{"id":"https://openalex.org/W4200412993","doi":"https://doi.org/10.1109/a-sscc53895.2021.9634809","title":"An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator without Accuracy Loss in 28nm CMOS","display_name":"An Efficient and Reliable Negative Margin Timing Error Detection for Neural Network Accelerator without Accuracy Loss in 28nm CMOS","publication_year":2021,"publication_date":"2021-11-07","ids":{"openalex":"https://openalex.org/W4200412993","doi":"https://doi.org/10.1109/a-sscc53895.2021.9634809"},"language":"en","primary_location":{"id":"doi:10.1109/a-sscc53895.2021.9634809","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc53895.2021.9634809","pdf_url":null,"source":{"id":"https://openalex.org/S4363608516","display_name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100753802","display_name":"Ziyu Li","orcid":"https://orcid.org/0000-0002-2916-9032"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ziyu Li","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057291086","display_name":"Weiwei Shan","orcid":"https://orcid.org/0000-0001-5520-1326"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiwei Shan","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012017810","display_name":"Chengjun Wu","orcid":"https://orcid.org/0000-0001-8512-9783"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chengjun Wu","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034772857","display_name":"Haitao Ge","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haitao Ge","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030384645","display_name":"Jun Yang","orcid":"https://orcid.org/0000-0002-8379-0321"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["National ASIC System Engineering Research Center, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"National ASIC System Engineering Research Center, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100753802"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":2.1637,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.88102757,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.7851756811141968},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7318309545516968},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.679012656211853},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.5539867281913757},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.45083415508270264},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3361991047859192},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3239206075668335},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.2692070007324219},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.12848687171936035},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12551885843276978}],"concepts":[{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.7851756811141968},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7318309545516968},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.679012656211853},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.5539867281913757},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.45083415508270264},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3361991047859192},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3239206075668335},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2692070007324219},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.12848687171936035},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12551885843276978}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/a-sscc53895.2021.9634809","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc53895.2021.9634809","pdf_url":null,"source":{"id":"https://openalex.org/S4363608516","display_name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.9200000166893005}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2808976322","https://openalex.org/W2906803890","https://openalex.org/W2944830921","https://openalex.org/W2969032972","https://openalex.org/W2986931132","https://openalex.org/W3015443050"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W3125011624","https://openalex.org/W1508631387","https://openalex.org/W2370917603","https://openalex.org/W2952760143","https://openalex.org/W2017776670","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W2109445684","https://openalex.org/W2081082331"],"abstract_inverted_index":{"Energy-efficient":[0],"neural":[1],"network":[2],"(NN)":[3],"accelerators":[4,40,64],"are":[5],"essential":[6],"for":[7,95],"IoT":[8],"and":[9,29,107,130,159],"mobile":[10],"applications,":[11],"where":[12],"PVT":[13],"variations":[14],"become":[15],"severe":[16],"especially":[17],"in":[18,102,163],"near-threshold":[19],"voltage":[20,34,134],"(NTV)":[21],"range.":[22],"Recent":[23],"work":[24],"[1]\u2013[4]":[25],"applied":[26,162],"error":[27,68],"detection":[28],"correction":[30],"(EDAC)":[31],"based":[32],"adaptive":[33,108],"frequency":[35],"scaling":[36],"(AVFS)":[37],"on":[38],"NN":[39,63,77,143],"to":[41,65,81,98,115],"eliminate":[42],"the":[43,59,67,117,126,133],"excess":[44],"timing":[45,53,82,87],"margins":[46],"while":[47],"decreasing":[48],"power":[49],"supply":[50],"until":[51,135],"detecting":[52],"violations":[54],"(Fig.":[55],"1).":[56],"By":[57],"using":[58],"fault":[60],"tolerance":[61,80],"of":[62,93,138],"avoid":[66],"correction,":[69],"they":[70],"increased":[71],"energy":[72],"efficiency":[73],"a":[74,85],"lot.":[75],"However,":[76,142],"has":[78],"limited":[79],"errors":[83,88],"since":[84],"little":[86],"will":[89],"cause":[90],"serious":[91],"loss":[92,101,119],"accuracy,":[94],"example,":[96],"up":[97],"3%":[99],"accuracy":[100,118],"MNIST":[103],"[2].":[104],"Body":[105],"swapping":[106],"clock":[109],"techniques":[110],"have":[111,147],"also":[112],"been":[113],"adopted":[114],"reduce":[116],"[3\u2013":[120],"4].":[121],"Traditional":[122],"AVFS":[123],"system":[124],"monitors":[125],"most":[127],"critical":[128,145],"paths":[129,146],"then":[131],"decreases":[132],"reaching":[136],"point":[137],"first":[139],"failure":[140],"(PoFF).":[141],"accelerator\u2019s":[144],"distinct":[148],"characteristics":[149],"from":[150],"conventional":[151],"circuits":[152],"that":[153],"makes":[154],"common":[155],"EDAC":[156],"not":[157],"efficient":[158],"risky":[160],"when":[161],"NN.":[164]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}