{"id":"https://openalex.org/W4389880374","doi":"https://doi.org/10.1109/a-sscc58667.2023.10347967","title":"A PAM4 Level Mismatch Adjustment Scheme for 48-Gb/s PAM4 Memory Tester Bridge","display_name":"A PAM4 Level Mismatch Adjustment Scheme for 48-Gb/s PAM4 Memory Tester Bridge","publication_year":2023,"publication_date":"2023-11-05","ids":{"openalex":"https://openalex.org/W4389880374","doi":"https://doi.org/10.1109/a-sscc58667.2023.10347967"},"language":"en","primary_location":{"id":"doi:10.1109/a-sscc58667.2023.10347967","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/a-sscc58667.2023.10347967","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025227586","display_name":"Daeho Yun","orcid":"https://orcid.org/0000-0003-4577-1653"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]},{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Daeho Yun","raw_affiliation_strings":["Seoul National University,Seoul,Korea","Seoul National University, Seoul, Korea","SK Hynix, Icheon, Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100646722","display_name":"Minsu Park","orcid":"https://orcid.org/0000-0001-8429-8999"},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Minsu Park","raw_affiliation_strings":["SK Hynix,Icheon,Korea","SK Hynix, Icheon, Korea"],"affiliations":[{"raw_affiliation_string":"SK Hynix,Icheon,Korea","institution_ids":["https://openalex.org/I134353371"]},{"raw_affiliation_string":"SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028191167","display_name":"Kahyun Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kahyun Kim","raw_affiliation_strings":["Seoul National University,Seoul,Korea","Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021926110","display_name":"Kyungmin Baek","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungmin Baek","raw_affiliation_strings":["Seoul National University,Seoul,Korea","Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040701430","display_name":"Eonhui Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I134353371","display_name":"SK Group (South Korea)","ror":"https://ror.org/03696td91","country_code":"KR","type":"company","lineage":["https://openalex.org/I134353371"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eonhui Lee","raw_affiliation_strings":["SK Hynix,Icheon,Korea","SK Hynix, Icheon, Korea"],"affiliations":[{"raw_affiliation_string":"SK Hynix,Icheon,Korea","institution_ids":["https://openalex.org/I134353371"]},{"raw_affiliation_string":"SK Hynix, Icheon, Korea","institution_ids":["https://openalex.org/I134353371"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061470672","display_name":"Woo\u2010Seok Choi","orcid":"https://orcid.org/0000-0002-3556-8689"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woo-Seok Choi","raw_affiliation_strings":["Seoul National University,Seoul,Korea","Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008010401","display_name":"Deog\u2010Kyoon Jeong","orcid":"https://orcid.org/0000-0003-0436-703X"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Deog-Kyoon Jeong","raw_affiliation_strings":["Seoul National University,Seoul,Korea","Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]},{"raw_affiliation_string":"Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5025227586"],"corresponding_institution_ids":["https://openalex.org/I134353371","https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.607,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66022396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6346846222877502},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.575591504573822},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4904477298259735},{"id":"https://openalex.org/keywords/memory-controller","display_name":"Memory controller","score":0.46779876947402954},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45073121786117554},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.42506444454193115},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40288734436035156},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34341204166412354},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.2840978503227234},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2801520824432373},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.09114459156990051}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6346846222877502},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.575591504573822},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4904477298259735},{"id":"https://openalex.org/C100800780","wikidata":"https://www.wikidata.org/wiki/Q1175867","display_name":"Memory controller","level":3,"score":0.46779876947402954},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45073121786117554},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.42506444454193115},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40288734436035156},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34341204166412354},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.2840978503227234},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2801520824432373},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.09114459156990051},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/a-sscc58667.2023.10347967","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/a-sscc58667.2023.10347967","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4300000071525574,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2592571780","https://openalex.org/W3048038487","https://openalex.org/W3116643975","https://openalex.org/W4200210971","https://openalex.org/W4225638457"],"related_works":["https://openalex.org/W4285141256","https://openalex.org/W2140395285","https://openalex.org/W2378723050","https://openalex.org/W2993657534","https://openalex.org/W2317123011","https://openalex.org/W2184185181","https://openalex.org/W2185658074","https://openalex.org/W4285245242","https://openalex.org/W1538192172","https://openalex.org/W2090814603"],"abstract_inverted_index":{"With":[0],"the":[1,18,52,55,58,97,109,116,125,136,141,145,154,160,186,202,209,214,237],"ever-increasing":[2],"bandwidth":[3,191],"of":[4,20,54,92,119,140,159,162,204,236],"memory":[5,21,32,56,155],"interfaces,":[6],"including":[7],"GDDR,":[8],"securing":[9],"link":[10],"margins":[11],"is":[12,47,104],"becoming":[13],"more":[14],"critical.":[15],"Starting":[16],"with":[17,40,57,180,194],"production":[19],"that":[22,184],"employs":[23],"Pulse":[24],"Amplitude":[25],"Modulation-4":[26],"(PAM4)":[27],"such":[28,95],"as":[29,96,112,114,166,168],"GDDR6X,":[30],"each":[31],"manufacturer":[33],"aims":[34],"at":[35,149,219],"designing":[36],"a":[37],"robust":[38],"interface":[39],"PAM4":[41,79,146,210,238],"signaling.":[42],"However,":[43,152],"direct":[44],"test":[45,67,121,196],"equipment":[46],"not":[48,77],"available":[49],"to":[50,87,107,144],"verify":[51],"operation":[53],"controller.":[59],"For":[60],"example,":[61],"T5511":[62],"(ADVANTEST)":[63],"Tester,":[64],"an":[65,176],"existing":[66,195],"solution":[68],"using":[69],"Automatic":[70],"Test":[71,74],"Equipment/System":[72],"Level":[73,163],"(ATE/SLT),":[75],"does":[76],"support":[78],"signaling":[80],"and":[81,189,224,228,233],"testable":[82],"data":[83],"rates":[84],"are":[85],"limited":[86],"8":[88],"Gbps.":[89],"Therefore,":[90],"development":[91],"innovative":[93],"methods":[94],"Built-Out":[98],"Self-Test":[99],"chip":[100,102],"(BOST)":[101],"[1]":[103],"being":[105],"designed":[106],"ease":[108],"high-speed":[110],"testing":[111,153],"well":[113,167],"reducing":[115],"increased":[117],"cost":[118],"new":[120],"equipment.":[122,197],"Moreover,":[123],"in":[124,192,208],"previous":[126],"work":[127],"[2],":[128],"constant":[129],"impedance":[130,169],"matching":[131],"was":[132],"achieved":[133],"by":[134],"applying":[135],"current":[137],"mode":[138],"type":[139],"PMOS":[142],"input":[143],"TX":[147],"operating":[148],"high":[150],"speed.":[151],"requires":[156],"adjustable":[157],"tuning":[158],"Ratio":[161],"Mismatch":[164],"(RLM)":[165],"matching.":[170],"In":[171,198],"this":[172],"paper,":[173],"we":[174,200],"propose":[175],"optimal":[177],"bridge":[178,217],"architecture":[179],"all":[181],"necessary":[182],"functions":[183],"satisfies":[185],"extended":[187],"function":[188],"higher":[190],"conjunction":[193],"addition,":[199],"describe":[201],"method":[203],"output":[205],"level":[206],"adjustment":[207],"driver":[211],"for":[212,231],"improved":[213],"RLM.":[215],"The":[216],"operates":[218],"48":[220],"Gbps":[221],"per":[222],"pin":[223],"consumes":[225],"1.85":[226],"pJ/bit":[227,230],"2.97":[229],"write":[232],"read":[234],"modes":[235],"memory,":[239],"respectively.":[240]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}