{"id":"https://openalex.org/W2135771839","doi":"https://doi.org/10.1109/4.634660","title":"Flexible test mode approach for 256-Mb DRAM","display_name":"Flexible test mode approach for 256-Mb DRAM","publication_year":1997,"publication_date":"1997-01-01","ids":{"openalex":"https://openalex.org/W2135771839","doi":"https://doi.org/10.1109/4.634660","mag":"2135771839"},"language":"en","primary_location":{"id":"doi:10.1109/4.634660","is_oa":false,"landing_page_url":"https://doi.org/10.1109/4.634660","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079341609","display_name":"T. Kirihata","orcid":"https://orcid.org/0000-0002-3507-0274"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Kirihata","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","IBM Thomas J. Watson Research Center, East Fishkill, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"IBM Thomas J. Watson Research Center, East Fishkill, NY, USA","institution_ids":["https://openalex.org/I4210114115"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103581981","display_name":"Hing Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hing Wong","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047157491","display_name":"J. DeBrosse","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.K. DeBrosse","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026392622","display_name":"Yoshihiro Watanabe","orcid":"https://orcid.org/0000-0002-5756-0530"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Y. Watanabe","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","Toshiba Semiconductor System Engineering Center, Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"Toshiba Semiconductor System Engineering Center, Yokohama, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051298722","display_name":"T. Hara","orcid":"https://orcid.org/0000-0003-1105-0524"},"institutions":[{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Hara","raw_affiliation_strings":["Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052103283","display_name":"Makoto Yoshida","orcid":"https://orcid.org/0000-0001-9028-6206"},"institutions":[{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. Yoshida","raw_affiliation_strings":["Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I4210150981"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109989545","display_name":"M.R. Wordeman","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.R. Wordeman","raw_affiliation_strings":["IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049630564","display_name":"Shosuke Fujii","orcid":"https://orcid.org/0000-0003-1112-2081"},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"S. Fujii","raw_affiliation_strings":["Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","Toshiba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I4210150981"]},{"raw_affiliation_string":"Toshiba, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110808158","display_name":"Y. Asao","orcid":null},"institutions":[{"id":"https://openalex.org/I1292669757","display_name":"Toshiba (Japan)","ror":"https://ror.org/0326v3z14","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]},{"id":"https://openalex.org/I4210150981","display_name":"Toshiba (United States)","ror":"https://ror.org/051vpgk97","country_code":"US","type":"company","lineage":["https://openalex.org/I1292669757","https://openalex.org/I4210150981"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Y. Asao","raw_affiliation_strings":["Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","Toshiba, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Toshiba IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I4210150981"]},{"raw_affiliation_string":"Toshiba, Japan","institution_ids":["https://openalex.org/I1292669757"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064623973","display_name":"Bozidar Krsnik","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. Krsnik","raw_affiliation_strings":["Siemens, the IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Siemens, the IBM Semiconductor Research and Development Center, Hopewell Junction, NY, USA","institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.028,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.81600408,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"32","issue":"10","first_page":"1525","last_page":"1534"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.7563257217407227},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.6299082040786743},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5885118246078491},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5024099349975586},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4836941361427307},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4564414918422699},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4511687755584717},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4328407347202301},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3314744830131531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20498287677764893},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09582805633544922},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07573029398918152},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.06317916512489319}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.7563257217407227},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.6299082040786743},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5885118246078491},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5024099349975586},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4836941361427307},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4564414918422699},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4511687755584717},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4328407347202301},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3314744830131531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20498287677764893},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09582805633544922},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07573029398918152},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06317916512489319},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/4.634660","is_oa":false,"landing_page_url":"https://doi.org/10.1109/4.634660","pdf_url":null,"source":{"id":"https://openalex.org/S83637746","display_name":"IEEE Journal of Solid-State Circuits","issn_l":"0018-9200","issn":["0018-9200","1558-173X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Journal of Solid-State Circuits","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W31214843","https://openalex.org/W591857319","https://openalex.org/W1480912904","https://openalex.org/W1497448104","https://openalex.org/W1532787294","https://openalex.org/W1587826325","https://openalex.org/W1885418823","https://openalex.org/W1981823592","https://openalex.org/W1985821426","https://openalex.org/W2022835036","https://openalex.org/W2026652908","https://openalex.org/W2097480407","https://openalex.org/W2097688694","https://openalex.org/W2103027715","https://openalex.org/W2112110388","https://openalex.org/W2112584451","https://openalex.org/W2114406586","https://openalex.org/W2114706410","https://openalex.org/W2120507932","https://openalex.org/W2127100018","https://openalex.org/W2127904095","https://openalex.org/W2132264990","https://openalex.org/W2137023023","https://openalex.org/W2140957071","https://openalex.org/W2152782894","https://openalex.org/W2155027265","https://openalex.org/W2162720403","https://openalex.org/W2171019527","https://openalex.org/W2534746101","https://openalex.org/W2537375235","https://openalex.org/W2788345295","https://openalex.org/W2788394687","https://openalex.org/W3194371653","https://openalex.org/W4230078286","https://openalex.org/W4233030175","https://openalex.org/W4248303691","https://openalex.org/W4250032859","https://openalex.org/W4254255131","https://openalex.org/W6628732343","https://openalex.org/W6635154125","https://openalex.org/W6641422414","https://openalex.org/W6676930631","https://openalex.org/W6676939741","https://openalex.org/W6680388147","https://openalex.org/W6681145925","https://openalex.org/W6748356824"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W2098207691","https://openalex.org/W3148568549","https://openalex.org/W1648516568","https://openalex.org/W361036515","https://openalex.org/W2269474412","https://openalex.org/W4386903460","https://openalex.org/W4211178602","https://openalex.org/W2537599394","https://openalex.org/W2433923775"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3,10,45,53,68,139,144,152],"flexible":[4,132],"test":[5,26,34,38,63,79,86,100,106,116,135,165],"mode":[6,18,27,58,64,107,136],"approach":[7],"developed":[8],"for":[9,57,118],"256-Mb":[11],"dynamic":[12],"random":[13],"access":[14],"memory":[15],"(DRAM).":[16],"Test":[17],"flexibility":[19],"is":[20,108],"achieved":[21],"by":[22],"breaking":[23],"down":[24],"complicated":[25],"control":[28,170],"into":[29],"more":[30,96],"than":[31,97],"one":[32],"primitive":[33,37,62,85],"mode.":[35],"The":[36],"modes":[39,87],"can":[40,91,168],"be":[41,92],"selected":[42],"together":[43],"through":[44],"WE":[46],"CAS":[47],"Before":[48],"RAS":[49],"(WCBR)":[50],"cycle":[51],"with":[52],"series":[54],"of":[55,173],"addresses":[56],"select.":[59],"Although":[60],"each":[61],"may":[65],"not":[66],"complete":[67],"meaningful":[69],"task":[70],"alone,":[71],"their":[72],"combination":[73],"performs":[74,138],"many":[75],"complex":[76],"and":[77,151,176],"powerful":[78],"modes.":[80,101],"In":[81],"this":[82],"design,":[83],"64":[84],"are":[88,123,180],"available.":[89],"These":[90],"combined":[93],"to":[94,125],"realize":[95],"19000":[98],"useful":[99],"A":[102,131],"new":[103],"signal":[104,114],"margin":[105,115],"introduced":[109],"which":[110,122,167],"allows":[111],"an":[112],"accurate":[113],"even":[117],"small":[119],"capacitance":[120],"cells,":[121],"difficult":[124],"identify":[126],"in":[127],"existing":[128],"plate-bump":[129],"method.":[130],"multiwordline":[133],"select":[134,178],"effectively":[137],"toggled":[140],"wordline":[141,148],"disturb":[142,149],"test,":[143,150,157],"long":[145],"t/sub":[146],"RAS/":[147],"transfer":[153],"gate":[154],"stress":[155],"voltage":[156],"without":[158],"causing":[159],"any":[160],"unnatural":[161],"array":[162],"disturbance.":[163],"Finally,":[164],"modes,":[166],"directly":[169],"the":[171],"timing":[172],"sense":[174],"amplifiers":[175],"column":[177],"lines,":[179],"discussed.":[181]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}