{"id":"https://openalex.org/W2007055440","doi":"https://doi.org/10.1080/00207721.2015.1036474","title":"Effective confidence interval estimation of fault-detection process of software reliability growth models","display_name":"Effective confidence interval estimation of fault-detection process of software reliability growth models","publication_year":2015,"publication_date":"2015-04-23","ids":{"openalex":"https://openalex.org/W2007055440","doi":"https://doi.org/10.1080/00207721.2015.1036474","mag":"2007055440"},"language":"en","primary_location":{"id":"doi:10.1080/00207721.2015.1036474","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207721.2015.1036474","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001454796","display_name":"Chih\u2010Chiang Fang","orcid":"https://orcid.org/0000-0002-3597-5700"},"institutions":[{"id":"https://openalex.org/I4210134750","display_name":"Shu-Te University","ror":"https://ror.org/03pcb1m79","country_code":"TW","type":"education","lineage":["https://openalex.org/I4210134750"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Chiang Fang","raw_affiliation_strings":[",","Department of International Business & Trade, Shu-Te University, Kaohsiung City, Taiwan, ROC#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":",","institution_ids":[]},{"raw_affiliation_string":"Department of International Business & Trade, Shu-Te University, Kaohsiung City, Taiwan, ROC#TAB#","institution_ids":["https://openalex.org/I4210134750"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013691397","display_name":"Chun-Wu Yeh","orcid":"https://orcid.org/0000-0003-1936-9767"},"institutions":[{"id":"https://openalex.org/I190409851","display_name":"Kun Shan University","ror":"https://ror.org/01gzkdv90","country_code":"TW","type":"education","lineage":["https://openalex.org/I190409851"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chun-Wu Yeh","raw_affiliation_strings":[",","Department of Information Management, Kun Shan University, Tainan City, Taiwan, ROC"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":",","institution_ids":[]},{"raw_affiliation_string":"Department of Information Management, Kun Shan University, Tainan City, Taiwan, ROC","institution_ids":["https://openalex.org/I190409851"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5013691397"],"corresponding_institution_ids":["https://openalex.org/I190409851"],"apc_list":null,"apc_paid":null,"fwci":5.2309,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.94276018,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"47","issue":"12","first_page":"2878","last_page":"2892"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.7028971910476685},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6672382950782776},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5335415601730347},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5256344676017761},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5230011343955994},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5144410729408264},{"id":"https://openalex.org/keywords/confidence-interval","display_name":"Confidence interval","score":0.496735155582428},{"id":"https://openalex.org/keywords/software-regression","display_name":"Software regression","score":0.4825808107852936},{"id":"https://openalex.org/keywords/software-sizing","display_name":"Software sizing","score":0.4761533737182617},{"id":"https://openalex.org/keywords/software-metric","display_name":"Software metric","score":0.45270439982414246},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4498983919620514},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.4252161681652069},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3958117961883545},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.35203230381011963},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3311493396759033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24585920572280884},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.22133606672286987},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17572280764579773},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1598954200744629}],"concepts":[{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.7028971910476685},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6672382950782776},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5335415601730347},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5256344676017761},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5230011343955994},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5144410729408264},{"id":"https://openalex.org/C44249647","wikidata":"https://www.wikidata.org/wiki/Q208498","display_name":"Confidence interval","level":2,"score":0.496735155582428},{"id":"https://openalex.org/C191727507","wikidata":"https://www.wikidata.org/wiki/Q24346","display_name":"Software regression","level":5,"score":0.4825808107852936},{"id":"https://openalex.org/C201515116","wikidata":"https://www.wikidata.org/wiki/Q7554363","display_name":"Software sizing","level":5,"score":0.4761533737182617},{"id":"https://openalex.org/C82214349","wikidata":"https://www.wikidata.org/wiki/Q657339","display_name":"Software metric","level":5,"score":0.45270439982414246},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4498983919620514},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.4252161681652069},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3958117961883545},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.35203230381011963},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3311493396759033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24585920572280884},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.22133606672286987},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17572280764579773},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1598954200744629},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1080/00207721.2015.1036474","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207721.2015.1036474","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547","https://openalex.org/P4310320449"],"host_organization_lineage_names":["Taylor & Francis","Informa"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"},{"id":"pmh:oai:RePEc:taf:tsysxx:v:47:y:2016:i:12:p:2878-2892","is_oa":false,"landing_page_url":"http://hdl.handle.net/10.1080/00207721.2015.1036474","pdf_url":null,"source":{"id":"https://openalex.org/S4306401271","display_name":"RePEc: Research Papers in Economics","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I77793887","host_organization_name":"Federal Reserve Bank of St. Louis","host_organization_lineage":["https://openalex.org/I77793887"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G7246120821","display_name":null,"funder_award_id":"MOST-100-2410-H-168-003","funder_id":"https://openalex.org/F4320322795","funder_display_name":"Ministry of Science and Technology, Taiwan"}],"funders":[{"id":"https://openalex.org/F4320322795","display_name":"Ministry of Science and Technology, Taiwan","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W22166167","https://openalex.org/W38991234","https://openalex.org/W51395363","https://openalex.org/W1483072194","https://openalex.org/W1580561995","https://openalex.org/W1971872619","https://openalex.org/W1980595883","https://openalex.org/W1988093967","https://openalex.org/W2001604487","https://openalex.org/W2003692493","https://openalex.org/W2008796094","https://openalex.org/W2011998415","https://openalex.org/W2025334706","https://openalex.org/W2030156789","https://openalex.org/W2036351571","https://openalex.org/W2036981176","https://openalex.org/W2047164750","https://openalex.org/W2054316961","https://openalex.org/W2067402508","https://openalex.org/W2080912963","https://openalex.org/W2084150660","https://openalex.org/W2098978426","https://openalex.org/W2112333328","https://openalex.org/W2117039703","https://openalex.org/W2131850134","https://openalex.org/W2137209303","https://openalex.org/W2143091165","https://openalex.org/W2158427240","https://openalex.org/W2160560725","https://openalex.org/W2165238463","https://openalex.org/W2169038897","https://openalex.org/W2170105447","https://openalex.org/W2198656879","https://openalex.org/W2314788995","https://openalex.org/W2796770216","https://openalex.org/W2914956942","https://openalex.org/W4292198165"],"related_works":["https://openalex.org/W2078744341","https://openalex.org/W3014006153","https://openalex.org/W2439389792","https://openalex.org/W2012057830","https://openalex.org/W2029555411","https://openalex.org/W4320067626","https://openalex.org/W2187488199","https://openalex.org/W1987476382","https://openalex.org/W2798385000","https://openalex.org/W4224250221"],"abstract_inverted_index":{"The":[0,113],"quantitative":[1],"evaluation":[2],"of":[3,15,38,42,57,85,95,108],"software":[4,23,29,32,43,110],"reliability":[5],"growth":[6],"model":[7,115],"is":[8,46,116],"frequently":[9],"accompanied":[10],"by":[11],"its":[12,125],"confidence":[13,58,105],"interval":[14,59,106],"fault":[16,44],"detection.":[17],"It":[18],"provides":[19],"helpful":[20],"information":[21],"to":[22,123],"developers":[24],"and":[25,31,52,89,118],"testers":[26],"when":[27],"undertaking":[28],"development":[30],"quality":[33],"control.":[34],"However,":[35],"the":[36,39,55,61,66,78,83,93,96,109],"explanation":[37],"variance":[40],"estimation":[41,107],"detection":[45],"not":[47],"transparent":[48],"in":[49,72],"previous":[50],"studies,":[51],"it":[53],"influences":[54],"deduction":[56],"about":[60],"mean":[62,86],"value":[63,87],"function":[64],"that":[65],"current":[67],"study":[68],"addresses.":[69],"Software":[70],"engineers":[71],"such":[73],"a":[74],"case":[75],"cannot":[76],"evaluate":[77],"potential":[79],"hazard":[80],"based":[81],"on":[82],"stochasticity":[84],"function,":[88],"this":[90],"might":[91],"reduce":[92],"practicability":[94],"estimation.":[97],"Hence,":[98],"stochastic":[99],"differential":[100],"equations":[101],"are":[102],"utilised":[103],"for":[104],"fault-detection":[111],"process.":[112],"proposed":[114],"estimated":[117],"validated":[119],"using":[120],"real":[121],"data-sets":[122],"show":[124],"flexibility.":[126]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3}],"updated_date":"2026-08-15T07:11:24.734988","created_date":"2025-10-10T00:00:00"}