{"id":"https://openalex.org/W4239267513","doi":"https://doi.org/10.1080/00401706.2015.1040928","title":"Editorial","display_name":"Editorial","publication_year":2015,"publication_date":"2015-07-03","ids":{"openalex":"https://openalex.org/W4239267513","doi":"https://doi.org/10.1080/00401706.2015.1040928"},"language":"es","primary_location":{"id":"doi:10.1080/00401706.2015.1040928","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00401706.2015.1040928","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100454469","display_name":"Yong Chen","orcid":"https://orcid.org/0000-0003-4739-832X"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Yong Chen","raw_affiliation_strings":["Department of Mechanical and Industrial Engineering, University of Iowa, Iowa City, IA 52242, (yong-chen@uiowa.edu)"],"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Industrial Engineering, University of Iowa, Iowa City, IA 52242, (yong-chen@uiowa.edu)","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015629734","display_name":"V. Roshan Joseph","orcid":"https://orcid.org/0000-0002-9430-5301"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Roshan Joseph","raw_affiliation_strings":["Stewart School of Industrial & Systems Engineering, Georgia Institute of Technology, Altlanta, GA 30332, (yuding@amu.edu)"],"affiliations":[{"raw_affiliation_string":"Stewart School of Industrial & Systems Engineering, Georgia Institute of Technology, Altlanta, GA 30332, (yuding@amu.edu)","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101011328","display_name":"Yu Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Ding","raw_affiliation_strings":["Departments of Industrial & Systems Engineering, and Electrical & Computer Engineering, Texas A&M University, College Station, TX 77843, (roshan@gatech.edu)"],"affiliations":[{"raw_affiliation_string":"Departments of Industrial & Systems Engineering, and Electrical & Computer Engineering, Texas A&M University, College Station, TX 77843, (roshan@gatech.edu)","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112759821","display_name":"Vijay Nair","orcid":null},"institutions":[{"id":"https://openalex.org/I27837315","display_name":"University of Michigan\u2013Ann Arbor","ror":"https://ror.org/00jmfr291","country_code":"US","type":"education","lineage":["https://openalex.org/I27837315"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijay Nair","raw_affiliation_strings":["Departments of Statistics, and Industrial & Operations Engineering, The University of Michigan, Ann Arbor, MI 48109, (vnn@umich.edu)"],"affiliations":[{"raw_affiliation_string":"Departments of Statistics, and Industrial & Operations Engineering, The University of Michigan, Ann Arbor, MI 48109, (vnn@umich.edu)","institution_ids":["https://openalex.org/I27837315"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100454469"],"corresponding_institution_ids":["https://openalex.org/I126307644"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"57","issue":"3","first_page":"303","last_page":"304"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":null,"topics":[],"keywords":[{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3460717499256134},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.32298168540000916}],"concepts":[{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3460717499256134},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.32298168540000916}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/00401706.2015.1040928","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00401706.2015.1040928","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1979597421","https://openalex.org/W2007980826","https://openalex.org/W4245490552","https://openalex.org/W4225152035","https://openalex.org/W2061531152","https://openalex.org/W3002753104","https://openalex.org/W2077600819","https://openalex.org/W1587224694","https://openalex.org/W2911598644"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2022-05-12T00:00:00"}