{"id":"https://openalex.org/W4406894676","doi":"https://doi.org/10.1109/a-sscc60305.2024.10848887","title":"A 13.75-14.75-GHz 32.1-fs<sub>RMS</sub> Jitter -100.6-dBc Reference Spur -261.4-dB FoM Sub-Sampling PLL Using a KPD-Doubled Isolated Sub-Sampling Phase Detector for Reliable Spur-Jitter-Joint Optimization","display_name":"A 13.75-14.75-GHz 32.1-fs<sub>RMS</sub> Jitter -100.6-dBc Reference Spur -261.4-dB FoM Sub-Sampling PLL Using a KPD-Doubled Isolated Sub-Sampling Phase Detector for Reliable Spur-Jitter-Joint Optimization","publication_year":2024,"publication_date":"2024-11-18","ids":{"openalex":"https://openalex.org/W4406894676","doi":"https://doi.org/10.1109/a-sscc60305.2024.10848887"},"language":"en","primary_location":{"id":"doi:10.1109/a-sscc60305.2024.10848887","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc60305.2024.10848887","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100586687","display_name":"Yiqing Xu","orcid":"https://orcid.org/0009-0000-7099-8935"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiqing Xu","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059902560","display_name":"Yixi Li","orcid":"https://orcid.org/0000-0003-0573-7784"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yixi Li","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100423044","display_name":"Zhao Zhang","orcid":"https://orcid.org/0000-0002-9009-9045"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao Zhang","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114831924","display_name":"N. D. Qi","orcid":"https://orcid.org/0000-0002-2267-620X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nan Qi","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100414628","display_name":"Jian Liu","orcid":"https://orcid.org/0000-0001-8057-2444"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Liu","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110665174","display_name":"Nanjian Wu","orcid":"https://orcid.org/0000-0001-8022-0262"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Nanjian Wu","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100657035","display_name":"Liyuan Liu","orcid":"https://orcid.org/0000-0003-2585-323X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyuan Liu","raw_affiliation_strings":["Institute of Semiconductors,Chinese Academy of Sciences,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors,Chinese Academy of Sciences,China","institution_ids":["https://openalex.org/I4210149211","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dbc","display_name":"dBc","score":0.9152828454971313},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8210798501968384},{"id":"https://openalex.org/keywords/spur","display_name":"Spur","score":0.7275043725967407},{"id":"https://openalex.org/keywords/phase-locked-loop","display_name":"Phase-locked loop","score":0.6494203209877014},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5399541854858398},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4706384837627411},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.46629825234413147},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3600505590438843},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.35513168573379517},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2695431709289551},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14510315656661987}],"concepts":[{"id":"https://openalex.org/C193523891","wikidata":"https://www.wikidata.org/wiki/Q1771950","display_name":"dBc","level":3,"score":0.9152828454971313},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8210798501968384},{"id":"https://openalex.org/C2779821383","wikidata":"https://www.wikidata.org/wiki/Q7581537","display_name":"Spur","level":2,"score":0.7275043725967407},{"id":"https://openalex.org/C12707504","wikidata":"https://www.wikidata.org/wiki/Q52637","display_name":"Phase-locked loop","level":3,"score":0.6494203209877014},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5399541854858398},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4706384837627411},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.46629825234413147},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3600505590438843},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.35513168573379517},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2695431709289551},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14510315656661987},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/a-sscc60305.2024.10848887","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc60305.2024.10848887","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7200000286102295,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W3132889034","https://openalex.org/W4312261872","https://openalex.org/W4312887945","https://openalex.org/W4319996415","https://openalex.org/W4376133983","https://openalex.org/W4389880390","https://openalex.org/W4394711750","https://openalex.org/W6852448943"],"related_works":["https://openalex.org/W1994021281","https://openalex.org/W2540832666","https://openalex.org/W4286579627","https://openalex.org/W2139484866","https://openalex.org/W1851259350","https://openalex.org/W272184114","https://openalex.org/W2117747481","https://openalex.org/W2394282069","https://openalex.org/W2776212486","https://openalex.org/W4404353518"],"abstract_inverted_index":{"With":[0],"the":[1,5,25,62,74,78,82,86,95,100,111,137,155,164,174,185,214,251],"continuous":[2],"increase":[3],"in":[4,46,110,139,200],"communication":[6],"data":[7],"rate,":[8],"low-jitter":[9,150],"phase-locked":[10],"loop":[11],"(PLL)":[12],"is":[13],"increasingly":[14],"becoming":[15],"significant":[16],"for":[17],"ultra-high-speed":[18],"wireless":[19],"or":[20],"wireline":[21],"transceivers":[22],"[1],":[23],"namely":[24],"concurrent":[26],"realization":[27],"of":[28,64,85,157,187,198],"low":[29,32,55,58,126,176],"jitter":[30,42,56,128,177,225],"and":[31,57,69,94,123,144,154,226,246],"spur.":[33,212],"The":[34,48,113],"most":[35],"advanced":[36],"PLL":[37,51,115,138,170,216],"design":[38],"has":[39],"achieved":[40],"sub-50-fs":[41],"[2\u20136],":[43],"as":[44],"summarized":[45],"Fig.1.":[47],"reference":[49,66,79,101,189],"sampling":[50,97,114,132],"(RS-PLL)":[52],"[2]":[53],"achieves":[54,124,173,223],"power":[59,182],"due":[60,183],"to":[61,81,99,107,147,166,184,208,249,254,264],"removal":[63],"input":[65],"clock":[67,75,80,102,127,190],"buffer":[68],"its":[70,91,201,237],"simple":[71],"architecture.":[72],"But":[73],"feedthrough":[76,207],"from":[77,103],"tuning":[83],"voltage":[84],"voltage-controlled":[87],"oscillator":[88],"(VCO)":[89],"limits":[90],"spur":[92,165,228],"performance,":[93],"direct":[96],"operation":[98],"crystal":[104],"induces":[105],"disturbance":[106],"other":[108],"blocks":[109],"system.":[112],"(S-PLL)":[116],"[3,":[117],"4]":[118],"can":[119],"avoid":[120],"these":[121],"issues,":[122],"very":[125],"using":[129],"a":[130,142,149,231,257,265,269],"double-edge":[131],"phase":[133],"detector":[134],"(PD);":[135],"yet,":[136],"[3]":[140],"requires":[141],"complicated":[143],"power-hungry":[145],"retimer":[146],"realize":[148],"high-frequency":[151],"divider":[152,234],"chain,":[153],"mismatch":[156],"duty":[158],"cycle":[159],"correction":[160],"(DCC)":[161],"circuit":[162],"degrades":[163],">-70":[167],"dBc.":[168],"Multi-reference":[169],"(MR-PLL)":[171],"[5]":[172],"state-of-the-art":[175],"but":[178],"it":[179],"consumes":[180],"huge":[181],"adoption":[186],"multiple":[188,193,202],"sources":[191],"with":[192,218,230,256,268],"SPDs;":[194],"meanwhile,":[195],"large":[196],"numbers":[197],"switches":[199],"SPDs":[203],"also":[204],"cause":[205],"higher-level":[206],"VCO,":[209],"thus":[210],"limiting":[211],"Alternatively,":[213],"sub-sampling":[215],"(SS-PLL)":[217],"isolation":[219],"subsampling":[220],"PD":[221],"(iSSPD)":[222],"sub-35-fs":[224],"$\\lt-90-\\mathrm{dBc}$":[227],"concurrently":[229],"low-power":[232],"retime-less":[233],"[6].":[235],"However,":[236],"spur-jitter-joint":[238],"optimization":[239],"relies":[240],"on":[241],"an":[242],"ultra-high":[243],"VCO":[244,255,272],"swing":[245],"small-sized":[247],"iSSPD":[248,259],"suppress":[250],"PD\u2019s":[252],"interference":[253],"sufficient":[258],"gain":[260],"(KPD),":[261],"hence":[262],"leading":[263],"reliability":[266],"issue":[267],"relatively":[270],"high":[271],"power.":[273]},"counts_by_year":[{"year":2025,"cited_by_count":4}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}