{"id":"https://openalex.org/W4313251655","doi":"https://doi.org/10.1080/0951192x.2022.2162602","title":"Integrated application model for visual detection of welding quality based on visual neuron under edge-end collaboration","display_name":"Integrated application model for visual detection of welding quality based on visual neuron under edge-end collaboration","publication_year":2022,"publication_date":"2022-12-27","ids":{"openalex":"https://openalex.org/W4313251655","doi":"https://doi.org/10.1080/0951192x.2022.2162602"},"language":"en","primary_location":{"id":"doi:10.1080/0951192x.2022.2162602","is_oa":false,"landing_page_url":"https://doi.org/10.1080/0951192x.2022.2162602","pdf_url":null,"source":{"id":"https://openalex.org/S57062392","display_name":"International Journal of Computer Integrated Manufacturing","issn_l":"0951-192X","issn":["0951-192X","1362-3052"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer Integrated Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032810121","display_name":"Liangrui Zhang","orcid":"https://orcid.org/0000-0001-9312-6726"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liangrui Zhang","raw_affiliation_strings":["School of Mechanical Engineering, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100430813","display_name":"Xi Zhang","orcid":"https://orcid.org/0000-0001-9369-0060"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xi Zhang","raw_affiliation_strings":["School of Mechanical Engineering, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086807774","display_name":"Jing Hu","orcid":"https://orcid.org/0000-0001-9227-7522"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Hu","raw_affiliation_strings":["School of Mechanical Engineering, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036624612","display_name":"Mingzhou Liu","orcid":"https://orcid.org/0000-0002-0297-0938"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingzhou Liu","raw_affiliation_strings":["School of Mechanical Engineering, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100647172","display_name":"Lin Ling","orcid":"https://orcid.org/0009-0006-0710-9588"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lin Ling","raw_affiliation_strings":["School of Mechanical Engineering, Hefei University of Technology, Hefei, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100430813"],"corresponding_institution_ids":["https://openalex.org/I16365422"],"apc_list":null,"apc_paid":null,"fwci":0.1334,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.55848476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"36","issue":"8","first_page":"1109","last_page":"1127"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11605","display_name":"Visual Attention and Saliency Detection","score":0.9739999771118164,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.9535999894142151,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7523207664489746},{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5985314846038818},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5285657644271851},{"id":"https://openalex.org/keywords/queue","display_name":"Queue","score":0.5005044937133789},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4797888398170471},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.47774022817611694},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.46292755007743835},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4423254728317261},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.42449936270713806},{"id":"https://openalex.org/keywords/knowledge-representation-and-reasoning","display_name":"Knowledge representation and reasoning","score":0.41601449251174927},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3657386898994446},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32719284296035767},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16886472702026367},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.14385199546813965},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.12209302186965942}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7523207664489746},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5985314846038818},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5285657644271851},{"id":"https://openalex.org/C160403385","wikidata":"https://www.wikidata.org/wiki/Q220543","display_name":"Queue","level":2,"score":0.5005044937133789},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4797888398170471},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.47774022817611694},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.46292755007743835},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4423254728317261},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.42449936270713806},{"id":"https://openalex.org/C161301231","wikidata":"https://www.wikidata.org/wiki/Q3478658","display_name":"Knowledge representation and reasoning","level":2,"score":0.41601449251174927},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3657386898994446},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32719284296035767},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16886472702026367},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.14385199546813965},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.12209302186965942},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/0951192x.2022.2162602","is_oa":false,"landing_page_url":"https://doi.org/10.1080/0951192x.2022.2162602","pdf_url":null,"source":{"id":"https://openalex.org/S57062392","display_name":"International Journal of Computer Integrated Manufacturing","issn_l":"0951-192X","issn":["0951-192X","1362-3052"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer Integrated Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1560042744","https://openalex.org/W2006551551","https://openalex.org/W2044387472","https://openalex.org/W2058289959","https://openalex.org/W2086594525","https://openalex.org/W2155669845","https://openalex.org/W2416799949","https://openalex.org/W2466255798","https://openalex.org/W2615954793","https://openalex.org/W2684383364","https://openalex.org/W2763953661","https://openalex.org/W2764250713","https://openalex.org/W2786027963","https://openalex.org/W2809251854","https://openalex.org/W2888484029","https://openalex.org/W2888695958","https://openalex.org/W2894197539","https://openalex.org/W2895788746","https://openalex.org/W3002985805","https://openalex.org/W3003265726","https://openalex.org/W3015202429","https://openalex.org/W3089010076","https://openalex.org/W3095170206","https://openalex.org/W3117698221","https://openalex.org/W3156009749","https://openalex.org/W3168823095","https://openalex.org/W3169571897","https://openalex.org/W3190162777","https://openalex.org/W3198229008","https://openalex.org/W3208003294","https://openalex.org/W3210581704","https://openalex.org/W3214097103","https://openalex.org/W3215609563","https://openalex.org/W3217164963","https://openalex.org/W4200022128","https://openalex.org/W4205518686","https://openalex.org/W4234212765","https://openalex.org/W4256346332","https://openalex.org/W4285257483"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W4224009465","https://openalex.org/W4286629047","https://openalex.org/W4306321456","https://openalex.org/W4285260836","https://openalex.org/W3046775127","https://openalex.org/W4376601996","https://openalex.org/W4360605012","https://openalex.org/W4226413377"],"abstract_inverted_index":{"ABSTRACTThe":[0],"traditional":[1],"\u2018end-to-end\u2019":[2],"integrated":[3,58,130],"machine-vision":[4],"application":[5,59,131],"model":[6,60,137,183],"is":[7],"limited":[8],"by":[9,16,206,228,235],"high":[10,27],"economic":[11],"costs,":[12],"as":[13,15,52],"well":[14],"computing":[17],"power":[18],"and":[19,31,56,97,133,155,191,219],"storage":[20],"capacity":[21],"when":[22],"solving":[23,136],"the":[24,65,73,77,82,99,103,113,124,129,135,149,159,166,170,182,207,229,236],"tasks":[25],"with":[26,76],"time":[28],"delay":[29],"sensitivity":[30],"complex":[32],"inference":[33,190],"processes":[34],"in":[35,128,165,186],"automated":[36],"welding":[37,83,167],"quality":[38,84,160,200],"detection":[39,86,201],"of":[40,67,139,161,169,188,211,214,224],"whole":[41],"vehicles.":[42],"To":[43],"address":[44],"this":[45,175],"problem,":[46],"a":[47,88],"visual":[48,74,85,90],"neuron":[49],"was":[50,61,93,109,120,145,172,204,226,233],"defined":[51],"an":[53,57],"edge":[54,78],"node,":[55],"proposed":[62],"that":[63,181],"incorporated":[64],"idea":[66],"edge-end":[68,142],"collaboration.":[69],"First,":[70],"to":[71,80,111,122],"provide":[72],"neurons":[75],"capability":[79],"solve":[81],"tasks,":[87],"multi-level":[89],"knowledge":[91,100,107,114],"hypergraph":[92],"constructed,":[94],"which":[95],"decouples":[96],"abstracts":[98],"units":[101],"for":[102],"tasks.":[104],"An":[105],"object-oriented":[106],"representation":[108],"used":[110],"establish":[112,134],"hyperedge.":[115],"Secondly,":[116],"Petri":[117],"net":[118],"technology":[119],"employed":[121],"analyze":[123],"task":[125,193],"data":[126,143],"flow":[127],"pattern":[132],"N-COPN":[138],"\u2018control-inference-decision\u2019.":[140],"Moreover,":[141],"transfer":[144,153],"implemented":[146],"based":[147],"on":[148],"message":[150],"queue":[151],"telemetry":[152],"protocol":[154],"RESTful":[156],"architecture.":[157],"Finally,":[158],"auto":[162],"component":[163],"gluing":[164],"process":[168],"vehicle":[171],"detected":[173],"using":[174],"model.":[176],"The":[177],"experimental":[178],"results":[179],"showed":[180],"performed":[184],"better":[185],"terms":[187],"fast-integrated":[189],"concurrent":[192],"processing.KEYWORDS:":[194],"Visual":[195],"neuronedge-end":[196],"collaborationknowledge":[197],"hypergraphPetri":[198],"netwelding":[199],"AcknowledgementsThe":[202],"work":[203,232],"supported":[205,234],"School-Enterprise":[208,237],"Cooperation":[209,238],"Project":[210,239],"Hefei":[212],"University":[213],"Technology":[215],"under":[216],"Grant:":[217],"W2021JSKF0150":[218],"12-018K.Disclosure":[220],"statementNo":[221],"potential":[222],"conflict":[223],"interest":[225],"reported":[227],"authors.Additional":[230],"informationFundingThe":[231],"[W2021JSKF0150,":[240],"12-018K].":[241]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
