{"id":"https://openalex.org/W2737042875","doi":"https://doi.org/10.1080/00401706.1999.10485636","title":"Test Regions Using Two or More Correlated Product Characteristics","display_name":"Test Regions Using Two or More Correlated Product Characteristics","publication_year":1999,"publication_date":"1999-05-01","ids":{"openalex":"https://openalex.org/W2737042875","doi":"https://doi.org/10.1080/00401706.1999.10485636","mag":"2737042875"},"language":"en","primary_location":{"id":"doi:10.1080/00401706.1999.10485636","is_oa":true,"landing_page_url":"https://doi.org/10.1080/00401706.1999.10485636","pdf_url":"https://www.tandfonline.com/doi/abs/10.1080/00401706.1999.10485636","source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://www.tandfonline.com/doi/abs/10.1080/00401706.1999.10485636","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067924267","display_name":"Willem Albers","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Willem Albers","raw_affiliation_strings":["Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072175129","display_name":"Gerda R. J. Arts","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Gerda R.J. Arts","raw_affiliation_strings":["Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086759028","display_name":"W.C.M. Kallenberg","orcid":null},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Wilbert C.M. Kallenberg","raw_affiliation_strings":["Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Applied Mathematics, University of Twente, 7500 AE Enschede, The Netherlands E-mail: w.albers@math.utwente.nt g.r.j.arts@durham.ac.uk w.c.m.kallenberg@math.utwente.nt","institution_ids":["https://openalex.org/I94624287"]},{"raw_affiliation_string":"Department of Applied Mathematics University of Twente P.O. Box 217, 7500 AE Enschede The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":1.9768,"has_fulltext":true,"cited_by_count":10,"citation_normalized_percentile":{"value":0.88340081,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"41","issue":"2","first_page":"153","last_page":"165"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9876000285148621,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9550999999046326,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.6580442190170288},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6494930982589722},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.6034323573112488},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.5547232627868652},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5529325008392334},{"id":"https://openalex.org/keywords/fraction","display_name":"Fraction (chemistry)","score":0.5436598062515259},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.5425738096237183},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5399863719940186},{"id":"https://openalex.org/keywords/yield","display_name":"Yield (engineering)","score":0.4937148988246918},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.44714128971099854},{"id":"https://openalex.org/keywords/econometrics","display_name":"Econometrics","score":0.43951594829559326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43014946579933167},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.399029940366745},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.2450571358203888},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19943737983703613},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.07457643747329712},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06534028053283691}],"concepts":[{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.6580442190170288},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6494930982589722},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.6034323573112488},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.5547232627868652},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5529325008392334},{"id":"https://openalex.org/C149629883","wikidata":"https://www.wikidata.org/wiki/Q660926","display_name":"Fraction (chemistry)","level":2,"score":0.5436598062515259},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.5425738096237183},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5399863719940186},{"id":"https://openalex.org/C134121241","wikidata":"https://www.wikidata.org/wiki/Q899301","display_name":"Yield (engineering)","level":2,"score":0.4937148988246918},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.44714128971099854},{"id":"https://openalex.org/C149782125","wikidata":"https://www.wikidata.org/wiki/Q160039","display_name":"Econometrics","level":1,"score":0.43951594829559326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43014946579933167},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.399029940366745},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2450571358203888},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19943737983703613},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.07457643747329712},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06534028053283691},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1080/00401706.1999.10485636","is_oa":true,"landing_page_url":"https://doi.org/10.1080/00401706.1999.10485636","pdf_url":"https://www.tandfonline.com/doi/abs/10.1080/00401706.1999.10485636","source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},{"id":"pmh:oai:ris.utwente.nl:openaire/bcfc074b-aa79-47aa-9529-bee2d1b763f9","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/bcfc074b-aa79-47aa-9529-bee2d1b763f9","pdf_url":"https://ris.utwente.nl/ws/files/282996905/Albers1999test.pdf","source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Albers, W, Arts, G R J & Kallenberg, W C M 1999, 'Test regions using two or more correlated product characteristics', Technometrics, vol. 41, no. 2, pp. 153-165. https://doi.org/10.1080/00401706.1999.10485636","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/eaef6ca1-0023-4d63-9111-6177efdf3a44","is_oa":true,"landing_page_url":"https://research.utwente.nl/en/publications/eaef6ca1-0023-4d63-9111-6177efdf3a44","pdf_url":null,"source":{"id":"https://openalex.org/S4306401843","display_name":"Data Archiving and Networked Services (DANS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1322597698","host_organization_name":"Royal Netherlands Academy of Arts and Sciences","host_organization_lineage":["https://openalex.org/I1322597698"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Technometrics, 41(2), 153 - 165. Taylor & Francis","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1080/00401706.1999.10485636","is_oa":true,"landing_page_url":"https://doi.org/10.1080/00401706.1999.10485636","pdf_url":"https://www.tandfonline.com/doi/abs/10.1080/00401706.1999.10485636","source":{"id":"https://openalex.org/S985303","display_name":"Technometrics","issn_l":"0040-1706","issn":["0040-1706","1537-2723"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technometrics","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2737042875.pdf","grobid_xml":"https://content.openalex.org/works/W2737042875.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W94934543","https://openalex.org/W144876013","https://openalex.org/W1999463688","https://openalex.org/W2003382864","https://openalex.org/W2028539984","https://openalex.org/W2071843189","https://openalex.org/W2072486422","https://openalex.org/W2078199412","https://openalex.org/W2096631727","https://openalex.org/W2163605262","https://openalex.org/W2798122238","https://openalex.org/W3143949042"],"related_works":["https://openalex.org/W4255837520","https://openalex.org/W2387011115","https://openalex.org/W1191014223","https://openalex.org/W178140751","https://openalex.org/W1137063513","https://openalex.org/W4234808182","https://openalex.org/W4255628145","https://openalex.org/W2382043075","https://openalex.org/W2809151339","https://openalex.org/W2216913934"],"abstract_inverted_index":{"For":[0],"inspection":[1],"of":[2,29,78],"manufactured":[3],"parts,":[4],"it":[5,41],"may":[6],"be":[7],"much":[8],"easier":[9],"and/or":[10],"cheaper":[11],"to":[12,26,32],"use":[13],"the":[14,27,46,68,71,79],"information":[15],"from":[16,45],"two":[17],"or":[18],"more":[19],"product":[20],"characteristics":[21],"that":[22],"are":[23,63],"strongly":[24],"related":[25],"characteristic":[28,35],"interest":[30],"than":[31],"measure":[33],"this":[34,59],"itself.":[36],"To":[37],"get":[38],"high-quality":[39],"output,":[40],"is":[42,56,73,81],"required":[43],"that,":[44,66],"accepted":[47],"parts":[48],"only":[49],"a":[50],"given,":[51],"typically":[52],"very":[53],"small,":[54],"fraction":[55],"nonconforming.":[57],"In":[58],"article,":[60],"test":[61],"regions":[62],"determined":[64],"such":[65],"under":[67],"preceding":[69],"condition,":[70],"yield":[72],"maximized.":[74],"The":[75],"good":[76],"performance":[77],"methods":[80],"illustrated":[82],"by":[83],"Monte":[84],"Carlo":[85],"results.":[86],"An":[87],"application":[88],"in":[89,95],"semiconductor":[90],"industry":[91],"shows":[92],"its":[93],"value":[94],"practice.":[96]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-08-01T09:00:35.917206","created_date":"2025-10-10T00:00:00"}