0002-2971-3149"},"institutions":[{"id":"https://openalex.org/I47508984","display_name":"Imperial College London","ror":"https://ror.org/041kmwe10","country_code":"GB","type":"education","lineage":["https://openalex.org/I47508984"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Imad M. Jaimoukha","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Imperial College London, London, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Imperial College London, London, UK","institution_ids":["https://openalex.org/I47508984"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015768208","display_name":"F\u00e9lix Rafael Segundo Sevilla","orcid":"https://orcid.org/0000-0002-9562-3547"},"institutions":[{"id":"https://openalex.org/I858936495","display_name":"ZHAW Zurich University of Applied Sciences","ror":"https://ror.org/05pmsvm27","country_code":"CH","type":"education","lineage":["https://openalex.org/I858936495"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Felix Rafael Segundo Sevilla","raw_affiliation_strings":["Zurich University of Applied Sciences ZHAW, Winterthur, Switzerland"],"affiliations":[{"raw_affiliation_string":"Zurich University of Applied Sciences ZHAW, Winterthur, Switzerland","institution_ids":["https://openalex.org/I858936495"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100438387"],"corresponding_institution_ids":["https://openalex.org/I47508984"],"apc_list":null,"apc_paid":null,"fwci":0.8121,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.74941255,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"3","issue":null,"first_page":"7523","last_page":"7528"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10046","display_name":"Stability and Control of Uncertain Systems","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.8194205164909363},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.7097043395042419},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6228986978530884},{"id":"https://openalex.org/keywords/observer","display_name":"Observer (physics)","score":0.551302433013916},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46769312024116516},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.26630401611328125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19237986207008362},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.14043840765953064}],"concepts":[{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.8194205164909363},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.7097043395042419},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6228986978530884},{"id":"https://openalex.org/C2780704645","wikidata":"https://www.wikidata.org/wiki/Q9251458","display_name":"Observer (physics)","level":2,"score":0.551302433013916},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46769312024116516},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.26630401611328125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19237986207008362},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.14043840765953064},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/acc.2016.7526861","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acc.2016.7526861","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 American Control Conference (ACC)","raw_type":"proceedings-article"},{"id":"pmh:oai:digitalcollection.zhaw.ch:11475/13424","is_oa":true,"landing_page_url":"https://digitalcollection.zhaw.ch/handle/11475/13424","pdf_url":null,"source":{"id":"https://openalex.org/S4306401811","display_name":"Z\u00fcrcher Hochschule f\u00fcr Angewandte Wissenschaften digital collection (Zurich University of Applied Sciences)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200744771","host_organization_name":"ZHAW Zurich University of Applied Sciences","host_organization_lineage":["https://openalex.org/I200744771"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},{"id":"pmh:oai:spiral.imperial.ac.uk:10044/1/38885","is_oa":false,"landing_page_url":"http://hdl.handle.net/10044/1/38885","pdf_url":null,"source":{"id":"https://openalex.org/S4306401396","display_name":"Spiral (Imperial College London)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I47508984","host_organization_name":"Imperial College London","host_organization_lineage":["https://openalex.org/I47508984"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2016 American Control Conference","raw_type":"Conference Paper"}],"best_oa_location":{"id":"pmh:oai:digitalcollection.zhaw.ch:11475/13424","is_oa":true,"landing_page_url":"https://digitalcollection.zhaw.ch/handle/11475/13424","pdf_url":null,"source":{"id":"https://openalex.org/S4306401811","display_name":"Z\u00fcrcher Hochschule f\u00fcr Angewandte Wissenschaften digital collection (Zurich University of Applied Sciences)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200744771","host_organization_name":"ZHAW Zurich University of Applied Sciences","host_organization_lineage":["https://openalex.org/I200744771"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1588650253","https://openalex.org/W1944329938","https://openalex.org/W1974392705","https://openalex.org/W2024271274","https://openalex.org/W2028209676","https://openalex.org/W2048679451","https://openalex.org/W2061609214","https://openalex.org/W2102878671","https://openalex.org/W2127537763","https://openalex.org/W2127641385","https://openalex.org/W2139494503","https://openalex.org/W2155016471","https://openalex.org/W2167270630","https://openalex.org/W2174883827","https://openalex.org/W2317455300","https://openalex.org/W6699557949"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4255837520","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":{"A":[0],"fault-tolerant":[1,133],"switching":[2],"observer":[3,73,134],"design":[4],"methodology":[5],"is":[6,10,31,39,59,63,87],"proposed.":[7],"The":[8,33,105],"aim":[9],"to":[11,66,76,89,118,127],"maintain":[12],"a":[13,20,42,68,83,109],"desired":[14],"level":[15],"of":[16,22,35,46,80,95,115,131],"closed-loop":[17],"performance":[18,30],"under":[19],"range":[21,34],"sensor":[23],"fault":[24,37,57,69,96],"scenarios":[25,38,97],"while":[26],"the":[27,51,55,60,77,81,92,113,120,129,132],"fault-free":[28],"nominal":[29],"optimized.":[32],"considered":[36],"determined":[40],"by":[41],"minimum":[43],"number":[44,94,114],"p":[45,53],"assumed":[47],"working":[48],"sensors.":[49,104],"Thus":[50],"smaller":[52],"is,":[54],"more":[56],"tolerant":[58],"observer.":[61],"This":[62],"then":[64],"used":[65],"define":[67],"tolerance":[70],"measure":[71],"for":[72,98],"design.":[74,135],"Due":[75],"combinatorial":[78],"nature":[79],"problem,":[82],"semidefinite":[84],"relaxation":[85],"procedure":[86,106],"proposed":[88],"deal":[90],"with":[91],"large":[93],"systems":[99],"that":[100],"have":[101],"many":[102],"vulnerable":[103],"results":[107],"in":[108,112],"significant":[110],"reduction":[111],"constraints":[116],"needed":[117],"solve":[119],"problem.":[121],"Two":[122],"numerical":[123],"examples":[124],"are":[125],"presented":[126],"illustrate":[128],"effectiveness":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2016-08-23T00:00:00"}