{"id":"https://openalex.org/W2116278860","doi":"https://doi.org/10.1109/acc.2007.4282400","title":"Procedure based on mutual information and bayesian networks for the fault diagnosis of industrial systems","display_name":"Procedure based on mutual information and bayesian networks for the fault diagnosis of industrial systems","publication_year":2007,"publication_date":"2007-07-01","ids":{"openalex":"https://openalex.org/W2116278860","doi":"https://doi.org/10.1109/acc.2007.4282400","mag":"2116278860"},"language":"en","primary_location":{"id":"doi:10.1109/acc.2007.4282400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acc.2007.4282400","pdf_url":null,"source":{"id":"https://openalex.org/S4210168941","display_name":"Proceedings of the ... American Control Conference/Proceedings of the American Control Conference","issn_l":"0743-1619","issn":["0743-1619","2378-5861"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 American Control Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://inria.hal.science/inria-00517019","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001086859","display_name":"Sylvain Verron","orcid":"https://orcid.org/0000-0003-2800-2414"},"institutions":[{"id":"https://openalex.org/I49451733","display_name":"Universit\u00e9 d'Angers","ror":"https://ror.org/04yrqp957","country_code":"FR","type":"education","lineage":["https://openalex.org/I49451733"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Sylvain Verron","raw_affiliation_strings":["Lasquo/ISTIA, University of Angers, Angers, France","Univ. of Angers, Angers"],"affiliations":[{"raw_affiliation_string":"Lasquo/ISTIA, University of Angers, Angers, France","institution_ids":["https://openalex.org/I49451733"]},{"raw_affiliation_string":"Univ. of Angers, Angers","institution_ids":["https://openalex.org/I49451733"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011936377","display_name":"T\u00e9odor Tiplica","orcid":"https://orcid.org/0000-0003-1326-5860"},"institutions":[{"id":"https://openalex.org/I49451733","display_name":"Universit\u00e9 d'Angers","ror":"https://ror.org/04yrqp957","country_code":"FR","type":"education","lineage":["https://openalex.org/I49451733"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Teodor Tiplica","raw_affiliation_strings":["Lasquo/ISTIA, University of Angers, Angers, France","Univ. of Angers, Angers"],"affiliations":[{"raw_affiliation_string":"Lasquo/ISTIA, University of Angers, Angers, France","institution_ids":["https://openalex.org/I49451733"]},{"raw_affiliation_string":"Univ. of Angers, Angers","institution_ids":["https://openalex.org/I49451733"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5046375974","display_name":"Abdessamad Kobi","orcid":"https://orcid.org/0000-0003-4079-1989"},"institutions":[{"id":"https://openalex.org/I49451733","display_name":"Universit\u00e9 d'Angers","ror":"https://ror.org/04yrqp957","country_code":"FR","type":"education","lineage":["https://openalex.org/I49451733"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Abdessamad Kobi","raw_affiliation_strings":["Lasquo/ISTIA, University of Angers, Angers, France","Univ. of Angers, Angers"],"affiliations":[{"raw_affiliation_string":"Lasquo/ISTIA, University of Angers, Angers, France","institution_ids":["https://openalex.org/I49451733"]},{"raw_affiliation_string":"Univ. of Angers, Angers","institution_ids":["https://openalex.org/I49451733"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5001086859"],"corresponding_institution_ids":["https://openalex.org/I49451733"],"apc_list":null,"apc_paid":null,"fwci":3.3848,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.92061281,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"12","issue":null,"first_page":"420","last_page":"425"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14470","display_name":"Advanced Data Processing Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9722999930381775,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bayesian-network","display_name":"Bayesian network","score":0.7664101123809814},{"id":"https://openalex.org/keywords/mutual-information","display_name":"Mutual information","score":0.750758171081543},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6849268674850464},{"id":"https://openalex.org/keywords/variable","display_name":"Variable (mathematics)","score":0.6769092679023743},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6210681200027466},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5496498346328735},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5172113180160522},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5140427350997925},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5062262415885925},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4559292793273926},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.4440319240093231},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3615730106830597},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16558122634887695}],"concepts":[{"id":"https://openalex.org/C33724603","wikidata":"https://www.wikidata.org/wiki/Q812540","display_name":"Bayesian network","level":2,"score":0.7664101123809814},{"id":"https://openalex.org/C152139883","wikidata":"https://www.wikidata.org/wiki/Q252973","display_name":"Mutual information","level":2,"score":0.750758171081543},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6849268674850464},{"id":"https://openalex.org/C182365436","wikidata":"https://www.wikidata.org/wiki/Q50701","display_name":"Variable (mathematics)","level":2,"score":0.6769092679023743},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6210681200027466},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5496498346328735},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5172113180160522},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5140427350997925},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5062262415885925},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4559292793273926},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.4440319240093231},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3615730106830597},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16558122634887695},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/acc.2007.4282400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/acc.2007.4282400","pdf_url":null,"source":{"id":"https://openalex.org/S4210168941","display_name":"Proceedings of the ... American Control Conference/Proceedings of the American Control Conference","issn_l":"0743-1619","issn":["0743-1619","2378-5861"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 American Control Conference","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:inria-00517019v1","is_oa":true,"landing_page_url":"https://inria.hal.science/inria-00517019","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"American Control Conference (ACC'07), 2007, NewYork, United States","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:inria-00517019v1","is_oa":true,"landing_page_url":"https://inria.hal.science/inria-00517019","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"American Control Conference (ACC'07), 2007, NewYork, United States","raw_type":"Conference papers"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W155240222","https://openalex.org/W168332103","https://openalex.org/W261217721","https://openalex.org/W1490760466","https://openalex.org/W1507029541","https://openalex.org/W1605844890","https://openalex.org/W1625504505","https://openalex.org/W1817561967","https://openalex.org/W1965733010","https://openalex.org/W1968714600","https://openalex.org/W1979357005","https://openalex.org/W1982499516","https://openalex.org/W1989087337","https://openalex.org/W1991519797","https://openalex.org/W1993694278","https://openalex.org/W1995875735","https://openalex.org/W1997177391","https://openalex.org/W2004186751","https://openalex.org/W2010001505","https://openalex.org/W2012914747","https://openalex.org/W2038900147","https://openalex.org/W2057283314","https://openalex.org/W2062346783","https://openalex.org/W2072080277","https://openalex.org/W2091311817","https://openalex.org/W2101782549","https://openalex.org/W2113001205","https://openalex.org/W2119394710","https://openalex.org/W2122111042","https://openalex.org/W2156909104","https://openalex.org/W2159080219","https://openalex.org/W2163166770","https://openalex.org/W2166042538","https://openalex.org/W2171265988","https://openalex.org/W2278807966","https://openalex.org/W2979006918","https://openalex.org/W3006549497","https://openalex.org/W3146404850","https://openalex.org/W4205687621","https://openalex.org/W4249625715","https://openalex.org/W4297792526","https://openalex.org/W6606875022","https://openalex.org/W6636859864","https://openalex.org/W6676989698","https://openalex.org/W6695019709","https://openalex.org/W6768650569"],"related_works":["https://openalex.org/W2466816617","https://openalex.org/W1970834875","https://openalex.org/W842936808","https://openalex.org/W3174028392","https://openalex.org/W2000517284","https://openalex.org/W2365318811","https://openalex.org/W2136503713","https://openalex.org/W2375330620","https://openalex.org/W2947924654","https://openalex.org/W3036482021"],"abstract_inverted_index":{"The":[0,18],"aim":[1],"of":[2,24,42,63],"this":[3,43,52],"paper":[4],"is":[5,31],"to":[6,33],"present":[7],"a":[8,15],"new":[9],"method":[10],"for":[11],"process":[12,54],"diagnosis":[13],"using":[14],"Bayesian":[16],"network.":[17],"mutual":[19],"information":[20],"between":[21],"each":[22],"variable":[23,30],"the":[25,28,35,40,47,66],"system":[26],"and":[27],"class":[29],"computed":[32],"identify":[34],"important":[36],"variables.":[37],"To":[38],"illustrate":[39],"performances":[41],"method,":[44],"we":[45,57],"use":[46],"Tennessee":[48],"Eastman":[49],"Process.":[50],"For":[51],"complex":[53],"(51":[55],"variables),":[56],"take":[58],"into":[59],"account":[60],"three":[61],"kinds":[62],"faults":[64],"with":[65],"minimal":[67],"recognition":[68],"error":[69],"rate":[70],"objective.":[71]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}