{"id":"https://openalex.org/W3116013119","doi":"https://doi.org/10.1080/01605682.2020.1854630","title":"Designing a yield-based skip-lot sampling plan for lot acceptance determination","display_name":"Designing a yield-based skip-lot sampling plan for lot acceptance determination","publication_year":2020,"publication_date":"2020-12-28","ids":{"openalex":"https://openalex.org/W3116013119","doi":"https://doi.org/10.1080/01605682.2020.1854630","mag":"3116013119"},"language":"en","primary_location":{"id":"doi:10.1080/01605682.2020.1854630","is_oa":false,"landing_page_url":"https://doi.org/10.1080/01605682.2020.1854630","pdf_url":null,"source":{"id":"https://openalex.org/S169988927","display_name":"Journal of the Operational Research Society","issn_l":"0160-5682","issn":["0160-5682","1476-9360"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319703","host_organization_name":"Palgrave Macmillan","host_organization_lineage":["https://openalex.org/P4310319703","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Palgrave Macmillan","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of the Operational Research Society","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054278694","display_name":"Chien\u2010Wei Wu","orcid":"https://orcid.org/0000-0001-7965-1997"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chien-Wei Wu","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0001-7965-1997","affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046943328","display_name":"Jr-Tzung Chen","orcid":"https://orcid.org/0000-0002-4972-2050"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jr-Tzung Chen","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":"https://orcid.org/0000-0002-4972-2050","affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013100994","display_name":"Shih\u2010Wen Liu","orcid":"https://orcid.org/0000-0003-3974-6400"},"institutions":[{"id":"https://openalex.org/I65446980","display_name":"National Chin-Yi University of Technology","ror":"https://ror.org/040bs6h16","country_code":"TW","type":"education","lineage":["https://openalex.org/I65446980"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Wen Liu","raw_affiliation_strings":["National Chin-Yi University of Technology, Taichung, Taiwan"],"raw_orcid":"https://orcid.org/0000-0003-3974-6400","affiliations":[{"raw_affiliation_string":"National Chin-Yi University of Technology, Taichung, Taiwan","institution_ids":["https://openalex.org/I65446980"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5054278694"],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":1.3046,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.84354746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"73","issue":"3","first_page":"653","last_page":"663"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.6713989973068237},{"id":"https://openalex.org/keywords/plan","display_name":"Plan (archaeology)","score":0.6712559461593628},{"id":"https://openalex.org/keywords/acceptance-sampling","display_name":"Acceptance sampling","score":0.6493108868598938},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6260321736335754},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5967758297920227},{"id":"https://openalex.org/keywords/sample","display_name":"Sample (material)","score":0.5148628950119019},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4948658347129822},{"id":"https://openalex.org/keywords/purchasing","display_name":"Purchasing","score":0.4700183868408203},{"id":"https://openalex.org/keywords/process-capability-index","display_name":"Process capability index","score":0.4697601795196533},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4442155659198761},{"id":"https://openalex.org/keywords/operations-research","display_name":"Operations research","score":0.4276607036590576},{"id":"https://openalex.org/keywords/sample-size-determination","display_name":"Sample size determination","score":0.3375760316848755},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.28721851110458374},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.25259339809417725},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.22752800583839417},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1712183952331543},{"id":"https://openalex.org/keywords/work-in-process","display_name":"Work in process","score":0.15809133648872375},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08190664649009705}],"concepts":[{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.6713989973068237},{"id":"https://openalex.org/C2776505523","wikidata":"https://www.wikidata.org/wiki/Q4785468","display_name":"Plan (archaeology)","level":2,"score":0.6712559461593628},{"id":"https://openalex.org/C53947966","wikidata":"https://www.wikidata.org/wiki/Q3546732","display_name":"Acceptance sampling","level":3,"score":0.6493108868598938},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6260321736335754},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5967758297920227},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.5148628950119019},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4948658347129822},{"id":"https://openalex.org/C2778813691","wikidata":"https://www.wikidata.org/wiki/Q1369832","display_name":"Purchasing","level":2,"score":0.4700183868408203},{"id":"https://openalex.org/C190190378","wikidata":"https://www.wikidata.org/wiki/Q1192625","display_name":"Process capability index","level":3,"score":0.4697601795196533},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4442155659198761},{"id":"https://openalex.org/C42475967","wikidata":"https://www.wikidata.org/wiki/Q194292","display_name":"Operations research","level":1,"score":0.4276607036590576},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.3375760316848755},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.28721851110458374},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.25259339809417725},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.22752800583839417},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1712183952331543},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.15809133648872375},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08190664649009705},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1080/01605682.2020.1854630","is_oa":false,"landing_page_url":"https://doi.org/10.1080/01605682.2020.1854630","pdf_url":null,"source":{"id":"https://openalex.org/S169988927","display_name":"Journal of the Operational Research Society","issn_l":"0160-5682","issn":["0160-5682","1476-9360"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319703","host_organization_name":"Palgrave Macmillan","host_organization_lineage":["https://openalex.org/P4310319703","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Palgrave Macmillan","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of the Operational Research Society","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:taf:tjorxx:v:73:y:2022:i:3:p:653-663","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/01605682.2020.1854630","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W5379201","https://openalex.org/W132318279","https://openalex.org/W162221828","https://openalex.org/W178813691","https://openalex.org/W1967825268","https://openalex.org/W1968822837","https://openalex.org/W1975403057","https://openalex.org/W1975975526","https://openalex.org/W1979912255","https://openalex.org/W1980137164","https://openalex.org/W1997890878","https://openalex.org/W2007894937","https://openalex.org/W2022872748","https://openalex.org/W2029683774","https://openalex.org/W2034219507","https://openalex.org/W2040672440","https://openalex.org/W2043430453","https://openalex.org/W2055832661","https://openalex.org/W2060900651","https://openalex.org/W2063691579","https://openalex.org/W2087000525","https://openalex.org/W2092433731","https://openalex.org/W2111604546","https://openalex.org/W2128701490","https://openalex.org/W2155245891","https://openalex.org/W2157202423","https://openalex.org/W2280687644","https://openalex.org/W2310128947","https://openalex.org/W2329712949","https://openalex.org/W2495095637","https://openalex.org/W2606467196","https://openalex.org/W2742774090","https://openalex.org/W2790727494","https://openalex.org/W2801263736","https://openalex.org/W2804685269","https://openalex.org/W2895892726","https://openalex.org/W2934504771","https://openalex.org/W2960563756","https://openalex.org/W2972472586","https://openalex.org/W3039244509"],"related_works":["https://openalex.org/W3202801961","https://openalex.org/W4388573053","https://openalex.org/W4382402636","https://openalex.org/W1965855579","https://openalex.org/W2043430453","https://openalex.org/W1968822837","https://openalex.org/W2055972523","https://openalex.org/W3044562024","https://openalex.org/W2780031332","https://openalex.org/W1794334960"],"abstract_inverted_index":{"Acceptance":[0],"sampling":[1,16,27,33,83],"has":[2],"been":[3,19],"widely":[4],"used":[5],"in":[6,159],"practical":[7],"applications":[8],"for":[9,21,94,179],"incoming":[10],"or":[11],"receiving":[12],"inspections,":[13],"and":[14,24,35,51,64,99,130,134,141,145,153,165,181],"various":[15],"plans":[17,28],"have":[18],"developed":[20],"different":[22],"circumstances":[23],"purposes.":[25],"Skip-lot":[26],"(SkSPs)":[29],"are":[30,114,151,177],"an":[31,80,117,182],"effective":[32],"procedure":[34],"may":[36],"be":[37],"useful":[38],"as":[39,86],"a":[40,45,72,102],"reduced":[41],"inspection":[42],"system":[43],"when":[44],"submitted":[46],"lot\u2019s":[47],"quality":[48,105,133],"is":[49,92,190],"good":[50],"stable.":[52],"Thus,":[53],"this":[54],"study":[55],"attempts":[56],"to":[57,70,192],"integrate":[58],"the":[59,62,65,87,125,132,139,148,156,162,171,185,194,197],"concept":[60],"of":[61,75,147,161,170,196],"SkSP":[63,74],"process":[66,97],"yield":[67],"index":[68],"Spk":[69],"develop":[71],"variables":[73,157],"type":[76],"2":[77],"(SkSP-2)":[78],"with":[79,101,120,155],"Spk-based":[81],"single":[82],"plan":[84,91,112,172],"(SSP)":[85],"reference":[88],"plan.":[89,199],"This":[90],"suitable":[93],"today\u2019s":[95],"high-yield":[96],"environments":[98],"products,":[100],"normally":[103],"distributed":[104],"characteristic":[106,164],"under":[107,174],"bilateral":[108],"specification":[109],"limits.":[110],"The":[111,143],"parameters":[113,173],"solved":[115],"by":[116,138],"optimisation":[118],"model":[119],"nonlinear":[121],"constraints,":[122],"which":[123],"minimises":[124],"average":[126],"sample":[127],"number":[128],"(ASN)":[129],"satisfies":[131],"risk":[135],"requirements":[136],"specified":[137],"producer":[140],"consumer.":[142],"performance":[144],"efficiency":[146],"proposed":[149,198],"SkSP-2":[150],"examined":[152],"compared":[154],"SSP":[158],"terms":[160],"operating":[163],"ASN":[166],"curves.":[167],"Additionally,":[168],"tables":[169],"selected":[175],"conditions":[176],"provided":[178],"reference,":[180],"example":[183],"from":[184],"printed":[186],"circuit":[187],"board":[188],"industry":[189],"presented":[191],"demonstrate":[193],"practicality":[195]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":5}],"updated_date":"2026-05-12T08:28:47.272897","created_date":"2025-10-10T00:00:00"}