{"id":"https://openalex.org/W1970472659","doi":"https://doi.org/10.1080/03610910701212785","title":"Accuracy Analysis of the Percentile Method for Estimating Non Normal Manufacturing Quality","display_name":"Accuracy Analysis of the Percentile Method for Estimating Non Normal Manufacturing Quality","publication_year":2007,"publication_date":"2007-05-04","ids":{"openalex":"https://openalex.org/W1970472659","doi":"https://doi.org/10.1080/03610910701212785","mag":"1970472659"},"language":"en","primary_location":{"id":"doi:10.1080/03610910701212785","is_oa":false,"landing_page_url":"https://doi.org/10.1080/03610910701212785","pdf_url":null,"source":{"id":"https://openalex.org/S153329750","display_name":"Communications in Statistics - Simulation and Computation","issn_l":"0361-0918","issn":["0361-0918","1532-4141"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Statistics - Simulation and Computation","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054278694","display_name":"Chien\u2010Wei Wu","orcid":"https://orcid.org/0000-0001-7965-1997"},"institutions":[{"id":"https://openalex.org/I4880106","display_name":"Feng Chia University","ror":"https://ror.org/05vhczg54","country_code":"TW","type":"education","lineage":["https://openalex.org/I4880106"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chien-Wei Wu","raw_affiliation_strings":["Feng Chia University","Department of Industrial Engineering and Systems Management , Feng Chia University , Taiwan"],"affiliations":[{"raw_affiliation_string":"Feng Chia University","institution_ids":["https://openalex.org/I4880106"]},{"raw_affiliation_string":"Department of Industrial Engineering and Systems Management , Feng Chia University , Taiwan","institution_ids":["https://openalex.org/I4880106"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111582791","display_name":"W. L. Pearn","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"W. L. Pearn","raw_affiliation_strings":["National Chiao Tung University","[Department of Industrial Engineering and Management, National Chiao Tung University, Taiwan]"],"affiliations":[{"raw_affiliation_string":"National Chiao Tung University","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"[Department of Industrial Engineering and Management, National Chiao Tung University, Taiwan]","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102983224","display_name":"Chih-Yuan Chang","orcid":"https://orcid.org/0000-0002-3347-8647"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]},{"id":"https://openalex.org/I4210136793","display_name":"Peng Cheng Laboratory","ror":"https://ror.org/03qdqbt06","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210136793"]}],"countries":["CN","JP"],"is_corresponding":false,"raw_author_name":"C. S. Chang","raw_affiliation_strings":["Cheng Kuo Institute of Technology","Department of Industrial Engineering & Management , Cheng Kuo Institute of Technology , Taiwan"],"affiliations":[{"raw_affiliation_string":"Cheng Kuo Institute of Technology","institution_ids":["https://openalex.org/I4210136793"]},{"raw_affiliation_string":"Department of Industrial Engineering & Management , Cheng Kuo Institute of Technology , Taiwan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025284805","display_name":"H. C. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"H. C. Chen","raw_affiliation_strings":["National Chiao Tung University","[Department of Industrial Engineering and Management, National Chiao Tung University, Taiwan]"],"affiliations":[{"raw_affiliation_string":"National Chiao Tung University","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"[Department of Industrial Engineering and Management, National Chiao Tung University, Taiwan]","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5054278694"],"corresponding_institution_ids":["https://openalex.org/I4880106"],"apc_list":null,"apc_paid":null,"fwci":0.6698,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.74470514,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"36","issue":"3","first_page":"657","last_page":"697"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9932000041007996,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/percentile","display_name":"Percentile","score":0.7016723155975342},{"id":"https://openalex.org/keywords/log-normal-distribution","display_name":"Log-normal distribution","score":0.5676625370979309},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.5108699202537537},{"id":"https://openalex.org/keywords/normal-distribution","display_name":"Normal distribution","score":0.5098487734794617},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.4626646041870117},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4344978630542755},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.4169186055660248},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.40899601578712463},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38265135884284973},{"id":"https://openalex.org/keywords/applied-mathematics","display_name":"Applied mathematics","score":0.3322600722312927},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25981223583221436},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1712993085384369}],"concepts":[{"id":"https://openalex.org/C122048520","wikidata":"https://www.wikidata.org/wiki/Q2913954","display_name":"Percentile","level":2,"score":0.7016723155975342},{"id":"https://openalex.org/C151620405","wikidata":"https://www.wikidata.org/wiki/Q826116","display_name":"Log-normal distribution","level":2,"score":0.5676625370979309},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.5108699202537537},{"id":"https://openalex.org/C102094743","wikidata":"https://www.wikidata.org/wiki/Q133871","display_name":"Normal distribution","level":2,"score":0.5098487734794617},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.4626646041870117},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4344978630542755},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.4169186055660248},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.40899601578712463},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38265135884284973},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.3322600722312927},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25981223583221436},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1712993085384369}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/03610910701212785","is_oa":false,"landing_page_url":"https://doi.org/10.1080/03610910701212785","pdf_url":null,"source":{"id":"https://openalex.org/S153329750","display_name":"Communications in Statistics - Simulation and Computation","issn_l":"0361-0918","issn":["0361-0918","1532-4141"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Communications in Statistics - Simulation and Computation","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W152569421","https://openalex.org/W636405676","https://openalex.org/W1491900509","https://openalex.org/W1530884268","https://openalex.org/W1565883629","https://openalex.org/W1593449005","https://openalex.org/W1969254882","https://openalex.org/W2003802449","https://openalex.org/W2018575424","https://openalex.org/W2031255662","https://openalex.org/W2059761160","https://openalex.org/W2060108587","https://openalex.org/W2070109657","https://openalex.org/W2141482686","https://openalex.org/W2170789143","https://openalex.org/W2280687644","https://openalex.org/W2765670314","https://openalex.org/W3159061771","https://openalex.org/W4210859283","https://openalex.org/W4230917442","https://openalex.org/W4235581671","https://openalex.org/W4243078471"],"related_works":["https://openalex.org/W2804662986","https://openalex.org/W2113227311","https://openalex.org/W2889670096","https://openalex.org/W2116341137","https://openalex.org/W2022721280","https://openalex.org/W3106777427","https://openalex.org/W4205498118","https://openalex.org/W4320057697","https://openalex.org/W3109972194","https://openalex.org/W1973222125"],"abstract_inverted_index":{"V\u00e4nnman":[0,2],"(1995":[1],",":[3,26,58,61,63,98,124,127,129,164],"K.":[4,64,130],"(":[5,66,87,132,153],"1995":[6],").":[7,68,134],"A":[8],"unified":[9],"approach":[10],"to":[11,112],"capability":[12,36],"indices":[13,37,70,136],".":[14,82,148],"Statistica":[15],"Sinica":[16],"5":[17],":":[18],"805":[19],"\u2013":[20,91,157],"820":[21],".[Web":[22],"of":[23,35,95,104,161,186],"Science":[24,96,162],"\u00ae]":[25,97,163],"[Google":[27,99,165],"Scholar])":[28,100,166],"proposed":[29,168],"a":[30,102,169],"superstructure":[31],"Cp":[32,105],"(u,":[33,106,110,177],"v)":[34],"for":[38,71,137,173],"processes":[39,114],"with":[40,75,115,141,230],"normal":[41,73,117,139,199,204],"distributions,":[42,214],"which":[43,196],"include":[44],"Cp,":[45],"Cpk,":[46],"Cpm,":[47],"and":[48,54,84,120,150,201,227,238],"Cpmk":[49],"as":[50],"special":[51],"cases.":[52],"Pearn":[53,57,119,123],"Chen":[55,62,121,128],"(1997":[56,122],"W.":[59,125],"L.":[60,126],"S.":[65,131],"1997":[67,133],"Capability":[69,135],"non":[72,116,138,203],"distributions":[74,140,205],"an":[76,142],"application":[77,143],"in":[78,144],"electrolytic":[79,145],"capacitor":[80,146],"manufacturing":[81,147],"Microelectronics":[83,149],"Reliability":[85,151],"37":[86,152],"12":[88,154],"):":[89,155],"1853":[90,156],"1858":[92,158],".[Crossref],":[93,159],"[Web":[94,160],"considered":[101],"generalization":[103,175],"v),":[107,111],"called":[108],"CNp":[109,176],"cover":[113],"distributions.":[118],"also":[167],"sample":[170,188],"percentile":[171,189],"estimator":[172],"the":[174,184,187,198,207],"v).":[178],"In":[179],"this":[180],"article,":[181],"we":[182],"investigate":[183],"performance":[185],"estimator.":[190],"We":[191],"perform":[192],"some":[193],"simulation":[194,235],"study,":[195],"covers":[197],"distribution":[200],"various":[202],"including":[206],"uniform":[208],"distribution,":[209,211,216,218,220,222,224,226,229],"chi-square":[210],"student's":[212],"t":[213],"F":[215],"beta":[217],"gamma":[219],"Weibull":[221],"lognormal":[223],"triangular":[225],"Laplace":[228],"selected":[231],"parameter":[232],"values.":[233],"Extensive":[234],"results,":[236],"comparisons,":[237],"analysis":[239],"are":[240],"provided.":[241]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":4},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-02-01T03:34:12.195049","created_date":"2025-10-10T00:00:00"}