{"id":"https://openalex.org/W4213111337","doi":"https://doi.org/10.1080/0951192x.2022.2025622","title":"A data-driven scheduling knowledge management method for smart shop floor","display_name":"A data-driven scheduling knowledge management method for smart shop floor","publication_year":2022,"publication_date":"2022-02-22","ids":{"openalex":"https://openalex.org/W4213111337","doi":"https://doi.org/10.1080/0951192x.2022.2025622"},"language":"en","primary_location":{"id":"doi:10.1080/0951192x.2022.2025622","is_oa":false,"landing_page_url":"https://doi.org/10.1080/0951192x.2022.2025622","pdf_url":null,"source":{"id":"https://openalex.org/S57062392","display_name":"International Journal of Computer Integrated Manufacturing","issn_l":"0951-192X","issn":["0951-192X","1362-3052"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer Integrated Manufacturing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051315321","display_name":"Yumin Ma","orcid":"https://orcid.org/0000-0001-9271-3363"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yumin Ma","raw_affiliation_strings":["Tongji University","School of Electronics and Information Engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081441643","display_name":"Shengyi Li","orcid":"https://orcid.org/0000-0002-2643-809X"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengyi Li","raw_affiliation_strings":["Tongji University","School of Electronics and Information Engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103108404","display_name":"Fei Qiao","orcid":"https://orcid.org/0000-0002-1513-8753"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fei Qiao","raw_affiliation_strings":["Tongji University","School of Electronics and Information Engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006811302","display_name":"Xiaoyu Lu","orcid":"https://orcid.org/0000-0003-2805-3094"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoyu Lu","raw_affiliation_strings":["Tongji University","School of Electronics and Information Engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061363418","display_name":"Juan Liu","orcid":"https://orcid.org/0000-0001-8934-2127"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Liu","raw_affiliation_strings":["Tongji University","School of Electronics and Information Engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"School of Electronics and Information Engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5051315321"],"corresponding_institution_ids":["https://openalex.org/I116953780"],"apc_list":null,"apc_paid":null,"fwci":2.4821,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.90393839,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"35","issue":"7","first_page":"780","last_page":"793"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12676","display_name":"Machine Learning and ELM","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10551","display_name":"Scheduling and Optimization Algorithms","score":0.9793000221252441,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6841815710067749},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.6297121047973633},{"id":"https://openalex.org/keywords/dynamic-priority-scheduling","display_name":"Dynamic priority scheduling","score":0.5281344056129456},{"id":"https://openalex.org/keywords/flow-shop-scheduling","display_name":"Flow shop scheduling","score":0.5042341947555542},{"id":"https://openalex.org/keywords/knowledge-extraction","display_name":"Knowledge extraction","score":0.4600955843925476},{"id":"https://openalex.org/keywords/industrial-engineering","display_name":"Industrial engineering","score":0.4238243103027344},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2925996780395508},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23981288075447083},{"id":"https://openalex.org/keywords/quality-of-service","display_name":"Quality of service","score":0.08840182423591614}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6841815710067749},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.6297121047973633},{"id":"https://openalex.org/C107568181","wikidata":"https://www.wikidata.org/wiki/Q5319000","display_name":"Dynamic priority scheduling","level":3,"score":0.5281344056129456},{"id":"https://openalex.org/C158336966","wikidata":"https://www.wikidata.org/wiki/Q3074426","display_name":"Flow shop scheduling","level":4,"score":0.5042341947555542},{"id":"https://openalex.org/C120567893","wikidata":"https://www.wikidata.org/wiki/Q1582085","display_name":"Knowledge extraction","level":2,"score":0.4600955843925476},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.4238243103027344},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2925996780395508},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23981288075447083},{"id":"https://openalex.org/C5119721","wikidata":"https://www.wikidata.org/wiki/Q220501","display_name":"Quality of service","level":2,"score":0.08840182423591614},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/0951192x.2022.2025622","is_oa":false,"landing_page_url":"https://doi.org/10.1080/0951192x.2022.2025622","pdf_url":null,"source":{"id":"https://openalex.org/S57062392","display_name":"International Journal of Computer Integrated Manufacturing","issn_l":"0951-192X","issn":["0951-192X","1362-3052"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Computer Integrated Manufacturing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/8","display_name":"Decent work and economic growth","score":0.5099999904632568}],"awards":[{"id":"https://openalex.org/G6202920084","display_name":null,"funder_award_id":"61873191","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W50311599","https://openalex.org/W1492200113","https://openalex.org/W1979586866","https://openalex.org/W2003608156","https://openalex.org/W2038336797","https://openalex.org/W2043020075","https://openalex.org/W2044049559","https://openalex.org/W2055062507","https://openalex.org/W2055743332","https://openalex.org/W2123003172","https://openalex.org/W2123504579","https://openalex.org/W2132454116","https://openalex.org/W2158783003","https://openalex.org/W2171446500","https://openalex.org/W2605575499","https://openalex.org/W2761602875","https://openalex.org/W2789184060","https://openalex.org/W2790226641","https://openalex.org/W2803393240","https://openalex.org/W2921735083","https://openalex.org/W2923762697","https://openalex.org/W2939921778","https://openalex.org/W2957623403","https://openalex.org/W2964308808","https://openalex.org/W2967371860","https://openalex.org/W2970207371","https://openalex.org/W3003781497","https://openalex.org/W3025506457","https://openalex.org/W3088991213","https://openalex.org/W3092206612","https://openalex.org/W3151157462","https://openalex.org/W3165938138","https://openalex.org/W3189290477","https://openalex.org/W3197887609","https://openalex.org/W4205590754","https://openalex.org/W4247245376"],"related_works":["https://openalex.org/W2012754152","https://openalex.org/W2734465103","https://openalex.org/W2152153864","https://openalex.org/W4399221052","https://openalex.org/W2384952691","https://openalex.org/W2949165180","https://openalex.org/W4389633695","https://openalex.org/W2838819579","https://openalex.org/W131757205","https://openalex.org/W2884927689"],"abstract_inverted_index":{"The":[0,62,95,130],"data-driven":[1,50],"method":[2,56,64,132,154],"has":[3],"been":[4],"widely":[5],"used":[6,100],"to":[7,17,35,86,101,116],"mine":[8],"knowledge":[9,24,52,68,70,73,76,88,128,161],"from":[10],"the":[11,22,29,41,44,58,79,91,103,109,118,126,136,144,152,157,165,168],"smart":[12,59,169],"shop":[13,60,170],"floors\u2019":[14],"production":[15,30,146],"data":[16],"guide":[18],"dynamic":[19],"scheduling.":[20],"However,":[21],"mined":[23],"may":[25],"be":[26],"invalid":[27],"when":[28],"scene":[31],"changes.":[32],"In":[33],"order":[34],"address":[36],"this":[37,46],"problem":[38],"and":[39,75,162],"ensure":[40],"validity":[42],"of":[43,105,143,159,167],"knowledge,":[45],"paper":[47],"studies":[48],"a":[49,140],"scheduling":[51,93,106,160],"life-cycle":[53,121],"management":[54,122],"(SKLM)":[55],"for":[57],"floor.":[61,171],"proposed":[63,131,153],"includes":[65],"four":[66],"phases:":[67],"generation,":[69],"application,":[71],"online":[72,110],"evaluation,":[74],"update.":[77,129],"Specifically,":[78],"extreme":[80],"learning":[81],"machine":[82],"(ELM)":[83],"is":[84,99,114,123,133,139],"applied":[85],"learn":[87],"based":[89],"on":[90,135],"composite":[92],"rules.":[94],"quality":[96,104],"control":[97],"theory":[98],"evaluate":[102],"knowledge.":[107,119],"And":[108],"sequential":[111],"ELM":[112],"(OS-ELM)":[113],"adopted":[115],"update":[117],"Knowledge":[120],"implemented":[124],"through":[125],"iterative":[127],"validated":[134],"MIMAC6,":[137],"which":[138],"simulation":[141],"model":[142],"semiconductor":[145],"line.":[147],"Experimental":[148],"results":[149],"show":[150],"that":[151],"could":[155],"improve":[156],"effectiveness":[158],"further":[163],"optimize":[164],"performance":[166]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}