{"id":"https://openalex.org/W4389888381","doi":"https://doi.org/10.1109/a-sscc58667.2023.10348002","title":"An 18-nW, 170\u00b0C Temperature Range, Voltage and Current Reference Circuit with Low Line Sensitivity","display_name":"An 18-nW, 170\u00b0C Temperature Range, Voltage and Current Reference Circuit with Low Line Sensitivity","publication_year":2023,"publication_date":"2023-11-05","ids":{"openalex":"https://openalex.org/W4389888381","doi":"https://doi.org/10.1109/a-sscc58667.2023.10348002"},"language":"en","primary_location":{"id":"doi:10.1109/a-sscc58667.2023.10348002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc58667.2023.10348002","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064007776","display_name":"I-Fan Lin","orcid":"https://orcid.org/0000-0003-1895-6425"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"I-Fan Lin","raw_affiliation_strings":["Institute of Electrical and Computer Engineering, National Yang Mina Chiao Tuna University"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical and Computer Engineering, National Yang Mina Chiao Tuna University","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111215860","display_name":"Yu-Chu Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I129775632","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I129775632"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu-Chu Tsai","raw_affiliation_strings":["uPI Semiconductor Corp"],"affiliations":[{"raw_affiliation_string":"uPI Semiconductor Corp","institution_ids":["https://openalex.org/I129775632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015025816","display_name":"Heng-Li Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I129775632","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I129775632"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Heng-Li Lin","raw_affiliation_strings":["uPI Semiconductor Corp"],"affiliations":[{"raw_affiliation_string":"uPI Semiconductor Corp","institution_ids":["https://openalex.org/I129775632"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066171565","display_name":"Yu\u2010Te Liao","orcid":"https://orcid.org/0000-0002-6868-6729"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yu-Te Liao","raw_affiliation_strings":["Institute of Electrical and Computer Engineering, National Yang Mina Chiao Tuna University"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical and Computer Engineering, National Yang Mina Chiao Tuna University","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5064007776"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5625,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.62995192,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/constant-power-circuit","display_name":"Constant power circuit","score":0.6463544368743896},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6003208160400391},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5848115086555481},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5593996047973633},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5210899114608765},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5169669985771179},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4899365305900574},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4837055802345276},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.47728291153907776},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4598989486694336},{"id":"https://openalex.org/keywords/battery","display_name":"Battery (electricity)","score":0.44299063086509705},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4284055233001709},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.403693825006485},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.398434579372406},{"id":"https://openalex.org/keywords/switched-mode-power-supply","display_name":"Switched-mode power supply","score":0.3362523317337036},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2801032066345215},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1204507052898407}],"concepts":[{"id":"https://openalex.org/C29586797","wikidata":"https://www.wikidata.org/wiki/Q5163663","display_name":"Constant power circuit","level":4,"score":0.6463544368743896},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6003208160400391},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5848115086555481},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5593996047973633},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5210899114608765},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5169669985771179},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4899365305900574},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4837055802345276},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.47728291153907776},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4598989486694336},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.44299063086509705},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4284055233001709},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.403693825006485},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.398434579372406},{"id":"https://openalex.org/C151799858","wikidata":"https://www.wikidata.org/wiki/Q587008","display_name":"Switched-mode power supply","level":3,"score":0.3362523317337036},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2801032066345215},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1204507052898407},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/a-sscc58667.2023.10348002","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc58667.2023.10348002","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2592861018","https://openalex.org/W2960368580","https://openalex.org/W2965577611","https://openalex.org/W3041872181","https://openalex.org/W3089542014","https://openalex.org/W3094010898","https://openalex.org/W4312904656"],"related_works":["https://openalex.org/W2377316420","https://openalex.org/W2993273902","https://openalex.org/W2140934376","https://openalex.org/W3192598553","https://openalex.org/W2366164503","https://openalex.org/W2360143978","https://openalex.org/W2348347523","https://openalex.org/W2375362099","https://openalex.org/W2362716434","https://openalex.org/W2178833141"],"abstract_inverted_index":{"In":[0],"Internet-of-Things":[1],"applications,":[2],"there":[3],"is":[4,40],"an":[5],"increasing":[6],"focus":[7],"on":[8,43],"power":[9,20],"efficiency":[10],"and":[11,48,72,90,95],"small":[12,25,75],"form":[13],"factors":[14],"in":[15],"electronics.":[16],"Designing":[17],"for":[18],"low":[19,63],"consumption":[21],"involves":[22],"using":[23],"a":[24,30,45,53,68,74],"volume":[26],"battery":[27],"while":[28],"maintaining":[29],"long":[31],"operational":[32],"time.":[33],"The":[34],"reliability":[35],"of":[36,83,93],"the":[37,84,88],"electrical":[38],"circuits":[39],"highly":[41],"dependent":[42],"having":[44],"stable":[46,66],"voltage":[47,94],"current":[49],"reference":[50,54],"(VCR).":[51],"For":[52],"circuit":[55],"to":[56,61],"be":[57,62],"well-designed,":[58],"it":[59],"needs":[60],"power,":[64],"supply-independent,":[65],"over":[67],"wide":[69],"temperature":[70],"range,":[71],"occupy":[73],"chip":[76],"area.":[77],"Integrated":[78],"VCRs":[79],"are":[80],"appealing":[81],"because":[82],"strong":[85],"correlation":[86],"between":[87],"local":[89],"global":[91],"distributions":[92],"current.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}