{"id":"https://openalex.org/W4406355818","doi":"https://doi.org/10.1109/3dic63395.2024.10830070","title":"Detectability of Resistive Open Defects with Analog Relaxation Oscillators Under Unit-to-Unit Variations of Dies","display_name":"Detectability of Resistive Open Defects with Analog Relaxation Oscillators Under Unit-to-Unit Variations of Dies","publication_year":2024,"publication_date":"2024-09-25","ids":{"openalex":"https://openalex.org/W4406355818","doi":"https://doi.org/10.1109/3dic63395.2024.10830070"},"language":"en","primary_location":{"id":"doi:10.1109/3dic63395.2024.10830070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/3dic63395.2024.10830070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International 3D Systems Integration Conference (3DIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115873257","display_name":"Yuya Yamahashi","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yuya Yamahashi","raw_affiliation_strings":["Graduate School of Sciences and Technology for Innovation, Tokushima University,Tokushima,Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Sciences and Technology for Innovation, Tokushima University,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080280781","display_name":"Yuto Ohtera","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuto Ohtera","raw_affiliation_strings":["Graduate School of Advanced Technology and Science, Tokushima University,Tokushima,Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Advanced Technology and Science, Tokushima University,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071523958","display_name":"Hiroyuki Yotsuyanagi","orcid":"https://orcid.org/0000-0002-4223-3705"},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroyuki Yotsuyanagi","raw_affiliation_strings":["Graduate School of Technology, Industrial and Sciences Tokushima University,Tokushima,Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Technology, Industrial and Sciences Tokushima University,Tokushima,Japan","institution_ids":["https://openalex.org/I922474255"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101941698","display_name":"Shyue-Kung Lu","orcid":"https://orcid.org/0000-0001-9232-2012"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shyue-Kung Lu","raw_affiliation_strings":["National Taiwan University to Science and Technology,Department of Electrical Engineering,Taipei,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Taiwan University to Science and Technology,Department of Electrical Engineering,Taipei,Taiwan","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5052190532","display_name":"Masaki Hashizume","orcid":null},"institutions":[{"id":"https://openalex.org/I203189479","display_name":"The Open University of Japan","ror":"https://ror.org/03jyr9x65","country_code":"JP","type":"education","lineage":["https://openalex.org/I203189479"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Masaki Hashizume","raw_affiliation_strings":["Tokushima Study Center Open University of Japan,Tokushima,Japan"],"affiliations":[{"raw_affiliation_string":"Tokushima Study Center Open University of Japan,Tokushima,Japan","institution_ids":["https://openalex.org/I203189479"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5115873257"],"corresponding_institution_ids":["https://openalex.org/I922474255"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.2667667,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.8228999972343445,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.8228999972343445,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11126","display_name":"Metallurgical Processes and Thermodynamics","score":0.7886999845504761,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.776199996471405,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/unit","display_name":"Unit (ring theory)","score":0.7463306188583374},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.7426855564117432},{"id":"https://openalex.org/keywords/relaxation-oscillator","display_name":"Relaxation oscillator","score":0.5703343749046326},{"id":"https://openalex.org/keywords/relaxation","display_name":"Relaxation (psychology)","score":0.5231348872184753},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49483412504196167},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4211823344230652},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3630669116973877},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35954466462135315},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.35845720767974854},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20552361011505127},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14739581942558289},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10081803798675537}],"concepts":[{"id":"https://openalex.org/C122637931","wikidata":"https://www.wikidata.org/wiki/Q118084","display_name":"Unit (ring theory)","level":2,"score":0.7463306188583374},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.7426855564117432},{"id":"https://openalex.org/C135854075","wikidata":"https://www.wikidata.org/wiki/Q1421688","display_name":"Relaxation oscillator","level":4,"score":0.5703343749046326},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.5231348872184753},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49483412504196167},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4211823344230652},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3630669116973877},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35954466462135315},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.35845720767974854},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20552361011505127},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14739581942558289},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10081803798675537},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.0},{"id":"https://openalex.org/C145420912","wikidata":"https://www.wikidata.org/wiki/Q853077","display_name":"Mathematics education","level":1,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/3dic63395.2024.10830070","is_oa":false,"landing_page_url":"https://doi.org/10.1109/3dic63395.2024.10830070","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 International 3D Systems Integration Conference (3DIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1963959031","https://openalex.org/W2070204761","https://openalex.org/W2138951112","https://openalex.org/W2156844018","https://openalex.org/W2621102454","https://openalex.org/W2783131733","https://openalex.org/W3162082170","https://openalex.org/W4319783188"],"related_works":["https://openalex.org/W2197986701","https://openalex.org/W3097847178","https://openalex.org/W609904040","https://openalex.org/W3125204845","https://openalex.org/W2021581299","https://openalex.org/W3012011718","https://openalex.org/W2483563543","https://openalex.org/W611386996","https://openalex.org/W1987104623","https://openalex.org/W3024746219"],"abstract_inverted_index":{"We":[0,28,46],"designed":[1,30],"a":[2,31,65],"built-in":[3],"test":[4,32,57,62,97],"circuit":[5,26,33,63,79],"to":[6],"detect":[7],"resistive":[8,52,85],"open":[9,53,86],"defects":[10,54,87],"at":[11],"interconnects":[12],"between":[13],"dies":[14,71],"in":[15,44,64],"3D":[16,66],"stacked":[17,67],"ICs":[18],"using":[19],"relaxation":[20],"oscillators":[21,40],"made":[22,69],"of":[23,38,50,70,88],"only":[24],"analog":[25],"elements.":[27],"also":[29],"by":[34,55,78,95],"which":[35],"process":[36,73],"variations":[37,74],"the":[39,48,56,61,96],"could":[41],"be":[42,93],"eliminated":[43],"tests.":[45],"examined":[47],"detectability":[49],"such":[51],"method":[58],"based":[59],"on":[60],"IC":[68],"whose":[72],"were":[75],"not":[76],"identical":[77],"simulations.":[80],"The":[81],"results":[82],"show":[83],"that":[84],"7.0":[89],"and":[90],"above":[91],"can":[92],"detected":[94],"circuit.":[98]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}