{"id":"https://openalex.org/W3127034191","doi":"https://doi.org/10.1109/a-sscc48613.2020.9336121","title":"A 0.5-to-1.2V, 310nA Quiescent Current, 3fs-FoM Time-Domain Output-Capacitorless LDO with Propagation-Delay-Triggered Edge Detector","display_name":"A 0.5-to-1.2V, 310nA Quiescent Current, 3fs-FoM Time-Domain Output-Capacitorless LDO with Propagation-Delay-Triggered Edge Detector","publication_year":2020,"publication_date":"2020-11-09","ids":{"openalex":"https://openalex.org/W3127034191","doi":"https://doi.org/10.1109/a-sscc48613.2020.9336121","mag":"3127034191"},"language":"en","primary_location":{"id":"doi:10.1109/a-sscc48613.2020.9336121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc48613.2020.9336121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101894277","display_name":"Jianming Zhao","orcid":"https://orcid.org/0000-0003-3192-8867"},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jianming Zhao","raw_affiliation_strings":["Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore","institution_ids":["https://openalex.org/I115228651","https://openalex.org/I4210090209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075642035","display_name":"Yuan Gao","orcid":"https://orcid.org/0000-0002-0832-2982"},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yuan Gao","raw_affiliation_strings":["Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore","institution_ids":["https://openalex.org/I115228651","https://openalex.org/I4210090209"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4357,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.60017621,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7348712682723999},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6215280890464783},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5240585803985596},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5037431120872498},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.475516140460968},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.4749072790145874},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.4681079089641571},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44430315494537354},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4411267638206482},{"id":"https://openalex.org/keywords/propagation-delay","display_name":"Propagation delay","score":0.4356372654438019},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3325963616371155},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.22896042466163635}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7348712682723999},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6215280890464783},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5240585803985596},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5037431120872498},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.475516140460968},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.4749072790145874},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.4681079089641571},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44430315494537354},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4411267638206482},{"id":"https://openalex.org/C90806461","wikidata":"https://www.wikidata.org/wiki/Q1144416","display_name":"Propagation delay","level":2,"score":0.4356372654438019},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3325963616371155},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.22896042466163635}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/a-sscc48613.2020.9336121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/a-sscc48613.2020.9336121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Asian Solid-State Circuits Conference (A-SSCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8799999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2257776589","display_name":null,"funder_award_id":"IAF311022","funder_id":"https://openalex.org/F4320335846","funder_display_name":"Biomedical Research Council"}],"funders":[{"id":"https://openalex.org/F4320320696","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09"},{"id":"https://openalex.org/F4320335846","display_name":"Biomedical Research Council","ror":"https://ror.org/03xy0wx88"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2198645257","https://openalex.org/W2044867305","https://openalex.org/W3161676474","https://openalex.org/W2049207285","https://openalex.org/W1965493748","https://openalex.org/W67296738","https://openalex.org/W2773332960","https://openalex.org/W2100835485","https://openalex.org/W4389383638","https://openalex.org/W2478853198"],"abstract_inverted_index":{"A":[0,14],"time-domain":[1,28],"output-capacitorless":[2],"LDO":[3,23,45,56],"for":[4],"low":[5],"power":[6],"IoT":[7],"application":[8],"is":[9],"presented":[10],"in":[11,49],"this":[12],"paper.":[13],"fully":[15],"differential":[16],"voltage-controlled":[17],"oscillator":[18],"(DVCO)":[19],"comparator":[20,36],"converts":[21],"the":[22,44,55,65,73,81],"output":[24],"error":[25],"voltage":[26],"to":[27,42,80],"signal":[29],"and":[30,72],"then":[31],"processed":[32],"by":[33],"a":[34,50,58],"frequency":[35],"(FC)":[37],"with":[38,64],"propagation-delay-triggered":[39],"edge":[40],"detectors":[41],"control":[43],"pass":[46],"transistor.":[47],"Fabricated":[48],"standard":[51],"65nm":[52],"CMOS":[53],"process,":[54],"achieves":[57],"0.003ps":[59],"Figure":[60],"of":[61,70],"Merit":[62],"(FOM)":[63],"lowest":[66],"reported":[67],"quiescent":[68],"current":[69],"310nA":[71],"largest":[74],"load":[75],"dynamic":[76],"range":[77],"(1,250,000)":[78],"compared":[79],"recent":[82],"prior-arts.":[83]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}