{"id":"https://openalex.org/W4243343081","doi":"https://doi.org/10.1080/00401706.1999.10485653","title":"Fundamentals of Industrial Quality Control","display_name":"Fundamentals of Industrial Quality Control","publication_year":1999,"publication_date":"1999-05-01","ids":{"openalex":"https://openalex.org/W4243343081","doi":"https://doi.org/10.1080/00401706.1999.10485653"},"language":"en","primary_location":{"id":"doi:10.1080/00401706.1999.10485653","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00401706.1999.10485653","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089720802","display_name":"Eric R. Ziegel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210143544","display_name":"BP (Germany)","ror":"https://ror.org/048q66y67","country_code":"DE","type":"company","lineage":["https://openalex.org/I20303223","https://openalex.org/I4210143544"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Eric R. Ziegel","raw_affiliation_strings":["BP Amoco p.l.c"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"BP Amoco p.l.c","institution_ids":["https://openalex.org/I4210143544"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5089720802"],"corresponding_institution_ids":["https://openalex.org/I4210143544"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6200891,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"41","issue":"2","first_page":"178","last_page":"178"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.878600001335144,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.878600001335144,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13164","display_name":"Quality and Management Systems","score":0.7842000126838684,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.7663999795913696,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5462576150894165},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.5029329657554626},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3460501432418823},{"id":"https://openalex.org/keywords/environmental-science","display_name":"Environmental science","score":0.3447301387786865},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.3445946276187897},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.273659884929657},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07959431409835815},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.04424929618835449}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5462576150894165},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.5029329657554626},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3460501432418823},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3447301387786865},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.3445946276187897},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.273659884929657},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07959431409835815},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.04424929618835449},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1080/00401706.1999.10485653","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00401706.1999.10485653","pdf_url":null,"source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4253531200"],"related_works":["https://openalex.org/W2384667405","https://openalex.org/W2389266787","https://openalex.org/W2363885542","https://openalex.org/W2387206255","https://openalex.org/W2355570285","https://openalex.org/W2364958354","https://openalex.org/W2352797113","https://openalex.org/W2372137583","https://openalex.org/W2374872591","https://openalex.org/W1548050717"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}