{"id":"https://openalex.org/W2316494638","doi":"https://doi.org/10.1080/17445760.2015.1016516","title":"A CUDA-based parallel implementation of a test vectors encoding algorithm in compression-based scan designs","display_name":"A CUDA-based parallel implementation of a test vectors encoding algorithm in compression-based scan designs","publication_year":2015,"publication_date":"2015-03-05","ids":{"openalex":"https://openalex.org/W2316494638","doi":"https://doi.org/10.1080/17445760.2015.1016516","mag":"2316494638"},"language":"en","primary_location":{"id":"doi:10.1080/17445760.2015.1016516","is_oa":false,"landing_page_url":"https://doi.org/10.1080/17445760.2015.1016516","pdf_url":null,"source":{"id":"https://openalex.org/S85375271","display_name":"International Journal of Parallel Emergent and Distributed Systems","issn_l":"1744-5760","issn":["1744-5760","1744-5779"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Parallel, Emergent and Distributed Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000909851","display_name":"Eman AlQuraishi","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Eman AlQuraishi","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Safat, Kuwait"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Safat, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007674256","display_name":"Eman AlDwaisan","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Eman AlDwaisan","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Safat, Kuwait"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Safat, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057375621","display_name":"Alaa AlSaqaa","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Alaa AlSaqaa","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Safat, Kuwait"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Safat, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077897203","display_name":"Imtiaz Ahmad","orcid":"https://orcid.org/0000-0002-0673-7324"},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":true,"raw_author_name":"Imtiaz Ahmad","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Safat, Kuwait"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Safat, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5077897203"],"corresponding_institution_ids":["https://openalex.org/I36721946"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16382806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"3","first_page":"280","last_page":"293"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.7620939016342163},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.7299143671989441},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7220495343208313},{"id":"https://openalex.org/keywords/cuda","display_name":"CUDA","score":0.7057008743286133},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.558730959892273},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5422118902206421},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.5366968512535095},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5366901755332947},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.5131016969680786},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4968145191669464},{"id":"https://openalex.org/keywords/independence","display_name":"Independence (probability theory)","score":0.48346835374832153},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.471253901720047},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.4666421711444855},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4425823986530304},{"id":"https://openalex.org/keywords/compression-ratio","display_name":"Compression ratio","score":0.42802348732948303},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.38663387298583984},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3517967462539673},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.10919758677482605},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.10575637221336365},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0915299654006958},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08571138978004456},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.08521530032157898},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07601076364517212}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.7620939016342163},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.7299143671989441},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7220495343208313},{"id":"https://openalex.org/C2778119891","wikidata":"https://www.wikidata.org/wiki/Q477690","display_name":"CUDA","level":2,"score":0.7057008743286133},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.558730959892273},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5422118902206421},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.5366968512535095},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5366901755332947},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.5131016969680786},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4968145191669464},{"id":"https://openalex.org/C35651441","wikidata":"https://www.wikidata.org/wiki/Q625303","display_name":"Independence (probability theory)","level":2,"score":0.48346835374832153},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.471253901720047},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.4666421711444855},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4425823986530304},{"id":"https://openalex.org/C25797200","wikidata":"https://www.wikidata.org/wiki/Q828137","display_name":"Compression ratio","level":3,"score":0.42802348732948303},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.38663387298583984},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3517967462539673},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.10919758677482605},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.10575637221336365},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0915299654006958},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08571138978004456},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.08521530032157898},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07601076364517212},{"id":"https://openalex.org/C511840579","wikidata":"https://www.wikidata.org/wiki/Q12757","display_name":"Internal combustion engine","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/17445760.2015.1016516","is_oa":false,"landing_page_url":"https://doi.org/10.1080/17445760.2015.1016516","pdf_url":null,"source":{"id":"https://openalex.org/S85375271","display_name":"International Journal of Parallel Emergent and Distributed Systems","issn_l":"1744-5760","issn":["1744-5760","1744-5779"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Parallel, Emergent and Distributed Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6700000166893005}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1480380098","https://openalex.org/W1568407911","https://openalex.org/W1762731526","https://openalex.org/W1915664158","https://openalex.org/W2019708326","https://openalex.org/W2105182837","https://openalex.org/W2112651657","https://openalex.org/W2123172689","https://openalex.org/W2130149750","https://openalex.org/W2133378865","https://openalex.org/W2135627440","https://openalex.org/W2144888713","https://openalex.org/W2147049590","https://openalex.org/W2168419390","https://openalex.org/W2169854732","https://openalex.org/W2542982212","https://openalex.org/W3141221995","https://openalex.org/W3152022554","https://openalex.org/W4230084852","https://openalex.org/W4232226371"],"related_works":["https://openalex.org/W2074302528","https://openalex.org/W2147986372","https://openalex.org/W2019719714","https://openalex.org/W1979305473","https://openalex.org/W2044021627","https://openalex.org/W3109020709","https://openalex.org/W2154314512","https://openalex.org/W2134369540","https://openalex.org/W2160753176","https://openalex.org/W4253246424"],"abstract_inverted_index":{"Compression-based":[0],"scan":[1,24,38,79,88],"designs,":[2],"although":[3],"widely":[4],"adopted,":[5],"are":[6],"costly":[7],"in":[8,21,32,77],"power":[9,19,27],"dissipation.":[10],"Therefore,":[11],"several":[12],"techniques":[13],"have":[14],"been":[15],"proposed":[16,82],"to":[17,71,93],"reduce":[18],"dissipation":[20],"compression-based":[22,78],"reconfigurable":[23,37],"architectures.":[25],"Incorporating":[26],"reduction":[28],"as":[29,44],"an":[30],"objective":[31],"selecting":[33],"the":[34,41,46,54,85,95,101,110],"configuration":[35],"of":[36,87],"architecture":[39],"increases":[40],"computational":[42],"runtime":[43],"all":[45],"encoding":[47,75],"configurations":[48],"must":[49],"be":[50,105],"evaluated":[51],"rather":[52],"than":[53,109],"first":[55],"valid":[56],"configuration.":[57],"In":[58],"this":[59],"paper,":[60],"we":[61],"present":[62],"a":[63,72],"parallel":[64,102],"implementation,":[65],"using":[66],"computed":[67],"unified":[68],"device":[69],"architecture,":[70],"test":[73,91],"vectors":[74,92],"algorithm":[76,103],"designs.":[80],"The":[81],"implementation":[83],"exploits":[84],"independence":[86],"chains":[89],"and":[90],"improve":[94],"performance.":[96],"Experimental":[97],"results":[98],"indicate":[99],"that":[100],"can":[104],"seven":[106],"times":[107],"faster":[108],"serial":[111],"algorithm.":[112]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}