{"id":"https://openalex.org/W3096300922","doi":"https://doi.org/10.1080/24725854.2020.1841344","title":"Optimal burn-in policies for multiple dependent degradation processes","display_name":"Optimal burn-in policies for multiple dependent degradation processes","publication_year":2020,"publication_date":"2020-10-26","ids":{"openalex":"https://openalex.org/W3096300922","doi":"https://doi.org/10.1080/24725854.2020.1841344","mag":"3096300922"},"language":"en","primary_location":{"id":"doi:10.1080/24725854.2020.1841344","is_oa":false,"landing_page_url":"https://doi.org/10.1080/24725854.2020.1841344","pdf_url":null,"source":{"id":"https://openalex.org/S4210225672","display_name":"IISE Transactions","issn_l":"2472-5854","issn":["2472-5854","2472-5862"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IISE Transactions","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079603628","display_name":"Yue Shi","orcid":"https://orcid.org/0000-0001-5720-5013"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yue Shi","raw_affiliation_strings":["Texas Tech University, Lubbock, TX, USA;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Tech University, Lubbock, TX, USA;","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063225585","display_name":"Yisha Xiang","orcid":"https://orcid.org/0000-0003-0696-2924"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yisha Xiang","raw_affiliation_strings":["Texas Tech University, Lubbock, TX, USA;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Tech University, Lubbock, TX, USA;","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102001593","display_name":"Ying Liao","orcid":"https://orcid.org/0000-0002-8830-0926"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ying Liao","raw_affiliation_strings":["Texas Tech University, Lubbock, TX, USA;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Tech University, Lubbock, TX, USA;","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016257287","display_name":"Zhicheng Zhu","orcid":"https://orcid.org/0000-0001-5297-2651"},"institutions":[{"id":"https://openalex.org/I12315562","display_name":"Texas Tech University","ror":"https://ror.org/0405mnx93","country_code":"US","type":"education","lineage":["https://openalex.org/I12315562"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhicheng Zhu","raw_affiliation_strings":["Texas Tech University, Lubbock, TX, USA;"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Tech University, Lubbock, TX, USA;","institution_ids":["https://openalex.org/I12315562"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022205142","display_name":"Yili Hong","orcid":"https://orcid.org/0000-0003-1720-9540"},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yili Hong","raw_affiliation_strings":["Virginia Tech, Blacksburg, VA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Virginia Tech, Blacksburg, VA, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5063225585"],"corresponding_institution_ids":["https://openalex.org/I12315562"],"apc_list":null,"apc_paid":null,"fwci":0.7509,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.70987245,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"31"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7932670712471008},{"id":"https://openalex.org/keywords/burn-in","display_name":"Burn-in","score":0.5658922791481018},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5150184631347656},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.5139512419700623},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5104614496231079},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.48202455043792725},{"id":"https://openalex.org/keywords/random-effects-model","display_name":"Random effects model","score":0.4679526090621948},{"id":"https://openalex.org/keywords/point-process","display_name":"Point process","score":0.42577987909317017},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.39513853192329407},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3551349639892578},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2304804027080536},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18574994802474976},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10856431722640991}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7932670712471008},{"id":"https://openalex.org/C179707776","wikidata":"https://www.wikidata.org/wiki/Q662895","display_name":"Burn-in","level":2,"score":0.5658922791481018},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5150184631347656},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.5139512419700623},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5104614496231079},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.48202455043792725},{"id":"https://openalex.org/C168743327","wikidata":"https://www.wikidata.org/wiki/Q1826427","display_name":"Random effects model","level":3,"score":0.4679526090621948},{"id":"https://openalex.org/C88871306","wikidata":"https://www.wikidata.org/wiki/Q7208287","display_name":"Point process","level":2,"score":0.42577987909317017},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39513853192329407},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3551349639892578},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2304804027080536},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18574994802474976},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10856431722640991},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C95190672","wikidata":"https://www.wikidata.org/wiki/Q815382","display_name":"Meta-analysis","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1080/24725854.2020.1841344","is_oa":false,"landing_page_url":"https://doi.org/10.1080/24725854.2020.1841344","pdf_url":null,"source":{"id":"https://openalex.org/S4210225672","display_name":"IISE Transactions","issn_l":"2472-5854","issn":["2472-5854","2472-5862"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IISE Transactions","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:taf:uiiexx:v:53:y:2020:i:11:p:1281-1293","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/24725854.2020.1841344","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W22795681","https://openalex.org/W1968175476","https://openalex.org/W1972882514","https://openalex.org/W1975174792","https://openalex.org/W1985409483","https://openalex.org/W1985827874","https://openalex.org/W1988286714","https://openalex.org/W1995373625","https://openalex.org/W1999871445","https://openalex.org/W2003216150","https://openalex.org/W2004839758","https://openalex.org/W2008825253","https://openalex.org/W2010244673","https://openalex.org/W2029511771","https://openalex.org/W2033619772","https://openalex.org/W2033756468","https://openalex.org/W2040287221","https://openalex.org/W2040607369","https://openalex.org/W2043129860","https://openalex.org/W2072258798","https://openalex.org/W2103221250","https://openalex.org/W2104794882","https://openalex.org/W2154582503","https://openalex.org/W2185238725","https://openalex.org/W2206479571","https://openalex.org/W2335876601","https://openalex.org/W2345145213","https://openalex.org/W2612576158","https://openalex.org/W2800782238","https://openalex.org/W2890267052","https://openalex.org/W2971639038","https://openalex.org/W6600691061"],"related_works":["https://openalex.org/W4251918988","https://openalex.org/W1986287575","https://openalex.org/W2353008372","https://openalex.org/W2171912619","https://openalex.org/W2150551164","https://openalex.org/W1965082216","https://openalex.org/W4238355107","https://openalex.org/W2293143078","https://openalex.org/W2043687303","https://openalex.org/W4390615892"],"abstract_inverted_index":{"Many":[0],"complex":[1],"engineering":[2],"devices":[3],"experience":[4],"multiple":[5,28,51,78,136,157,198],"dependent":[6,29,52,137],"degradation":[7,11,30,53,93,138,158],"processes.":[8],"For":[9,175],"each":[10,82],"process,":[12],"there":[13],"may":[14],"exist":[15],"substantial":[16],"unit-to-unit":[17],"heterogeneity.":[18],"In":[19],"this":[20],"article,":[21],"we":[22,62],"describe":[23],"the":[24,60,75,111,171,176],"dependence":[25,155,183],"structure":[26],"among":[27,156],"processes":[31,54,139,159],"using":[32,114],"copulas":[33],"and":[34,74,166],"model":[35],"unit-level":[36],"heterogeneity":[37],"as":[38,146],"random":[39,56],"effects.":[40,57],"A":[41],"two-stage":[42],"estimation":[43],"method":[44],"is":[45,87],"developed":[46],"for":[47,170],"statistical":[48],"inference":[49],"of":[50,122,154,182],"with":[55,69,77,197],"To":[58],"reduce":[59],"heterogeneity,":[61],"propose":[63],"two":[64,172],"degradation-based":[65],"burn-in":[66,98,107,127,164,168,173,196],"models,":[67],"one":[68,90],"a":[70,85,151,179],"single":[71],"screening":[72,79,83,189,199],"point":[73],"other":[76],"points.":[80,190],"At":[81],"point,":[84],"unit":[86],"scrapped":[88],"if":[89],"or":[91],"more":[92],"levels":[94],"pass":[95],"their":[96],"respective":[97],"thresholds.":[99],"Efficient":[100],"algorithms":[101],"are":[102,129],"devised":[103],"to":[104,162,203],"find":[105],"optimal":[106,126],"decisions.":[108],"We":[109],"illustrate":[110],"proposed":[112],"models":[113],"experimental":[115],"data":[116],"from":[117],"light-emitting":[118],"diode":[119],"lamps.":[120],"Impacts":[121],"parameter":[123],"uncertainties":[124],"on":[125],"decisions":[128],"investigated.":[130],"Our":[131,191],"results":[132,192],"show":[133,194],"that":[134,195],"ignoring":[135],"can":[140,184,201],"cause":[141],"inferior":[142],"system":[143],"performance,":[144],"such":[145],"increased":[147],"total":[148],"costs.":[149],"Moreover,":[150],"higher":[152,167,180],"level":[153,181],"often":[160],"leads":[161],"longer":[163],"time":[165],"thresholds":[169],"models.":[174],"multiple-screening-point":[177],"model,":[178],"also":[185,193],"result":[186],"in":[187],"fewer":[188],"points":[200],"lead":[202],"potential":[204],"cost":[205],"savings.":[206]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}