{"id":"https://openalex.org/W2030611398","doi":"https://doi.org/10.1080/00207720802630719","title":"A flexible visual inspection system based on neural networks","display_name":"A flexible visual inspection system based on neural networks","publication_year":2009,"publication_date":"2009-02-01","ids":{"openalex":"https://openalex.org/W2030611398","doi":"https://doi.org/10.1080/00207720802630719","mag":"2030611398"},"language":"en","primary_location":{"id":"doi:10.1080/00207720802630719","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207720802630719","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083852325","display_name":"Panos Liatsis","orcid":"https://orcid.org/0000-0002-5490-6030"},"institutions":[{"id":"https://openalex.org/I180825142","display_name":"City, University of London","ror":"https://ror.org/04489at23","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I180825142"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"P. Liatsis","raw_affiliation_strings":["School of Engineering and Mathematical Sciences, City University , London, UK","School of Engineering and Mathematical Sciences City University London, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering and Mathematical Sciences, City University , London, UK","institution_ids":["https://openalex.org/I180825142"]},{"raw_affiliation_string":"School of Engineering and Mathematical Sciences City University London, UK","institution_ids":["https://openalex.org/I180825142"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079825375","display_name":"John Y. Goulermas","orcid":"https://orcid.org/0000-0003-0381-124X"},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J.Y. Goulermas","raw_affiliation_strings":["Department of Electrical Engineering and Electronics , University of Liverpool , Liverpool, UK","Department of Electrical Engineering and Electronics University of Liverpool Liverpool UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Electronics , University of Liverpool , Liverpool, UK","institution_ids":["https://openalex.org/I146655781"]},{"raw_affiliation_string":"Department of Electrical Engineering and Electronics University of Liverpool Liverpool UK","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077623520","display_name":"Xiao\u2010Jun Zeng","orcid":"https://orcid.org/0000-0002-2320-2495"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"X.-J. Zeng","raw_affiliation_strings":["School of Informatics, University of Manchester , Manchester, UK","School of Informatics, University of Manchester, Manchester, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Informatics, University of Manchester , Manchester, UK","institution_ids":["https://openalex.org/I28407311"]},{"raw_affiliation_string":"School of Informatics, University of Manchester, Manchester, UK","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079978634","display_name":"E. Milonidis","orcid":null},"institutions":[{"id":"https://openalex.org/I180825142","display_name":"City, University of London","ror":"https://ror.org/04489at23","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I180825142"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"E. Milonidis","raw_affiliation_strings":["School of Engineering and Mathematical Sciences, City University , London, UK","School of Engineering and Mathematical Sciences City University London, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering and Mathematical Sciences, City University , London, UK","institution_ids":["https://openalex.org/I180825142"]},{"raw_affiliation_string":"School of Engineering and Mathematical Sciences City University London, UK","institution_ids":["https://openalex.org/I180825142"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5083852325"],"corresponding_institution_ids":["https://openalex.org/I180825142"],"apc_list":null,"apc_paid":null,"fwci":2.222,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.88947298,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"40","issue":"2","first_page":"173","last_page":"186"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.7082235813140869},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6419637203216553},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5872148871421814},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5798061490058899},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.4675200283527374},{"id":"https://openalex.org/keywords/coding","display_name":"Coding (social sciences)","score":0.4602597653865814},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.41617342829704285},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.372536838054657},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3724559545516968},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.34002065658569336},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3332425355911255},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3227348327636719},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.20100653171539307},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10782822966575623}],"concepts":[{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.7082235813140869},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6419637203216553},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5872148871421814},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5798061490058899},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.4675200283527374},{"id":"https://openalex.org/C179518139","wikidata":"https://www.wikidata.org/wiki/Q5140297","display_name":"Coding (social sciences)","level":2,"score":0.4602597653865814},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.41617342829704285},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.372536838054657},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3724559545516968},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.34002065658569336},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3332425355911255},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3227348327636719},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.20100653171539307},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10782822966575623},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1080/00207720802630719","is_oa":false,"landing_page_url":"https://doi.org/10.1080/00207720802630719","pdf_url":null,"source":{"id":"https://openalex.org/S129640837","display_name":"International Journal of Systems Science","issn_l":"0020-7721","issn":["0020-7721","1464-5319"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320547","host_organization_name":"Taylor & Francis","host_organization_lineage":["https://openalex.org/P4310320547"],"host_organization_lineage_names":["Taylor & Francis"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Systems Science","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:openaire_cris_publications/f8b63b4e-7293-4a7c-9118-5f3b15a84516","is_oa":false,"landing_page_url":"https://research.manchester.ac.uk/en/publications/f8b63b4e-7293-4a7c-9118-5f3b15a84516","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Liatsis, P, Goulermas, J Y, Zeng, X J & Milonidis, E 2009, 'A flexible visual inspection system based on neural networks', International Journal of Systems Science, vol. 40, no. 2, pp. 173-186. https://doi.org/10.1080/00207720802630719","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:pure.atira.dk:publications/f8b63b4e-7293-4a7c-9118-5f3b15a84516","is_oa":false,"landing_page_url":"https://www.research.manchester.ac.uk/portal/en/publications/a-flexible-visual-inspection-system-based-on-neural-networks(f8b63b4e-7293-4a7c-9118-5f3b15a84516).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Liatsis, P, Goulermas, J Y, Zeng, X J & Milonidis, E 2009, 'A flexible visual inspection system based on neural networks', International Journal of Systems Science, vol. 40, no. 2, pp. 173-186. https://doi.org/10.1080/00207720802630719","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W174502298","https://openalex.org/W198953946","https://openalex.org/W247104752","https://openalex.org/W1480552682","https://openalex.org/W1589549454","https://openalex.org/W1770912791","https://openalex.org/W1964552793","https://openalex.org/W1965238198","https://openalex.org/W1969898186","https://openalex.org/W1994266401","https://openalex.org/W2000314239","https://openalex.org/W2012638612","https://openalex.org/W2018224969","https://openalex.org/W2024171748","https://openalex.org/W2029018862","https://openalex.org/W2048622873","https://openalex.org/W2068294664","https://openalex.org/W2084134149","https://openalex.org/W2087621366","https://openalex.org/W2090118970","https://openalex.org/W2090984313","https://openalex.org/W2092712734","https://openalex.org/W2099947656","https://openalex.org/W2116044718","https://openalex.org/W2120646907","https://openalex.org/W2125150158","https://openalex.org/W2133059825","https://openalex.org/W2151676833","https://openalex.org/W2152571733","https://openalex.org/W2162177192","https://openalex.org/W2166843422","https://openalex.org/W2167894274","https://openalex.org/W2260203718","https://openalex.org/W2283386713","https://openalex.org/W2904250082","https://openalex.org/W3017143921","https://openalex.org/W3023540311","https://openalex.org/W4246139003"],"related_works":["https://openalex.org/W2387803438","https://openalex.org/W3150879280","https://openalex.org/W2091038213","https://openalex.org/W1987385378","https://openalex.org/W2566979001","https://openalex.org/W2132335896","https://openalex.org/W3127880688","https://openalex.org/W2908806637","https://openalex.org/W2794901953","https://openalex.org/W2028424465"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"we":[3],"propose":[4],"a":[5,17,33,82],"neural":[6,35,54,100],"networks-based":[7],"machine":[8],"vision":[9],"system,":[10],"which":[11,37,64,86],"is":[12,32,56,65,106],"intended":[13],"to":[14,42,126,134],"act":[15],"as":[16],"reconfigurable":[18],"inspection":[19,104,113],"tool,":[20,85],"for":[21],"use":[22,51,70],"in":[23,98,108],"manufacturing":[24],"environments.":[25],"The":[26,103],"processing":[27],"engine":[28],"of":[29,52,60,71,77,91,95,114,119,130],"the":[30,50,57,61,69,72,88,92,99,128,131],"system":[31,105,133],"second-order":[34],"network,":[36],"extracts":[38],"geometric":[39],"features":[40],"invariant":[41],"translation":[43],"and":[44,117],"rotation.":[45],"A":[46],"major":[47],"issue":[48],"with":[49,68],"higher-order":[53,62],"networks":[55,101],"combinatorial":[58],"explosion":[59],"terms,":[63],"addressed":[66],"here":[67],"alternative":[73],"image":[74],"representation":[75],"strategy":[76],"coarse":[78],"coding.":[79],"We":[80],"developed":[81],"genetic":[83],"algorithms":[84],"allows":[87],"automated":[89],"determination":[90],"optimal":[93],"number":[94],"hidden":[96],"units":[97],"architecture.":[102],"tested":[107],"two":[109],"application":[110],"areas,":[111],"namely":[112],"axisymmetric":[115],"components":[116],"classification":[118],"rivets.":[120],"Numerous":[121],"tests":[122],"are":[123],"carried":[124],"out":[125],"evaluate":[127],"robustness":[129],"proposed":[132],"complex":[135],"noise":[136],"sources.":[137]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}