{"id":"https://openalex.org/W2169145031","doi":"https://doi.org/10.1109/4.726565","title":"A 220-mm/sup 2/, four- and eight-bank, 256-Mb SDRAM with single-sided stitched WL architecture","display_name":"A 220-mm/sup 2/, four- and eight-bank, 256-Mb SDRAM with single-sided stitched WL architecture","publication_year":1998,"publication_date":"1998-01-01","ids":{"openalex":"https://openalex.org/W2169145031","doi":"https://doi.org/10.1109/4.726565","mag":"2169145031"},"language":"en","primary_location":{"id":"doi:10.1109/4.726565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/4.726565","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079341609","display_name":"T. Kirihata","orcid":"https://orcid.org/0000-0002-3507-0274"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Kirihata","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030467785","display_name":"Magali Le Gall","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Gall","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001830342","display_name":"Kohji Hosokawa","orcid":"https://orcid.org/0009-0009-8086-8144"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Hosokawa","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022521908","display_name":"J.-M. Dortu","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.-M. Dortu","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103581981","display_name":"Hing Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hing Wong","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5096953249","display_name":"P. Pfefferi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Pfefferi","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105935685","display_name":"B.L. Ji","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.L. Ji","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016349923","display_name":"O. Weinfurtner","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Weinfurtner","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047157491","display_name":"J. DeBrosse","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.K. DeBrosse","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090388142","display_name":"H. Terletzki","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H. Terletzki","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008140708","display_name":"M. Selz","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Selz","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111136252","display_name":"W. Ellis","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Ellis","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109989545","display_name":"M.R. Wordeman","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Wordeman","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025208349","display_name":"Oliver Kiehl","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"O. Kiehl","raw_affiliation_strings":["IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Siemens Toshiba, IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210150981"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5956,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.84316702,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"33","issue":"11","first_page":"1711","last_page":"1719"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/clock-rate","display_name":"Clock rate","score":0.5845196843147278},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5487155318260193},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5454923510551453},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5373906493186951},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.5285531282424927},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.48170047998428345},{"id":"https://openalex.org/keywords/pipeline","display_name":"Pipeline (software)","score":0.47554466128349304},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4729606509208679},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.42367714643478394},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2683864235877991},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20702773332595825},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.19692060351371765},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1725967526435852}],"concepts":[{"id":"https://openalex.org/C178693496","wikidata":"https://www.wikidata.org/wiki/Q911691","display_name":"Clock rate","level":3,"score":0.5845196843147278},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5487155318260193},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5454923510551453},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5373906493186951},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.5285531282424927},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.48170047998428345},{"id":"https://openalex.org/C43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","level":2,"score":0.47554466128349304},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4729606509208679},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.42367714643478394},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2683864235877991},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20702773332595825},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.19692060351371765},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1725967526435852}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/4.726565","is_oa":false,"landing_page_url":"https://doi.org/10.1109/4.726565","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W644383332","https://openalex.org/W1480912904","https://openalex.org/W1486435345","https://openalex.org/W1532787294","https://openalex.org/W1566746153","https://openalex.org/W1587826325","https://openalex.org/W1885418823","https://openalex.org/W2022835036","https://openalex.org/W2026652908","https://openalex.org/W2090523408","https://openalex.org/W2097688694","https://openalex.org/W2103027715","https://openalex.org/W2103032983","https://openalex.org/W2109331676","https://openalex.org/W2112584451","https://openalex.org/W2114706410","https://openalex.org/W2117221953","https://openalex.org/W2120605288","https://openalex.org/W2123636281","https://openalex.org/W2127100018","https://openalex.org/W2127315516","https://openalex.org/W2135771839","https://openalex.org/W2137023023","https://openalex.org/W2140891650","https://openalex.org/W2147843986","https://openalex.org/W2151897874","https://openalex.org/W2152782894","https://openalex.org/W2166287616","https://openalex.org/W2168365600","https://openalex.org/W2788394687","https://openalex.org/W4230078286","https://openalex.org/W6628732343","https://openalex.org/W6628958583","https://openalex.org/W6676939741","https://openalex.org/W6678502801","https://openalex.org/W6680388147","https://openalex.org/W6682119291"],"related_works":["https://openalex.org/W2385590193","https://openalex.org/W2107342003","https://openalex.org/W2017188991","https://openalex.org/W2353900159","https://openalex.org/W2362222286","https://openalex.org/W1511332353","https://openalex.org/W2384979961","https://openalex.org/W2498474933","https://openalex.org/W2144544323","https://openalex.org/W2140318211"],"abstract_inverted_index":{"A":[0,42,98,135],"220-mm/sup":[1],"2/,":[2],"256-Mb":[3],"SDRAM":[4],"has":[5],"been":[6],"fabricated":[7],"in":[8,60,80],"fully":[9],"planarized":[10],"0.22-/spl":[11],"mu/m":[12,57],"CMOS":[13],"technology":[14],"with":[15,106,171],"buried":[16],"strap":[17],"trench":[18],"cell.":[19],"The":[20],"single-sided":[21],"stitched":[22],"word-line":[23],"(WL)":[24],"architecture":[25],"employs":[26],"asymmetric":[27],"block":[28],"activation":[29],"and":[30,95,115,145,159],"shared":[31],"row":[32,157],"decoders":[33],"to":[34,50,85,126,167],"realize":[35],"86.7%":[36],"cell/chip-length":[37],"efficiency":[38],"(57.3%":[39],"cell/chip":[40],"efficiency).":[41],"staggered":[43],"WL":[44,58],"driver":[45],"arrangement":[46],"makes":[47],"it":[48],"possible":[49],"build":[51],"the":[52,122],"drivers":[53],"on":[54],"a":[55,81,107,116,155],"0.484-/spl":[56],"pitch":[59],"limited":[61],"space.":[62],"An":[63],"intraunit":[64],"address":[65],"increment":[66],"pipeline":[67],"scheme":[68,163],"having":[69],"two":[70],"logical":[71],"8-Mb":[72],"arrays":[73],"within":[74],"one":[75],"physical":[76],"16-Mb":[77],"unit":[78],"results":[79],"burst":[82,133],"frequency":[83,109],"up":[84,166],"200":[86],"MHz":[87],"for":[88,130],"single":[89,117],"data":[90,99],"rate,":[91],"while":[92],"allowing":[93],"four-":[94],"eight-bank":[96],"organizations.":[97],"rate":[100],"of":[101,142,148],"270":[102],"Mbits/s":[103],"was":[104],"confirmed":[105],"135-MHz":[108],"doubling":[110],"test":[111],"mode.":[112],"Single-ended":[113],"addresses":[114],"ended":[118],"read-write-drive":[119],"bus":[120],"reduce":[121],"ICC/sub":[123],"4/":[124],"current":[125],"/spl":[127,168],"sim/90":[128],"mA":[129],"100-MHz":[131],"seamless":[132],"operation.":[134],"detailed":[136],"shmoo":[137],"analysis":[138],"demonstrates":[139],"address-access":[140],"time":[141,147],"13.5":[143],"ns":[144],"clock-access":[146],"5":[149],"ns.":[150],"This":[151],"design":[152],"also":[153],"uses":[154],"selectable":[156],"domain":[158],"divided":[160],"column":[161],"redundancy":[162],"that":[164],"repairs":[165],"sim/1400":[169],"faults/chip":[170],"only":[172],"8%":[173],"chip":[174],"overhead.":[175]},"counts_by_year":[{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}